UB Paderborn / Katalog / Suche / in CDI

1 – 25 von 54

Sortiert nach

A Compact Model of Program Window in HfOx RRAM Devices for Conductive Filament Characteristics Analysis

IEEE transactions on electron devices, 2014-08, Vol.61 (8), p.2668-2673

2014

Volltextzugriff (PDF)

A Charge-Trapping Model for the Fast Component of Positive Bias Temperature Instability (PBTI) in High- \kappa Gate-Stacks

IEEE transactions on electron devices, 2014-07, Vol.61 (7), p.2287-2293

2014

Volltextzugriff (PDF)

A Comprehensive Understanding of the Erase of TANOS Memories Through Charge Separation Experiments and Simulations

IEEE transactions on electron devices, 2011-09, Vol.58 (9), p.3147-3155

2011

Volltextzugriff (PDF)

Microscopic Modeling of HfOx RRAM Operations: From Forming to Switching

IEEE transactions on electron devices, 2015-06, Vol.62 (6), p.1998-2006

2015

Volltextzugriff (PDF)

Microscopic Modeling of Electrical Stress-Induced Breakdown in Poly-Crystalline Hafnium Oxide Dielectrics

IEEE transactions on electron devices, 2013-05, Vol.60 (5), p.1754-1762

2013

Volltextzugriff (PDF)

A New Physical Method Based on CV - GV Simulations for the Characterization of the Interfacial and Bulk Defect Density in High- k /III-V MOSFETs

IEEE transactions on electron devices, 2015-03, Vol.62 (3), p.705-712

2015

Volltextzugriff (PDF)

A simulation framework for modeling charge transport and degradation in high-k stacks

Journal of computational electronics, 2013-12, Vol.12 (4), p.658-665

2013

Volltextzugriff (PDF)

A microscopic physical description of RTN current fluctuations in HfOx RRAM

2015 IEEE International Reliability Physics Symposium, 2015, p.5B.5.1-5B.5.6

2015

Volltextzugriff (PDF)

A Compact Model of Program Window in HfO x RRAM Devices for Conductive Filament Characteristics Analysis

IEEE transactions on electron devices, 2014-08, Vol.61 (8), p.2668-2673

2014

Volltextzugriff (PDF)

A Compact Model of Program Window in HfO sub(x) RRAM Devices for Conductive Filament Characteristics Analysis

IEEE transactions on electron devices, 2014-08, Vol.61 (8), p.2668-2673

2014

Volltextzugriff (PDF)

A Charge-Trapping Model for the Fast Component of Positive Bias Temperature Instability (PBTI) in High- \(\kappa \) Gate-Stacks

IEEE transactions on electron devices, 2014-07, Vol.61 (7), p.2287-2293

2014

Volltextzugriff (PDF)

Charge transport in high-κ stacks for charge-trapping memory applications: A modeling perspective (invited)

Microelectronic engineering, 2011-07, Vol.88 (7), p.1168-1173

2011

Volltextzugriff (PDF)

Evidences for vertical charge dipole formation in charge-trapping memories and its impact on reliability

Applied physics letters, 2012-07, Vol.101 (5), p.53505

2012

Volltextzugriff (PDF)

Experimental Assessment of Electrons and Holes in Erase Transient of TANOS and TANVaS Memories

IEEE electron device letters, 2010-09, Vol.31 (9), p.936-938

2010

Volltextzugriff (PDF)

A physics-based model of the dielectric breakdown in HfO2 for statistical reliability prediction

2011 International Reliability Physics Symposium, 2011, p.GD.5.1-GD.5.4

2011

Volltextzugriff (PDF)

Charge transport in high-K stacks for charge-trapping memory applications: A modeling perspective (invited)

Microelectronic engineering, 2011, Vol.88 (7), p.1168-1173

2011

Volltextzugriff (PDF)

Role of holes and electrons during erase of TANOS memories: Evidences for dipole formation and its impact on reliability

2010 IEEE International Reliability Physics Symposium, 2010, p.731-737

2010

Volltextzugriff (PDF)

Multiscale modeling of electron-ion interactions for engineering novel electronic devices and materials

2016 26th International Workshop on Power and Timing Modeling, Optimization and Simulation (PATMOS), 2016, p.128-132

2016

Volltextzugriff (PDF)

Multiscale modeling of electron-ion interactions for engineering novel electronic devices and materials

2016 26th International Workshop on Power and Timing Modeling, Optimization and Simulation (PATMOS), 2016, p.296-300

2016

Volltextzugriff (PDF)

Modeling of the Forming Operation in HfO2-Based Resistive Switching Memories

2011 3rd IEEE International Memory Workshop (IMW), 2011, p.1-4

2011

Volltextzugriff (PDF)

