UB Paderborn / Katalog / Suche / in CDI

Sortiert nach

Einfacher Volltextzugriff von (fast) überall

Installieren Sie die LibKey Nomad-Browsererweiterung und erhalten Sie von vielen Webseiten einfachen Zugriff auf lizenzierte Volltexte oder Open Access Publikationen. Mehr erfahren...

Intrinsic gettering by oxide precipitate induced dislocations in Czochralski Si

Applied physics letters, 1977-02, Vol.30 (4), p.175-176

1977

Volltextzugriff (PDF)

Paradoxes of Professionalization: Parallel Dilemmas in Women's Organizations in the Americas

Gender & society, 2002-12, Vol.16 (6), p.941-958

2002

Volltextzugriff (PDF)

Nucleation of CuSi precipitate colonies in oxygen-rich silicon

Applied physics letters, 1976-05, Vol.28 (9), p.564-565

1976

Volltextzugriff (PDF)

Reduction of Leakage by Implantation Gettering in VLSI Circuits

IBM journal of research and development, 1980-05, Vol.24 (3), p.310-317

1980

Volltextzugriff (PDF)

Oxygen Precipitation and Formation of Diffusion Shorts in FET Circuits

Journal of the Electrochemical Society, 1989-05, Vol.136 (5), p.1572-1573

Tice, W. K.

1989

Volltextzugriff (PDF)

Oxygen precipitation and the generation of dislocations in silicon

Philosophical magazine (London, England : 1945), 1976-10, Vol.34 (4), p.615-631

1976

Volltextzugriff (PDF)

Circular stacking faults in silicon

Applied physics letters, 1974-02, Vol.24 (4), p.157-158

1974

Volltextzugriff (PDF)

Nucleation of stacking faults at oxide precipitate-dislocation complexes in silicon

Applied physics letters, 1976-12, Vol.29 (12), p.765-767

1976

Volltextzugriff (PDF)

Queens of Academe: Campus Pageantry and Student Life

Feminist studies, 2005-07, Vol.31 (2), p.250-283

Tice, Karen W.

2005

Volltextzugriff (PDF)

General Fracture Method for Preparation of Foils for Transmission Electron Microscopy

Journal of the American Ceramic Society, 1966-04, Vol.49 (4), p.190-194

1966

Volltextzugriff (PDF)

The Determination of Fine Metallic Filament Morphology by Ultramicrotomy

Analytical chemistry (Washington), 1963-09, Vol.35 (10), p.1553-1554

1963

Volltextzugriff (PDF)

Determination of the Surface Population of Copper Oxide Whiskers by Electron Microscopy Techniques

Analytical chemistry (Washington), 1962-12, Vol.34 (13), p.1795-1797

1962

Volltextzugriff (PDF)

Characterization by Optical and Electron Microscopy Techniques of Oxidation Products Formed on Dual Porosity Sintered Nickel Electrodes

Analytical chemistry (Washington), 1966-09, Vol.38 (10), p.1350-1353

1966

Volltextzugriff (PDF)

Creep behavior of Al-Al3Ni eutectic composites

Metallurgical transactions, 1972-01, Vol.3 (1), p.211-219

1972

Volltextzugriff (PDF)

Critical microstructure for ion-implantation gettering effects in silicon

Applied physics letters, 1977-04, Vol.30 (7), p.325-327

1977

Volltextzugriff (PDF)

THE USE OF TRANSGENIC ANIMALS IN CANCER TESTING

Inhalation toxicology, 1999-06, Vol.11 (6-7), p.541-544

1999

Volltextzugriff (PDF)

Critical Microstructure for Ion-Implantation Gettering Effects in Si

Applied physics letters, 1977-04, Vol.30 (7), p.325-327

1977

Volltextzugriff (PDF)

Nucleation of CuSi Precipitate Colonies in O-Rich Si

Applied physics letters, 1976-05, Vol.28 (9), p.564-565

1976

Volltextzugriff (PDF)

Precipitation of Oxygen and Intrinsic Gettering in Silicon

MRS proceedings, 1980, Vol.2, Article 367

1980

Volltextzugriff (PDF)

Circular Stacking Faults in Si

Applied physics letters, 1974-02, Vol.24 (4), p.157-158

1974

Volltextzugriff (PDF)

Oxygen Precipitation and the Generation of Dislocations in Si

Philosophical magazine (Abingdon, England), 1976-10, Vol.34 (4), p.615-631

1976

Volltextzugriff (PDF)

Nucleation of Stacking Faults at Oxide Precipitate-Dislocation Complexes in Si

Applied physics letters, 1976-12, Vol.29 (12), p.765-767

1976

Volltextzugriff (PDF)

Closure to “Discussion of ‘An Electron Optical Study of the Effect of Temperature and Environment on the Growth of Oxide Whiskers on Cold-Rolled and Annealed Copper’ [W. R. Lasko and W. K. Tice (pp. 211–215, Vol. 109, No. 3)]”

Journal of the Electrochemical Society, 1962, Vol.109 (12), p.1218

1962

Volltextzugriff (PDF)

Weak Beam Imaging and Diffraction Studies of Stacking Faults in Silicon

Proceedings, annual meeting, Electron Microscopy Society of America, 1976-08, Vol.34, p.590-591

1976

Volltextzugriff (PDF)

Generation and Dislocations at the Interface Between Oxygen Precipitates and Silicon

Proceedings, annual meeting, Electron Microscopy Society of America, 1975, Vol.33, p.252-253

1975

Volltextzugriff (PDF)

1 – 25 von 174

Menü

Weitere Dienste

Einstellungen

Intrinsic gettering by oxide precipitate induced dislocations in Czochralski Si

Paradoxes of Professionalization: Parallel Dilemmas in Women's Organizations in the Americas

Nucleation of CuSi precipitate colonies in oxygen-rich silicon

Reduction of Leakage by Implantation Gettering in VLSI Circuits

Oxygen Precipitation and Formation of Diffusion Shorts in FET Circuits

Oxygen precipitation and the generation of dislocations in silicon

Circular stacking faults in silicon

Nucleation of stacking faults at oxide precipitate-dislocation complexes in silicon

Queens of Academe: Campus Pageantry and Student Life

General Fracture Method for Preparation of Foils for Transmission Electron Microscopy

The Determination of Fine Metallic Filament Morphology by Ultramicrotomy

Determination of the Surface Population of Copper Oxide Whiskers by Electron Microscopy Techniques

Characterization by Optical and Electron Microscopy Techniques of Oxidation Products Formed on Dual Porosity Sintered Nickel Electrodes

Creep behavior of Al-Al3Ni eutectic composites

Critical microstructure for ion-implantation gettering effects in silicon

THE USE OF TRANSGENIC ANIMALS IN CANCER TESTING

Critical Microstructure for Ion-Implantation Gettering Effects in Si

Nucleation of CuSi Precipitate Colonies in O-Rich Si

Precipitation of Oxygen and Intrinsic Gettering in Silicon

Circular Stacking Faults in Si

Oxygen Precipitation and the Generation of Dislocations in Si

Nucleation of Stacking Faults at Oxide Precipitate-Dislocation Complexes in Si

Closure to “Discussion of ‘An Electron Optical Study of the Effect of Temperature and Environment on the Growth of Oxide Whiskers on Cold-Rolled and Annealed Copper’ [W. R. Lasko and W. K. Tice (pp. 211–215, Vol. 109, No. 3)]”

Weak Beam Imaging and Diffraction Studies of Stacking Faults in Silicon

Generation and Dislocations at the Interface Between Oxygen Precipitates and Silicon

Suchergebnisse filtern