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Independent Component Analysis-Based Background Subtraction for Indoor Surveillance

IEEE transactions on image processing, 2009-01, Vol.18 (1), p.158-167

2009

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Defect Detection in Electronic Surfaces Using Template-Based Fourier Image Reconstruction

IEEE transactions on components, packaging, and manufacturing technology (2011), 2019-01, Vol.9 (1), p.163-172

2019

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Machine Vision-Based Positioning and Inspection Using Expectation-Maximization Technique

IEEE transactions on instrumentation and measurement, 2017-11, Vol.66 (11), p.2858-2868

2017

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Data-Driven Approach for Fault Detection and Diagnostic in Semiconductor Manufacturing

IEEE transactions on automation science and engineering, 2020-10, Vol.17 (4), p.1925-1936

2020

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Fast and Precise Positioning in PCBs Using Deep Neural Network Regression

IEEE transactions on instrumentation and measurement, 2020-07, Vol.69 (7), p.4692-4701

2020

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Auto-Annotated Deep Segmentation for Surface Defect Detection

IEEE transactions on instrumentation and measurement, 2021, Vol.70, p.1-10

2021

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Watermark Detection in CMOS Image Sensors Using Cosine-Convolutional Semantic Networks

IEEE transactions on semiconductor manufacturing, 2023-05, Vol.36 (2), p.279-290

2023

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Defect detection of solar cells in electroluminescence images using Fourier image reconstruction

Solar energy materials and solar cells, 2012-04, Vol.99, p.250-262

2012

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Defect Detection in Solar Modules Using ICA Basis Images

IEEE transactions on industrial informatics, 2013-02, Vol.9 (1), p.122-131

2013

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Fault Diagnosis of Wafer Acceptance Test and Chip Probing Between Front-End-of-Line and Back-End-of-Line Processes

IEEE transactions on automation science and engineering, 2022-10, Vol.19 (4), p.3068-3082

2022

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Environment-Adaptable Printed-Circuit Board Positioning Using Deep Reinforcement Learning

IEEE transactions on components, packaging, and manufacturing technology (2011), 2022-02, Vol.12 (2), p.382-390

2022

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Key Feature Identification for Monitoring Wafer-to-Wafer Variation in Semiconductor Manufacturing

IEEE transactions on automation science and engineering, 2022-07, Vol.19 (3), p.1-12

2022

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A motion and image analysis method for automatic detection of estrus and mating behavior in cattle

Computers and electronics in agriculture, 2014-06, Vol.104, p.25-31

2014

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Effective Variational-Autoencoder-Based Generative Models for Highly Imbalanced Fault Detection Data in Semiconductor Manufacturing

IEEE transactions on semiconductor manufacturing, 2023-05, Vol.36 (2), p.205-214

2023

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Self assured Deep Learning with Minimum Pre Labeled Data for Wafer Pattern Classification

IEEE transactions on semiconductor manufacturing, 2023-08, Vol.36 (3), p.1-1

2023

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Mean Shift-Based Defect Detection in Multicrystalline Solar Wafer Surfaces

IEEE transactions on industrial informatics, 2011-02, Vol.7 (1), p.125-135

2011

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A Shift-Tolerant Dissimilarity Measure for Surface Defect Detection

IEEE transactions on industrial informatics, 2012-02, Vol.8 (1), p.128-137

2012

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Defect Inspection in Low-Contrast LCD Images Using Hough Transform-Based Nonstationary Line Detection

IEEE transactions on industrial informatics, 2011-02, Vol.7 (1), p.136-147

2011

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Key Parameter Identification and Defective Wafer Detection of Semiconductor Manufacturing Processes Using Image Processing Techniques

IEEE transactions on semiconductor manufacturing, 2019-11, Vol.32 (4), p.544-552

2019

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Data Visualization of Anomaly Detection in Semiconductor Processing Tools

IEEE transactions on semiconductor manufacturing, 2022-05, Vol.35 (2), p.186-197

2022

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Autofocus Measurement for Electronic Components Using Deep Regression

IEEE transactions on components, packaging, and manufacturing technology (2011), 2021-04, Vol.11 (4), p.697-707

2021

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Autoencoder-based anomaly detection for surface defect inspection

Advanced engineering informatics, 2021-04, Vol.48, p.101272, Article 101272

2021

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Fast normalized cross correlation for defect detection

Pattern recognition letters, 2003-11, Vol.24 (15), p.2625-2631

2003

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Accurate Vision-Based PCB Positioning Using Cosine-Convolutional Neural Networks

IEEE transactions on automation science and engineering, 2024-07, Vol.21 (3), p.2564-2573

2024

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Automated surface inspection for statistical textures

Image and vision computing, 2003-04, Vol.21 (4), p.307-323

2003

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Independent Component Analysis-Based Background Subtraction for Indoor Surveillance

Defect Detection in Electronic Surfaces Using Template-Based Fourier Image Reconstruction

Machine Vision-Based Positioning and Inspection Using Expectation-Maximization Technique

Data-Driven Approach for Fault Detection and Diagnostic in Semiconductor Manufacturing

Fast and Precise Positioning in PCBs Using Deep Neural Network Regression

Auto-Annotated Deep Segmentation for Surface Defect Detection

Watermark Detection in CMOS Image Sensors Using Cosine-Convolutional Semantic Networks

Defect detection of solar cells in electroluminescence images using Fourier image reconstruction

Defect Detection in Solar Modules Using ICA Basis Images

Fault Diagnosis of Wafer Acceptance Test and Chip Probing Between Front-End-of-Line and Back-End-of-Line Processes

Environment-Adaptable Printed-Circuit Board Positioning Using Deep Reinforcement Learning

Key Feature Identification for Monitoring Wafer-to-Wafer Variation in Semiconductor Manufacturing

A motion and image analysis method for automatic detection of estrus and mating behavior in cattle

Effective Variational-Autoencoder-Based Generative Models for Highly Imbalanced Fault Detection Data in Semiconductor Manufacturing

Self assured Deep Learning with Minimum Pre Labeled Data for Wafer Pattern Classification

Mean Shift-Based Defect Detection in Multicrystalline Solar Wafer Surfaces

A Shift-Tolerant Dissimilarity Measure for Surface Defect Detection

Defect Inspection in Low-Contrast LCD Images Using Hough Transform-Based Nonstationary Line Detection

Key Parameter Identification and Defective Wafer Detection of Semiconductor Manufacturing Processes Using Image Processing Techniques

Data Visualization of Anomaly Detection in Semiconductor Processing Tools

Autofocus Measurement for Electronic Components Using Deep Regression

Autoencoder-based anomaly detection for surface defect inspection

Fast normalized cross correlation for defect detection

Accurate Vision-Based PCB Positioning Using Cosine-Convolutional Neural Networks

Automated surface inspection for statistical textures

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