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Reliability Analysis of Ethernet-Based Solutions for Data Transmission in the CERN Radiation Environment

IEEE transactions on nuclear science, 2020-07, Vol.67 (7), p.1614-1622

2020

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IEEE_Xplore

Radiation Effects on Deep Submicrometer SRAM-Based FPGAs Under the CERN Mixed-Field Radiation Environment

IEEE transactions on nuclear science, 2018-08, Vol.65 (8), p.1511-1518

2018

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IEEE_Xplore

Multiple Cell Upset Classification in Commercial SRAMs

IEEE transactions on nuclear science, 2014-08, Vol.61 (4), p.1747-1754

2014

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IEEE_Xplore

Single-Event Effects in the Peripheral Circuitry of a Commercial Ferroelectric Random Access Memory

IEEE transactions on nuclear science, 2018-08, Vol.65 (8), p.1708-1714

2018

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IEEE_Xplore

Soft errors in commercial off-the-shelf static random access memories

Semiconductor science and technology, 2017-01, Vol.32 (1), p.13006

2017

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Investigation on MCU Clustering Methodologies for Cross-Section Estimation of RAMs

IEEE transactions on nuclear science, 2015-12, Vol.62 (6), p.2620-2626

2015

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IEEE_Xplore

Testing a Commercial MRAM Under Neutron and Alpha Radiation in Dynamic Mode

IEEE transactions on nuclear science, 2013-08, Vol.60 (4), p.2617-2622

2013

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IEEE_Xplore

Dynamic Test Methods for COTS SRAMs

IEEE transactions on nuclear science, 2014-12, Vol.61 (6), p.3095-3102

2014

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IEEE_Xplore

Analyzing the impact of radiation-induced failures in flash-based APSoC with and without fault tolerance techniques at CERN environment

Microelectronics and reliability, 2017-09, Vol.76-77, p.640-643

2017

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SEE on Different Layers of Stacked-SRAMs

IEEE transactions on nuclear science, 2015-12, Vol.62 (6), p.2673-2678

2015

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IEEE_Xplore

An SRAM Based Monitor for Mixed-Field Radiation Environments

IEEE transactions on nuclear science, 2014-08, Vol.61 (4), p.1663-1670

2014

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IEEE_Xplore

90 nm SRAM Static and Dynamic Mode Real-Time Testing at Concordia Station in Antarctica

IEEE transactions on nuclear science, 2014-12, Vol.61 (6), p.3389-3394

2014

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IEEE_Xplore

2018 Compendium of Radiation-Induced Effects for Candidate Particle Accelerator Electronics

2018 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2018), 2018, p.1-6

2018

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IEEE_Xplore

Evaluating a radiation monitor for mixed-field environments based on SRAM technology

Journal of instrumentation, 2014-05, Vol.9 (5), p.C05052-C05052

2014

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Compendium of Radiation-Induced Effects for Candidate Particle Accelerator Electronics

2017 IEEE Radiation Effects Data Workshop (REDW), 2017, p.1-6

2017

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IEEE_Xplore

On the evaluation of FPGA radiation benchmarks

Microelectronics and reliability, 2021-11, Vol.126, p.114276, Article 114276

2021

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On the correlation between Static Noise Margin and Soft Error Rate evaluated for a 40nm SRAM cell

2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS), 2013, p.143-148

2013

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IEEE_Xplore

A Mixed Verification Strategy Tailored for Networks on Chip

2012 IEEE/ACM Sixth International Symposium on Networks-on-Chip, 2012, p.161-168

2012

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IEEE_Xplore

Multiple-Cell-Upsets on a commercial 90nm SRAM in dynamic mode

2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS), 2013, p.1-4

2013

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IEEE_Xplore

Evaluation of test algorithms stress effect on SRAMs under neutron radiation

2012 IEEE 18th International On-Line Testing Symposium (IOLTS), 2012, p.121-122

2012

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IEEE_Xplore

SRAM soft error rate evaluation under atmospheric neutron radiation and PVT variations

2013 IEEE 19th International On-Line Testing Symposium (IOLTS), 2013, p.145-150

2013

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IEEE_Xplore

SEU monitoring in mixed-field radiation environments of particle accelerators

2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS), 2013, p.1-4

2013

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IEEE_Xplore

Characterization of an SRAM based particle detector for mixed-field radiation environments

5th IEEE International Workshop on Advances in Sensors and Interfaces IWASI, 2013, p.75-80

2013

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IEEE_Xplore

A very high resolution DAC at 1kHz for space applications

2010 NASA/ESA Conference on Adaptive Hardware and Systems, 2010, p.364-370

2010

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IEEE_Xplore

Ambient nitro-aromatic compounds – biomass burning versus secondary formation in rural China

Atmospheric chemistry and physics, 2021-02, Vol.21 (3), p.1389-1406

2021

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Reliability Analysis of Ethernet-Based Solutions for Data Transmission in the CERN Radiation Environment

Radiation Effects on Deep Submicrometer SRAM-Based FPGAs Under the CERN Mixed-Field Radiation Environment

Multiple Cell Upset Classification in Commercial SRAMs

Single-Event Effects in the Peripheral Circuitry of a Commercial Ferroelectric Random Access Memory

Soft errors in commercial off-the-shelf static random access memories

Investigation on MCU Clustering Methodologies for Cross-Section Estimation of RAMs

Testing a Commercial MRAM Under Neutron and Alpha Radiation in Dynamic Mode

Dynamic Test Methods for COTS SRAMs

Analyzing the impact of radiation-induced failures in flash-based APSoC with and without fault tolerance techniques at CERN environment

SEE on Different Layers of Stacked-SRAMs

An SRAM Based Monitor for Mixed-Field Radiation Environments

90 nm SRAM Static and Dynamic Mode Real-Time Testing at Concordia Station in Antarctica

2018 Compendium of Radiation-Induced Effects for Candidate Particle Accelerator Electronics

Evaluating a radiation monitor for mixed-field environments based on SRAM technology

Compendium of Radiation-Induced Effects for Candidate Particle Accelerator Electronics

On the evaluation of FPGA radiation benchmarks

On the correlation between Static Noise Margin and Soft Error Rate evaluated for a 40nm SRAM cell

A Mixed Verification Strategy Tailored for Networks on Chip

Multiple-Cell-Upsets on a commercial 90nm SRAM in dynamic mode

Evaluation of test algorithms stress effect on SRAMs under neutron radiation

SRAM soft error rate evaluation under atmospheric neutron radiation and PVT variations

SEU monitoring in mixed-field radiation environments of particle accelerators

Characterization of an SRAM based particle detector for mixed-field radiation environments

A very high resolution DAC at 1kHz for space applications

Ambient nitro-aromatic compounds – biomass burning versus secondary formation in rural China

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