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Swift Ion Beam Analysis in Nanosciences

Denis Jalabert, Ian Vickridge, Amal Chabli

1, 2017

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The carbon and hydrogen contents in ALD-grown ZnO films define a narrow ALD temperature window

Vacuum, 2021-08, Vol.190, p.110289, Article 110289

2021

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18O(p,α)15N isotopic tracing of germanium diffusion in SiO2/Si films

Journal of applied physics, 2021-09, Vol.130 (10)

2021

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RBS and NRA analysis for films with high growth rate prepared by atomic layer deposition

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2021-02, Vol.489, p.20-25

2021

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ToF-SIMS and ERDA study of hydrogen and deuterium in nickel-base alloys oxidized in water

Corrosion science, 2018-08, Vol.140, p.151-158

2018

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Water-rich conditions during titania atomic layer deposition in the 100 °C-300 °C temperature window produce films with TiIV oxidation state but large H and O content variations

Applied surface science, 2022-11, Vol.601, p.154233, Article 154233

2022

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Exploring OH incorporation pathways in pulsed laser deposited EuOOH thin films

Applied surface science, 2024-10, Vol.670, p.160581, Article 160581

2024

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Elastic backscattering during boron implantation in Si1-Ge

Vacuum, 2024-01, Vol.219, p.112740, Article 112740

2024

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Tracer study of pore initiation in anodic alumina formed in phosphoric acid

Electrochimica acta, 2013-12, Vol.113, p.302-312

2013

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Sewers - Rehabilitation and New Construction - Repair and Renovation

1997

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Measurement of (p,p) elastic differential cross sections for 17O in the 0.6–2 MeV range at 165

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2022-04, Vol.516, p.15-22

2022

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Sewers: Repair and Renovation

Geoffrey F Read, Ian Vickridge

1996

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Determination and benchmarking of 27Al(d,α) and 27Al(d,p) reaction cross sections for energies and angles relevant to NRA

Scientific reports, 2021-09, Vol.11 (1), p.18036-18036, Article 18036

2021

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Elastic backscattering during boron implantation in Si1-xGex

Vacuum, 2024-01, Vol.219

2024

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Method for Determining the Polymer Content in Nonsoluble Polydiacetylene Films: Application to Pentacosadiynoic Acid

Langmuir, 2017-02, Vol.33 (6), p.1419-1426

2017

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A systematical investigation of layer growth rate, impurity level and morphology evolution in TiO2 thin films grown by ALD between 100 and 300 °C

Vacuum, 2023-10, Vol.216, p.112408, Article 112408

2023

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Harnessing Atomic Layer Deposition and Diffusion to Spatially Localize Rare-Earth Ion Emitters

Journal of physical chemistry. C, 2020-09, Vol.124 (36), p.19725-19735

2020

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NIMB Editorial for 2009

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2009, Vol.267 (1), p.1-2

2009

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Low resistivity amorphous carbon-based thin films employed as anti-reflective coatings on copper

Thin solid films, 2020-10, Vol.712, p.138319, Article 138319

2020

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Chemically vapor deposited Eu3+:Y2O3 thin films as a material platform for quantum technologies

Journal of applied physics, 2020-08, Vol.128 (5)

2020

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Chemically vapor deposited Eu 3+ :Y 2 O 3 thin films as a material platform for quantum technologies

Journal of applied physics, 2020-08, Vol.128 (5)

2020

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XPS and NRA investigations during the fabrication of gold nanostructured functionalized screen-printed sensors for the detection of metallic pollutants

Applied surface science, 2017-03, Vol.397, p.159-166

2017

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Unique orientation of 1D and 2D nanoparticle assemblies confined in smectic topological defects

Soft matter, 2022-06, Vol.18 (25), p.4792-482

2022

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Soft x-ray optical constants of sputtered chromium thin films with improved accuracy in the L and M absorption edge regions

Journal of applied physics, 2018-07, Vol.124 (3)

2018

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Li-Ion Intercalation in Thermal Oxide Thin Films of MoO3 as Studied by XPS, RBS, and NRA

Journal of physical chemistry. C, 2008-07, Vol.112 (29), p.11050-11058

2008

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Swift Ion Beam Analysis in Nanosciences

The carbon and hydrogen contents in ALD-grown ZnO films define a narrow ALD temperature window

18O(p,α)15N isotopic tracing of germanium diffusion in SiO2/Si films

RBS and NRA analysis for films with high growth rate prepared by atomic layer deposition

ToF-SIMS and ERDA study of hydrogen and deuterium in nickel-base alloys oxidized in water

Water-rich conditions during titania atomic layer deposition in the 100 °C-300 °C temperature window produce films with TiIV oxidation state but large H and O content variations

Exploring OH incorporation pathways in pulsed laser deposited EuOOH thin films

Elastic backscattering during boron implantation in Si1-Ge

Tracer study of pore initiation in anodic alumina formed in phosphoric acid

Sewers - Rehabilitation and New Construction - Repair and Renovation

Measurement of (p,p) elastic differential cross sections for 17O in the 0.6–2 MeV range at 165

Sewers: Repair and Renovation

Determination and benchmarking of 27Al(d,α) and 27Al(d,p) reaction cross sections for energies and angles relevant to NRA

Elastic backscattering during boron implantation in Si1-xGex

Method for Determining the Polymer Content in Nonsoluble Polydiacetylene Films: Application to Pentacosadiynoic Acid

A systematical investigation of layer growth rate, impurity level and morphology evolution in TiO2 thin films grown by ALD between 100 and 300 °C

Harnessing Atomic Layer Deposition and Diffusion to Spatially Localize Rare-Earth Ion Emitters

NIMB Editorial for 2009

Low resistivity amorphous carbon-based thin films employed as anti-reflective coatings on copper

Chemically vapor deposited Eu3+:Y2O3 thin films as a material platform for quantum technologies

Chemically vapor deposited Eu 3+ :Y 2 O 3 thin films as a material platform for quantum technologies

XPS and NRA investigations during the fabrication of gold nanostructured functionalized screen-printed sensors for the detection of metallic pollutants

Unique orientation of 1D and 2D nanoparticle assemblies confined in smectic topological defects

Soft x-ray optical constants of sputtered chromium thin films with improved accuracy in the L and M absorption edge regions

Li-Ion Intercalation in Thermal Oxide Thin Films of MoO3 as Studied by XPS, RBS, and NRA

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