UB Paderborn / Katalog / Suche / in CDI

Sortiert nach

Einfacher Volltextzugriff von (fast) überall

Installieren Sie die LibKey Nomad-Browsererweiterung und erhalten Sie von vielen Webseiten einfachen Zugriff auf lizenzierte Volltexte oder Open Access Publikationen. Mehr erfahren...

Fast Frequency and Phase Tracking Analog PLL for Direct Carrier Synchronization

IEEE transactions on microwave theory and techniques, 2024-03, Vol.72 (3), p.1979-1992

2024

Volltextzugriff (PDF)

Variability of p-n Junctions and SiGe HBTs at Cryogenic Temperatures

IEEE transactions on electron devices, 2021-03, Vol.68 (3), p.987-993

2021

Volltextzugriff (PDF)

Large-Signal Reliability Analysis of SiGe HBT Cascode Driver Amplifiers

IEEE transactions on electron devices, 2015-05, Vol.62 (5), p.1383-1389

2015

Volltextzugriff (PDF)

An Investigation of High-Temperature (to 300 °C) Safe-Operating-Area in a High-Voltage Complementary SiGe on SOI Technology

IEEE transactions on electron devices, 2017-09, Vol.64 (9), p.3748-3755

2017

Volltextzugriff (PDF)

Predictive Physics-Based TCAD Modeling of the Mixed-Mode Degradation Mechanism in SiGe HBTs

IEEE transactions on electron devices, 2012-11, Vol.59 (11), p.2895-2901

2012

Volltextzugriff (PDF)

Physical Differences in Hot Carrier Degradation of Oxide Interfaces in Complementary (n-p-n+p-n-p) SiGe HBTs

IEEE transactions on electron devices, 2017-01, Vol.64 (1), p.37-44

2017

Volltextzugriff (PDF)

Design of Radiation-Hardened RF Low-Noise Amplifiers Using Inverse-Mode SiGe HBTs

IEEE transactions on nuclear science, 2014-12, Vol.61 (6), p.3218-3225

2014

Volltextzugriff (PDF)

Total Ionizing Dose Effects on a High-Voltage (>30V) Complementary SiGe on SOI Technology

IEEE transactions on nuclear science, 2017-01, Vol.64 (1), p.277-284

2017

Volltextzugriff (PDF)

An Investigation of the Use of Inverse-Mode SiGe HBTs as Switching Pairs for SET-Mitigated RF Mixers

IEEE transactions on nuclear science, 2016-04, Vol.63 (2), p.1099-1108

2016

Volltextzugriff (PDF)

Single-Event Effects in a W-Band (75-110 GHz) Radar Down-Conversion Mixer Implemented in 90 nm, 300 GHz SiGe HBT Technology

IEEE transactions on nuclear science, 2015-12, Vol.62 (6), p.2657-2665

2015

Volltextzugriff (PDF)

Optimization of SiGe HBT RF Switches for Single-Event Transient Mitigation

IEEE transactions on nuclear science, 2015-12, Vol.62 (6), p.3057-3063

2015

Volltextzugriff (PDF)

Chemical Pathways in the Interactions of Reactive Metal Atoms with Organic Surfaces: Vapor Deposition of Ca and Ti on a Methoxy-Terminated Alkanethiolate Monolayer on Au

The journal of physical chemistry. B, 2005-06, Vol.109 (22), p.11263-11272

2005

Volltextzugriff (PDF)

Electrostatic Discharge Stress Effects on the Performance and Reliability of High Performance NPN SiGe HBTs

2023 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS), 2023, p.245-248

2023

Volltextzugriff (PDF)

Probing Zeolites with Organic Molecules: Supercages of X and Y Zeolites Are Superpolar

Langmuir, 2000-01, Vol.16 (1), p.265-274

2000

Volltextzugriff (PDF)

Optimizing the vertical profile of SiGe HBTs to mitigate radiation-induced upsets

2015 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - BCTM, 2015, p.72-75

2015

Volltextzugriff (PDF)

An optical crossconnect (OXC) using drawbridge micromirrors

Sensors and actuators. A, Physical, 2002-04, Vol.97, p.227-238

2002

Volltextzugriff (PDF)

Analysis of the Factors Limiting the RF Breakdown Voltage in SiGe HBTs for Wi-Fi PA Applications

2021 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS), 2021, p.1-4

2021

Volltextzugriff (PDF)

A Comparison of Field and Current-Driven Hot-Carrier Reliability in NPN SiGe HBTs

IEEE transactions on electron devices, 2015-07, Vol.62 (7), p.2244-2250

2015

Volltextzugriff (PDF)

Hot-Carrier-Damage-Induced Current Gain Enhancement (CGE) Effects in SiGe HBTs

IEEE transactions on electron devices, 2018-06, Vol.65 (6), p.2430-2438

2018

Volltextzugriff (PDF)

Physics of Hot Carrier Degradation Under Off-State Mode Operation in High Performance NPN SiGe HBTs

