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Health and Medicine in the National Nanotechnology Initiative

MRS proceedings, 2007, Vol.1019

Teague, Clayton

2007

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NanoEHS – defining fundamental science needs: no easy feat when the simple itself is complex

Environmental science. Nano, 2016-02, Vol.3 (1), p.15-27

2016

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Towards a Uniform Description System for Materials on the Nanoscale

Chemistry international, 2015-07, Vol.37 (4), p.3-7

2015

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Recent developments in electrical linewidth and overlay metrology for integrated circuit fabrication processes

Japanese Journal of Applied Physics, 1996-12, Vol.35 (12B), p.6597-6609

1996

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NanoEHS - defining fundamental science needs: no easy feat when the simple itself is complexVicki Grassian - workshop co-organizer, workshop moderator and perspective writer and primary editor. Amanda Haes - workshop co-organizer, workshop speaker on Nanomaterials are not just small - fate from biological, chemical, and physical stability perspectives and workshop moderator and perspectives article writer and primary editor. Imali Mudunkotuwa - workshop scribe and perspectives article major writ

2016-02

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The description of nanomaterials: A multi-disiciplinary uniform description system

2014 IEEE International Conference on Bioinformatics and Biomedicine (BIBM), 2014, p.34-39

2014

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The National Institute of Standards and Technology molecular measuring machine project: Metrology and precision engineering design

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 1989-11, Vol.7 (6), p.1898-1902

Teague, E. Clayton

1989

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Uncertainties in Calibrating a Stylus Type Surface Texture Measuring Instrument with an Interferometrically Measured Step

Metrologia, 1978-01, Vol.14 (1), p.39-44

Teague, E Clayton

1978

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Light Scattering from Manufactured Surfaces

CIRP annals, 1981, Vol.30 (2), p.563-569

1981

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On measuring the root-mean-square value of a finite record length periodic waveform

Journal of research of the National Institute of Standards and Technology, 1989-11, Vol.94 (6), p.367-371

TEAGUE, E. C

1989

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Vibration of a room-sized airspring-supported slab

Noise control engineering journal, 1998-03, Vol.46 (2), p.39

1998

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A new method to measure the distance between graduation lines on graduated scales

IEEE transactions on instrumentation and measurement, 2000-12, Vol.49 (6), p.1285-1288

2000

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ROOM TEMPERATURE GOLD-VACUUM-GOLD TUNNELING EXPERIMENTS

Journal of research of the National Bureau of Standards (1977), 1986-07, Vol.91 (4), p.171-233

Teague, E.C.

1986

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Piezodriven 50‐μm range stage with subnanometer resolution

Review of scientific instruments, 1978-12, Vol.49 (12), p.1735-1740

1978

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Scanning tip microscopies: An overview and some history

Proceedings, annual meeting, Electron Microscopy Society of America, 1988, Vol.46, p.1004-1005

Clayton Teague, E.

1988

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The National Institute of Standards and Technology Molecular Measuring Machine Project: Metrology and precision engineering design

Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 1990-09, Vol.8 (5), p.3876-3877

Teague, E. Clayton

1990

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Discussion: “Assessing the Effect of Stylus Tip Radius and Flight on Surface Topography Measurements” (McCool, J. I., 1984, ASME J. Tribol., 106, pp. 202–209)

Journal of tribology, 1984-04, Vol.106 (2), p.209-209

Teague, E. Clayton

1984

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Model calculations of fields related to near-field optical scanning of a silver strip on a glass substrate

Applied physics letters, 1987-12, Vol.51 (25), p.2073-2075

1987

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Three-dimensional stylus profilometry

Wear, 1982-12, Vol.83 (1), p.1-12

1982

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New test structure for nanometer-level overlay and feature-placement metrology

IEEE transactions on semiconductor manufacturing, 1994-08, Vol.7 (3), p.266-271

1994

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Para‐flex stage for microtopographic mapping

Review of scientific instruments, 1988-01, Vol.59 (1), p.67-73

1988

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ROOM TEMPERATURE GOLD - VACUUM - GOLD TUNNELING EXPERIMENTS

TEAGUE, EDGAR CLAYTON

1978

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Sinusoidal profile precision roughness specimens

Wear, 1982-12, Vol.83 (1), p.61-73

1982

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Light Scattering from Manufactured Surfaces † † Contribution of the U.S. National Bureau of Standards, not subject to copyright

CIRP annals, 1981, Vol.30 (2), p.563-569

1981

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In-Process and On-Line Measurement of Surface Finish 1 1 Contribution of the U.S. National Bureau of Standards, not subject to copyright

CIRP annals, 1980, Vol.29 (1), p.435-440

1980

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Health and Medicine in the National Nanotechnology Initiative

NanoEHS – defining fundamental science needs: no easy feat when the simple itself is complex

Towards a Uniform Description System for Materials on the Nanoscale

Recent developments in electrical linewidth and overlay metrology for integrated circuit fabrication processes

The description of nanomaterials: A multi-disiciplinary uniform description system

The National Institute of Standards and Technology molecular measuring machine project: Metrology and precision engineering design

Uncertainties in Calibrating a Stylus Type Surface Texture Measuring Instrument with an Interferometrically Measured Step

Light Scattering from Manufactured Surfaces

On measuring the root-mean-square value of a finite record length periodic waveform

Vibration of a room-sized airspring-supported slab

A new method to measure the distance between graduation lines on graduated scales

ROOM TEMPERATURE GOLD-VACUUM-GOLD TUNNELING EXPERIMENTS

Piezodriven 50‐μm range stage with subnanometer resolution

Scanning tip microscopies: An overview and some history

The National Institute of Standards and Technology Molecular Measuring Machine Project: Metrology and precision engineering design

Discussion: “Assessing the Effect of Stylus Tip Radius and Flight on Surface Topography Measurements” (McCool, J. I., 1984, ASME J. Tribol., 106, pp. 202–209)

Model calculations of fields related to near-field optical scanning of a silver strip on a glass substrate

Three-dimensional stylus profilometry

New test structure for nanometer-level overlay and feature-placement metrology

Para‐flex stage for microtopographic mapping

ROOM TEMPERATURE GOLD - VACUUM - GOLD TUNNELING EXPERIMENTS

Sinusoidal profile precision roughness specimens

Light Scattering from Manufactured Surfaces † † Contribution of the U.S. National Bureau of Standards, not subject to copyright

In-Process and On-Line Measurement of Surface Finish 1 1 Contribution of the U.S. National Bureau of Standards, not subject to copyright

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