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Structural and electrochemical properties of iron- and nickel-substituted Li 2 MnO 3 cathodes in charged and discharged states

Journal of power sources, 2017-10, Vol.365, p.117-125

2017

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Nondestructive Warpage Measurements of LSI Chips in a Stacked System in Package by Using High-Energy X-ray Diffraction

Japanese Journal of Applied Physics, 2010-04, Vol.49 (4), p.04DB03-04DB03-5

Toda, Akio

2010

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Electron holography for analysis of deep submicron devices: Present status and challenges

Journal of vacuum science and technology. B, Nanotechnology & microelectronics, 2010-01, Vol.28 (1), p.C1-C1D10

2010

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Electron holography analysis of a shallow junction for planar-bulk metal-oxide-semiconductor field-effect transistors approaching the scaling limit

Journal of applied physics, 2008-06, Vol.103 (11), p.114514-114514-5

2008

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Impact of Crystalline Phase of Ni-FUSI Gate Electrode on Bias Temperature Instability and Gate Dielectric Breakdown of HfSiON MOSFETs

IEEE transactions on electron devices, 2007-03, Vol.54 (3), p.483-491

2007

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Structural and electrochemical properties of iron- and nickel-substituted Li2MnO3 cathodes in charged and discharged states

Journal of power sources, 2017-10, Vol.365, p.117-125

2017

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Channel Strain in Advanced Complementary Metal–Oxide–Semiconductor Field Effect Transistors Measured Using Nano-Beam Electron Diffraction

Japanese Journal of Applied Physics, 2008-04, Vol.47 (4S), p.2496

2008

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Charge Compensation Mechanism during Cycles in Fe-Containing Li2MnO3 Cathode for High Energy Density and Low-Cost Lithium-Ion Batteries

Electrochimica acta, 2016-01, Vol.189, p.166-174

2016

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Local lattice strain distribution around a transistor channel in metal–oxide–semiconductor devices

Applied physics letters, 2001-12, Vol.79 (25), p.4243-4245

2001

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Local lattice strain measurements in semiconductor devices by using convergent-beam electron diffraction

Journal of crystal growth, 2000-03, Vol.210 (1), p.341-345

2000

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Charge Compensation Mechanism during Cycles in Fe-Containing Li sub(2)MnO sub(3) Cathode for High Energy Density and Low-Cost Lithium-Ion Batteries

Electrochimica acta, 2016-01, Vol.189, p.166-174

2016

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Charge Compensation Mechanism during Cycles in Fe-Containing Li 2 MnO 3 Cathode for High Energy Density and Low-Cost Lithium-Ion Batteries

Electrochimica acta, 2016-01, Vol.189, p.166-174

2016

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Electron spin resonance observation of field-induced charge carriers in ultrathin-film transistors of regioregular poly(3-hexylthiophene) with controlled in-plane chain orientation

Applied physics letters, 2010-04, Vol.96 (17)

2010

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Remarkable Charge-Discharge Mechanism for a Large Capacity in Fe-Containing Li 2 MnO 3 Cathodes

Journal of the Electrochemical Society, 2014, Vol.161 (14), p.A2237-A2242

2014

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Bias Temperature Instability Characterization of Advanced Gate Stacks

ECS transactions, 2007-04, Vol.6 (3), p.185-202

2007

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Cherenkov and Transition Radiation from Thin Plate Crystals Detected in the Transmission Electron Microscope

Proceedings of the Royal Society of London. Series A: Mathematical and Physical Sciences, 1996-12, Vol.452 (1953), p.2279-2301

1996

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Mechanism of Gas Generation in Lithium Ion Batteries by Overdischarge

ECS transactions, 2015-12, Vol.69 (20), p.17-22

2015

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Ideal spread monolayer formation and surface pressure induced orientation in poly(9,9-di-n-octylfluorene-alt-benzothiadiazole) via hybridized with liquid crystal molecule on water

Synthetic metals, 2009-05, Vol.159 (9), p.835-838

2009

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Electron spin resonance observation of field-induced charge carriersin ultrathin-film transistors of regioregular poly(3-hexylthiophene)with controlled in-plane chain orientation

Applied physics letters, 2010-04, Vol.96 (17), p.173302-173302-3

2010

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Charge Transport Anisotropy due to Interfacial Molecular Orientation in Polymeric Transistors with Controlled In-Plane Chain Orientation