2021 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS), 2021, p.1-4

2021

Volltextzugriff (PDF)

The Effects of Carbon Doping on the Performance and Electrical Reliability of SiGe HBTs

2023 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS), 2023, p.253-256

2023

Volltextzugriff (PDF)

Bias- and Temperature-Dependent Accumulated Stress Modeling of Mixed-Mode Damage in SiGe HBTs

IEEE transactions on electron devices, 2015-07, Vol.62 (7), p.2084-2091

2015

Volltextzugriff (PDF)

SiGe HBTs for Power Amplifiers in Front-End of Radio Communication Systems

2022 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS), 2022, p.1-6

2022

Volltextzugriff (PDF)

Limiting Effects on the Design of Vertical Superjunction Collectors in SiGe HBTs

IEEE transactions on electron devices, 2018-02, Vol.65 (2), p.793-797

2018

Volltextzugriff (PDF)

Asymmetric Photoreactions within Zeolites: Role of Confinement and Alkali Metal Ions

Accounts of chemical research, 2003-07, Vol.36 (7), p.509-521

2003

Volltextzugriff (PDF)

1 – 25 von 149

Suche als RSS-Feed

Suchergebnisse filtern

Filter anzeigen

Nur zeigen

Geprüft (Peer-Review)
(83)
Mit Volltextzugriff
(112)

Publikationsform

Sprache

Englisch
(149)

Erscheinungsjahr

n.n

Thema

Science & Technology
(94)
Technology
(64)
Engineering
(52)
Physical Sciences
(51)
Engineering, Electrical & Electronic
(50)
Chemistry
(26)
Silicon Germanium
(26)
Physics
(24)
Sige Hbt
(21)
Heterojunction Bipolar Transistors
(18)
Materials Science
(18)
Physics, Applied
(18)
Silicon Germanides
(18)
Reliability
(16)
Chemistry, Multidisciplinary
(14)
Degradation
(13)
Exact Sciences And Technology
(13)
Life Sciences & Biomedicine
(13)
Chemistry, Physical
(12)
Materials Science, Multidisciplinary
(12)

15 weitere anzeigen...

Weniger anzeigen...

Neu hinzugefügt

... seit 30 Tagen
(1)
... seit 90 Tagen
(2)

Menü

Weitere Dienste

Einstellungen

Fast Frequency and Phase Tracking Analog PLL for Direct Carrier Synchronization

Variability of p-n Junctions and SiGe HBTs at Cryogenic Temperatures

Large-Signal Reliability Analysis of SiGe HBT Cascode Driver Amplifiers

An Investigation of High-Temperature (to 300 °C) Safe-Operating-Area in a High-Voltage Complementary SiGe on SOI Technology

Predictive Physics-Based TCAD Modeling of the Mixed-Mode Degradation Mechanism in SiGe HBTs

Physical Differences in Hot Carrier Degradation of Oxide Interfaces in Complementary (n-p-n+p-n-p) SiGe HBTs

Design of Radiation-Hardened RF Low-Noise Amplifiers Using Inverse-Mode SiGe HBTs

Total Ionizing Dose Effects on a High-Voltage (>30V) Complementary SiGe on SOI Technology

An Investigation of the Use of Inverse-Mode SiGe HBTs as Switching Pairs for SET-Mitigated RF Mixers

Single-Event Effects in a W-Band (75-110 GHz) Radar Down-Conversion Mixer Implemented in 90 nm, 300 GHz SiGe HBT Technology

Optimization of SiGe HBT RF Switches for Single-Event Transient Mitigation

Chemical Pathways in the Interactions of Reactive Metal Atoms with Organic Surfaces: Vapor Deposition of Ca and Ti on a Methoxy-Terminated Alkanethiolate Monolayer on Au

Electrostatic Discharge Stress Effects on the Performance and Reliability of High Performance NPN SiGe HBTs

Probing Zeolites with Organic Molecules: Supercages of X and Y Zeolites Are Superpolar

Optimizing the vertical profile of SiGe HBTs to mitigate radiation-induced upsets

An optical crossconnect (OXC) using drawbridge micromirrors

Analysis of the Factors Limiting the RF Breakdown Voltage in SiGe HBTs for Wi-Fi PA Applications

A Comparison of Field and Current-Driven Hot-Carrier Reliability in NPN SiGe HBTs

Hot-Carrier-Damage-Induced Current Gain Enhancement (CGE) Effects in SiGe HBTs

Physics of Hot Carrier Degradation Under Off-State Mode Operation in High Performance NPN SiGe HBTs

The Effects of Carbon Doping on the Performance and Electrical Reliability of SiGe HBTs

Bias- and Temperature-Dependent Accumulated Stress Modeling of Mixed-Mode Damage in SiGe HBTs

SiGe HBTs for Power Amplifiers in Front-End of Radio Communication Systems

Limiting Effects on the Design of Vertical Superjunction Collectors in SiGe HBTs

Asymmetric Photoreactions within Zeolites: Role of Confinement and Alkali Metal Ions

Suchergebnisse filtern