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Circular multilayer zone plate for high-energy x-ray nano-imaging

Review of scientific instruments, 2012-01, Vol.83 (1), p.013705-013705-4

2012

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Performance Test of Fresnel Zone Plate with 50 nm Outermost Zone Width in Hard X-ray Region

Japanese Journal of Applied Physics, 2005-04, Vol.44 (4R), p.1994

2005

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Performance of Y2O3∕Al multilayer coatings for the He-II radiation at 30.4 nm

Review of scientific instruments, 2011-03, Vol.82 (3), p.033106-033106

2011

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Evaluation of sputtering rate change in the silicon transient region under medium energy O2+ sputtering

Applied surface science, 2008-12, Vol.255 (4), p.1348-1350

2008

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Realization of polymeric optical integrated devices utilizing organic light-emitting diodes and photodetectors fabricated on a polymeric waveguide

IEEE journal of selected topics in quantum electronics, 2004-01, Vol.10 (1), p.70-78

2004

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High-Transmittance Free-Standing Aluminum Extreme Ultraviolet Filter

Japanese Journal of Applied Physics, 2009-12, Vol.48 (12), p.122202

2009

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Soft-X-ray reflectivity and heat resistance of SiC/Mg multilayer

Journal of electron spectroscopy and related phenomena, 2005-06, Vol.144 (Complete), p.1047-1049

2005

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Development of X-ray 2D dispersive device for WD-XRF imaging spectrometer

Powder diffraction, 2012-06, Vol.27 (2), p.71-74

2012

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Multilayer coating for 30.4nm

Review of scientific instruments, 2005-06, Vol.76 (6)

2005

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AFM Tip Characterizer fabricated by Si/SiO2 multilayers

e-Journal of Surface Science and Nanotechnology, 2011/07/16, Vol.9, pp.293-296

2011

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Multi-layered flyer accelerated by laser induced shock waves

Physics of plasmas, 2000-02, Vol.7 (2), p.676-680

2000

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Evolving shock-wave profiles measured in a silicon crystal by picosecond time-resolved x-ray diffraction

Applied physics letters, 2000-09, Vol.77 (13), p.1967-1969

2000

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Bevel depth profiling by high-spatial-resolution sputtered neutral mass spectrometry with laser postionization

Journal of vacuum science and technology. B, Nanotechnology & microelectronics, 2018-05, Vol.36 (3)

2018

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EUV beam splitter for use in the wavelength region around 6nm

Journal of electron spectroscopy and related phenomena, 2005-06, Vol.144-147, p.1043-1045

2005

Volltextzugriff (PDF)

Evaluation of sputtering rate change in the silicon transient region under medium energy O 2 + sputtering

Applied surface science, 2008-12, Vol.255 (4), p.1348-1350

2008

Volltextzugriff (PDF)

Diffraction-limited Microbeam with Fresnel Zone Plate Optics in Hard X-Ray Regions

Japanese Journal of Applied Physics, 2001-03, Vol.40 (3R), p.1508

2001

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An effect of measurement conditions on the depth resolution for low-energy dual-beam depth profiling using TOF-SIMS

Surface and interface analysis, 2013-08, Vol.45 (8), p.1261-1265

2013

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Transient Properties of Organic Electroluminescent Diode Using 8-Hydroxyquinoline Aluminum Doped with Rubrene as an Electro-Optical Conversion Device for Polymeric Integrated Devices

Japanese Journal of Applied Physics, 2002-04, Vol.41 (Part 1, No. 4B), p.2746-2748

2002

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Heat resistance of Mo/Si, MoSi2/Si, and Mo5Si3/Si multilayer soft x-ray mirrors

Journal of applied physics, 1995-11, Vol.78 (9), p.5227-5230

1995

Volltextzugriff (PDF)

Point spread function measurement of an X-ray beam focused by a multilayer zone plate with narrow annular aperture

Journal of synchrotron radiation, 2014-03, Vol.21 (2), p.446-448

2014

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Chemical bonding state analysis of silicon carbide layers in Mo/SiC/Si multilayer mirrors by soft x-ray emission and absorption spectroscopy

Applied physics letters, 2000-10, Vol.77 (17), p.2653-2655

2000

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New evaluation beamline for soft x-ray optical elements

Review of Scientific Instruments, 2002-03, Vol.73 (3), p.1541-1544

2002

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Comparison of a new dead-time correction method and conventional models for SIMS analysis

Surface and interface analysis, 2012-09, Vol.44 (9), p.1287-1293

2012

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Thermal stability of Mo/C/Si/C multilayer soft X-ray mirrors

Journal of electron spectroscopy and related phenomena, 1996-05, Vol.80 (1-3), p.381-384

1996

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Matrix effect-free depth profiling of multilayered Si/Ti with laser-SNMS

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2012-07, Vol.283, p.55-58

2012

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Circular multilayer zone plate for high-energy x-ray nano-imaging

Performance Test of Fresnel Zone Plate with 50 nm Outermost Zone Width in Hard X-ray Region

Performance of Y2O3∕Al multilayer coatings for the He-II radiation at 30.4 nm

Evaluation of sputtering rate change in the silicon transient region under medium energy O2+ sputtering

Realization of polymeric optical integrated devices utilizing organic light-emitting diodes and photodetectors fabricated on a polymeric waveguide

High-Transmittance Free-Standing Aluminum Extreme Ultraviolet Filter

Soft-X-ray reflectivity and heat resistance of SiC/Mg multilayer

Development of X-ray 2D dispersive device for WD-XRF imaging spectrometer

Multilayer coating for 30.4nm

AFM Tip Characterizer fabricated by Si/SiO2 multilayers

Multi-layered flyer accelerated by laser induced shock waves

Evolving shock-wave profiles measured in a silicon crystal by picosecond time-resolved x-ray diffraction

Bevel depth profiling by high-spatial-resolution sputtered neutral mass spectrometry with laser postionization

EUV beam splitter for use in the wavelength region around 6nm

Evaluation of sputtering rate change in the silicon transient region under medium energy O 2 + sputtering

Diffraction-limited Microbeam with Fresnel Zone Plate Optics in Hard X-Ray Regions

An effect of measurement conditions on the depth resolution for low-energy dual-beam depth profiling using TOF-SIMS

Transient Properties of Organic Electroluminescent Diode Using 8-Hydroxyquinoline Aluminum Doped with Rubrene as an Electro-Optical Conversion Device for Polymeric Integrated Devices

Heat resistance of Mo/Si, MoSi2/Si, and Mo5Si3/Si multilayer soft x-ray mirrors

Point spread function measurement of an X-ray beam focused by a multilayer zone plate with narrow annular aperture

Chemical bonding state analysis of silicon carbide layers in Mo/SiC/Si multilayer mirrors by soft x-ray emission and absorption spectroscopy

New evaluation beamline for soft x-ray optical elements

Comparison of a new dead-time correction method and conventional models for SIMS analysis

Thermal stability of Mo/C/Si/C multilayer soft X-ray mirrors

Matrix effect-free depth profiling of multilayered Si/Ti with laser-SNMS

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