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IEEE transactions on electron devices, 1985-02, Vol.32 (2), p.375-385
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IEEE journal of solid-state circuits, 1985-02, Vol.20 (1), p.295-305
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2022 International Symposium on VLSI Design, Automation and Test (VLSI-DAT), 2022, p.1-1
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Proceedings of the 5th international conference on Soft computing as transdisciplinary science and technology, 2008, p.59-64
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IEEE electron device letters, 1991-08, Vol.12 (8), p.453-455
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IEEE electron device letters, 1990-07, Vol.11 (7), p.294-296
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IEEE transactions on electron devices, 1988-12, Vol.35 (12), p.2253-2258
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IEEE transactions on electron devices, 1990-11, Vol.37 (11), p.2388-2394
1990

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Gate current in OFF-state MOSFET
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2018
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