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IET control theory & applications, 2007-03, Vol.1 (2), p.532-544
2007
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2013 IEEE Aerospace Conference, 2013, p.1-16
2013
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2013 IEEE Aerospace Conference, 2013, p.1-14
2013
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The Journal of emergency medicine, 2017-07, Vol.53 (1), p.102-109
2017
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Proceedings of the 2002 American Control Conference (IEEE Cat. No.CH37301), 2002, Vol.2, p.1686-1692 vol.2
2002
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IET control theory & applications, 2007, Vol.1 (2), p.532-544
2007
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2007 IEEE Aerospace Conference, 2007, p.1-13
2007
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25th Anniversary, IEEE Conference Record - Abstracts. 1998 IEEE International Conference on Plasma Science (Cat. No.98CH36221), 1998, p.130
1998
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IEEE Conference Record - Abstracts. 1997 IEEE International Conference on Plasma Science, 1997, p.320
1997
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25th Anniversary, IEEE Conference Record - Abstracts. 1998 IEEE International Conference on Plasma Science (Cat. No.98CH36221), 1998, p.149
1998
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IFAC Proceedings Volumes, 2007, Vol.40 (7), p.828-833
2007
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IEEE Conference Record - Abstracts. 1997 IEEE International Conference on Plasma Science, 1997, p.277
1997
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IEEE Conference Record - Abstracts. 1997 IEEE International Conference on Plasma Science, 1997, p.318
1997
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IEEE transactions on electron devices, 2021-12, Vol.68 (12), p.6279-6285
2021
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Arthritis & rheumatology (Hoboken, N.J.), 2017-02, Vol.69 (2), p.362-375
- Neuwelt, C. Michael
- Hobbs, Kathryn
- Galateanu, Catrinel
- Beaudot, Carolyn
- Kilgallen, Brian
- Batalov, A.
- Duca, L.
- Horak, P.
- Monova, D.
- Otsa, K.
- Popova, T.
- Radulescu, F.
- Rednic, S.
- Vezikova, N.
- Vitek, P.
- Zainea, C.
- Huang, C.
- Kang, S.
- Lai, N.
- Shim, S.
- Zapata, F. Avila
- Cavalcanti, F.
- Agmon‐Levin, N.
- Kadel, J.
- Levy, Y.
- Mevorach, D.
- Rosner, I.
- Shobha, V.
- Zisman, D.
- Ayesu, K.
- Chi, J.
- Clowse, M.
- Dao, K.
- Diab, I.
- Dikranian, A.
- El‐Shahawy, M.
- Kao, A.
- Katz, R.
- Lawrence‐Ford, T.
- Merrill, J.
- Niemer, G.
- Pickrell, P.
- Rothfield, N.
- Snyder, A.
- Striebich, C.
- Vo, Q.
- Littlejohn, G.
- Perez, L.Carreno
- Chakravarty, K.
- Gonzales, F. Diaz
- Davies, K.
- Doria, A.
- Fernández‐Nebro, A.
- Govoni, M.
- Hachulla, E.
- Muñoz‐Fernández, S.
- Pena‐Sagredo, J.
- Schmidt, R. E.
- Ucar‐Angulo, E.
- Westhovens, R.
- Yee, C. S.
- Bazela, B.
- Chudzik, D.
- Geher, P.
- Ionescu, R.
- Kwiatkowska, B.
- Leszczynski, P.
- Nalotov, S.
- Pavel, M.
- Raskina, T.
- Rezus, E.
- Semen, T.
- Bonfiglioli, R.
- Baker, M.
- Chow, A.
- Clay, C.
- Conaway, D.
- Denburg, J.
- Escalante, A.
- Fortin, I.
- Goddard, D.
- Hemaiden, A.
- Kalunian, K.
- Lafyatis, R.
- Mease, P.
- Mehta, C.
- Nascimento, J.
- Saadeh, C.
- Valenzuela, G.
- Alten, R.
- Braun, J.
- Dival, L.
- Espinosa, G.
- Fernandez, I. Figueroa
- Gordon, C.
- Jacobi, A.
- Pego‐Reigosa, J. M.
- Rubbert‐Roth, A.
- Schroeder, J.
- Schwarting, A.
2017
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IEEE transactions on electron devices, 2018-08, Vol.65 (8), p.3361-3364
2018
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Materials science forum, 2022-05, Vol.1062, p.504-508
2022
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The European physical journal. A, Hadrons and nuclei, 2024-07, Vol.60 (7), Article 156
- Yassine, R. Abou
- Arnold, O.
- Atomssa, E. T.
- Behnke, C.
- Blanco, A.
- Blume, C.
- Böhmer, M.
- Chudoba, P.
- Ciepał, I.
- Deb, S.
- Dittert, D.
- Dreyer, J.
- Epple, E.
- Fabbietti, L.
- Fonte, P.
- Franco, C.
- Fröhlich, I.
- Förtsch, J.
- Garzón, J. A.
- Gernhäuser, R.
- Greifenhagen, R.
- Grunwald, M.
- Hojeij, F.
- Idzik, M.
- Kämpfer, B.
- Kampert, K.-H.
- Kardan, B.
- Kedych, V.
- Koenig, W.
- Kohls, M.
- Kolas, J.
- Kolb, B. W.
- Korcyl, G.
- Kornakov, G.
- Kotte, R.
- Krueger, W.
- Kugler, A.
- Lalik, R.
- Lapidus, K.
- Linev, S.
- Linz, F.
- Lopes, L.
- Lorenz, M.
- Mahmoud, T.
- Maier, L.
- Malige, A.
- Markert, J.
- Maurus, S.
- Metag, V.
- Michel, J.
- Mihaylov, D. M.
- Mikhaylov, V.
- Molenda, A.
- Müntz, C.
- Münzer, R.
- Nabroth, M.
- Naumann, L.
- Nowakowski, K.
- Otto, J. -H.
- Pauly, C.
- Pechenova, O.
- Piasecki, K.
- Pietraszko, J.
- Povar, T.
- Prościński, K.
- Pysz, K.
- Ramstein, B.
- Rathod, N.
- Rodriguez-Ramos, P.
- Rost, A.
- Rustamov, A.
- Salabura, P.
- Scheib, T.
- Schmidt-Sommerfeld, K.
- Schuldes, H.
- Schwab, E.
- Scozzi, F.
- Seck, F.
- Siebenson, J.
- Silva, L.
- Smyrski, J.
- Spataro, S.
- Spies, S.
- Stefaniak, M.
- Ströbele, H.
- Sumara, K.
- Svoboda, O.
- Tsertos, H.
- Udrea, I. C.
- Wagner, V.
- Wendisch, C.
- Wiebusch, M. G.
- Wirth, J.
- Władyszewska, A.
- Zbroszczyk, H. P.
- Zherebtsova, E.
- Zielinski, M.
- Zumbruch, P.
- Curceanu, C.
- Scordo, A.
2024
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Nanotechnology, 2017-05, Vol.28 (18), p.184001-184001
2017
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Semiconductor science and technology, 2017-01, Vol.32 (1), p.14001
2017
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Frontiers in oncology, 2016-10, Vol.6, p.232-232
2016
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2023 International Semiconductor Conference (CAS), 2023, p.89-92
2023
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Sensors (Basel, Switzerland), 2016-08, Vol.16 (9), p.1351
2016
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Nanotechnology, 2008-01, Vol.19 (2), p.025607-025607 (5)
2008
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IEEE transactions on electron devices, 2013-04, Vol.60 (4), p.1412-1415
2013
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