Applied physics express, 2012-02, Vol.5 (2), p.21602

2012

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A Finite Element Analysis of Process-Induced Stress in Scaled-Down MOSFETs : Finite Element Stress Analysis and Evaluation of its Validity by Using Convergent-Beam Electron Diffraction

Transactions of the Japan Society of Mechanical Engineers Series A, 2002/11/25, Vol.68(675), pp.1614-1621

2002

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PZT MIM capacitor with oxygen-doped Ru-electrodes for embedded FeRAM devices

IEEE transactions on electron devices, 2005-10, Vol.52 (10), p.2227-2235

2005

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Electron Holography Characterization of Shallow Junction Fabricated By Diffusion-less Process for Sub-30 nm Gate-Length MOSFETs

AIP conference proceedings, 2008-11, Vol.1066 (1)

2008

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Determining the relationship between local lattice strain and slip systems of dislocations around shallow trench isolation by convergent-beam electron diffraction

Applied physics letters, 2002-04, Vol.80 (13), p.2278-2280

2002

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Mechanism of Gas Generation in Lithium Ion Batteries By Overdischarge

Meeting abstracts (Electrochemical Society), 2015-07, Vol.MA2015-02 (4), p.354-354

2015

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Structural and electrochemical properties of iron- and nickel-substituted Li 2 MnO 3 cathodes in charged and discharged states

Nondestructive Warpage Measurements of LSI Chips in a Stacked System in Package by Using High-Energy X-ray Diffraction

Electron holography for analysis of deep submicron devices: Present status and challenges

Electron holography analysis of a shallow junction for planar-bulk metal-oxide-semiconductor field-effect transistors approaching the scaling limit

Impact of Crystalline Phase of Ni-FUSI Gate Electrode on Bias Temperature Instability and Gate Dielectric Breakdown of HfSiON MOSFETs

Structural and electrochemical properties of iron- and nickel-substituted Li2MnO3 cathodes in charged and discharged states

Channel Strain in Advanced Complementary Metal–Oxide–Semiconductor Field Effect Transistors Measured Using Nano-Beam Electron Diffraction

Charge Compensation Mechanism during Cycles in Fe-Containing Li2MnO3 Cathode for High Energy Density and Low-Cost Lithium-Ion Batteries

Local lattice strain distribution around a transistor channel in metal–oxide–semiconductor devices

Local lattice strain measurements in semiconductor devices by using convergent-beam electron diffraction

Charge Compensation Mechanism during Cycles in Fe-Containing Li sub(2)MnO sub(3) Cathode for High Energy Density and Low-Cost Lithium-Ion Batteries

Charge Compensation Mechanism during Cycles in Fe-Containing Li 2 MnO 3 Cathode for High Energy Density and Low-Cost Lithium-Ion Batteries

Electron spin resonance observation of field-induced charge carriers in ultrathin-film transistors of regioregular poly(3-hexylthiophene) with controlled in-plane chain orientation

Remarkable Charge-Discharge Mechanism for a Large Capacity in Fe-Containing Li 2 MnO 3 Cathodes

Bias Temperature Instability Characterization of Advanced Gate Stacks

Cherenkov and Transition Radiation from Thin Plate Crystals Detected in the Transmission Electron Microscope

Mechanism of Gas Generation in Lithium Ion Batteries by Overdischarge

Ideal spread monolayer formation and surface pressure induced orientation in poly(9,9-di-n-octylfluorene-alt-benzothiadiazole) via hybridized with liquid crystal molecule on water

Electron spin resonance observation of field-induced charge carriersin ultrathin-film transistors of regioregular poly(3-hexylthiophene)with controlled in-plane chain orientation

Charge Transport Anisotropy due to Interfacial Molecular Orientation in Polymeric Transistors with Controlled In-Plane Chain Orientation

A Finite Element Analysis of Process-Induced Stress in Scaled-Down MOSFETs : Finite Element Stress Analysis and Evaluation of its Validity by Using Convergent-Beam Electron Diffraction

PZT MIM capacitor with oxygen-doped Ru-electrodes for embedded FeRAM devices

Electron Holography Characterization of Shallow Junction Fabricated By Diffusion-less Process for Sub-30 nm Gate-Length MOSFETs

Determining the relationship between local lattice strain and slip systems of dislocations around shallow trench isolation by convergent-beam electron diffraction

Mechanism of Gas Generation in Lithium Ion Batteries By Overdischarge

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