Randomised controlled trial comparing efficacy and safety of high versus low Low-Molecular Weight Heparin dosages in hospitalized patients with severe COVID-19 pneumonia and coagulopathy not requiring invasive mechanical ventilation (COVID-19 HD): a structured summary of a study protocol

Trials, 2020-06, Vol.21 (1), p.574-5, Article 574

2020

Volltextzugriff (PDF)

Nanoparticles as drug delivery agents specific for CNS: in vivo biodistribution

Nanomedicine, 2009-12, Vol.5 (4), p.369-377

2009

Volltextzugriff (PDF)

PLGA nanoparticles surface decorated with the sialic acid, N -acetylneuraminic acid

Biomaterials, 2010-04, Vol.31 (12), p.3395-3403

2010

Volltextzugriff (PDF)

1 – 25 von 54

Suche als RSS-Feed

Suchergebnisse filtern

Filter anzeigen

Nur zeigen

Geprüft (Peer-Review)
(45)
Mit Volltextzugriff
(48)

Publikationsform

Sprache

Englisch
(54)
Japanisch
(6)

Erscheinungsjahr

n.n

Thema

Science & Technology
(34)
Life Sciences & Biomedicine
(20)
Humans
(14)
Engineering
(13)
Technology
(13)
Physical Sciences
(12)
Physics
(12)
Engineering, Electrical & Electronic
(11)
Male
(11)
Physics, Applied
(11)
Aged
(8)
Animals
(8)
Dielectrics
(8)
Nanoparticles
(8)
Current Measurement
(7)
Female
(7)
Hafnium Compounds
(7)
Middle Aged
(7)
Adult
(6)
Blood-Brain Barrier - Metabolism
(6)

15 weitere anzeigen...

Weniger anzeigen...

Zeitschrift / Serie

5 weitere anzeigen...

Weniger anzeigen...

Menü

Weitere Dienste

Einstellungen

A Compact Model of Program Window in HfOx RRAM Devices for Conductive Filament Characteristics Analysis

A Charge-Trapping Model for the Fast Component of Positive Bias Temperature Instability (PBTI) in High- \kappa Gate-Stacks

A Comprehensive Understanding of the Erase of TANOS Memories Through Charge Separation Experiments and Simulations

Microscopic Modeling of HfOx RRAM Operations: From Forming to Switching

Microscopic Modeling of Electrical Stress-Induced Breakdown in Poly-Crystalline Hafnium Oxide Dielectrics

A New Physical Method Based on CV - GV Simulations for the Characterization of the Interfacial and Bulk Defect Density in High- k /III-V MOSFETs

A simulation framework for modeling charge transport and degradation in high-k stacks

A microscopic physical description of RTN current fluctuations in HfOx RRAM

A Compact Model of Program Window in HfO x RRAM Devices for Conductive Filament Characteristics Analysis

A Compact Model of Program Window in HfO sub(x) RRAM Devices for Conductive Filament Characteristics Analysis

A Charge-Trapping Model for the Fast Component of Positive Bias Temperature Instability (PBTI) in High- \(\kappa \) Gate-Stacks

Charge transport in high-κ stacks for charge-trapping memory applications: A modeling perspective (invited)

Evidences for vertical charge dipole formation in charge-trapping memories and its impact on reliability

Experimental Assessment of Electrons and Holes in Erase Transient of TANOS and TANVaS Memories

A physics-based model of the dielectric breakdown in HfO2 for statistical reliability prediction

Charge transport in high-K stacks for charge-trapping memory applications: A modeling perspective (invited)

Role of holes and electrons during erase of TANOS memories: Evidences for dipole formation and its impact on reliability

Multiscale modeling of electron-ion interactions for engineering novel electronic devices and materials

Multiscale modeling of electron-ion interactions for engineering novel electronic devices and materials

Modeling of the Forming Operation in HfO2-Based Resistive Switching Memories

Liver Angiopoietin‐2 Is a Key Predictor of De Novo or Recurrent Hepatocellular Cancer After Hepatitis C Virus Direct‐Acting Antivirals

Randomised controlled trial comparing efficacy and safety of high versus low Low-Molecular Weight Heparin dosages in hospitalized patients with severe COVID-19 pneumonia and coagulopathy not requiring invasive mechanical ventilation (COVID-19 HD): a structured summary of a study protocol

Nanoparticles as drug delivery agents specific for CNS: in vivo biodistribution

PLGA nanoparticles surface decorated with the sialic acid, N -acetylneuraminic acid

Liver Angiopoietin‐2 Is a Key Predictor of D e N ovo or Recurrent Hepatocellular Cancer After Hepatitis C Virus Direct‐Acting Antivirals

Suchergebnisse filtern