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Resolving Multi-Path Interference in Compressive Time-of-Flight Depth Imaging with a Multi-Tap Macro-Pixel Computational CMOS Image Sensor

Sensors (Basel, Switzerland), 2022-03, Vol.22 (7), p.2442

2022

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A Dual-Mode 303-Megaframes-per-Second Charge-Domain Time-Compressive Computational CMOS Image Sensor

Sensors (Basel, Switzerland), 2022-03, Vol.22 (5), p.1953

2022

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A Time-of-Flight Range Image Sensor With Background Canceling Lock-in Pixels Based on Lateral Electric Field Charge Modulation

IEEE journal of the Electron Devices Society, 2015-05, Vol.3 (3), p.267-275

2015

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Multi-Aperture-Based Probabilistic Noise Reduction of Random Telegraph Signal Noise and Photon Shot Noise in Semi-Photon-Counting Complementary-Metal-Oxide-Semiconductor Image Sensor

Sensors (Basel, Switzerland), 2018-03, Vol.18 (4), p.977

2018

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RTS noise and dark current white defects reduction using selective averaging based on a multi-aperture system

Sensors (Basel, Switzerland), 2014-01, Vol.14 (1), p.1528-1543

2014

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[Papers] Separation of Multi-path Components in Sweep-less Time-of-flight Depth Imaging with a Temporally-compressive Multi-aperture Image Sensor

ITE Transactions on Media Technology and Applications, 2018, Vol.6(3), pp.202-211

2018

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[Paper] Dark Current Characterization of Low-noise CMOS Global Shutter Pixels Using Pinned Storage Diodes

ITE Transactions on Media Technology and Applications, 2014, Vol.2(2), pp.108-113

2014

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A low-noise high-sensitivity CMOS image sensor for scientific and industrial applications

IEEE SENSORS 2014 Proceedings, 2014, p.2163-2166

2014

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IEEE_Xplore

[Paper] Low-light Color Reproduction by Selective Averaging in Multi-aperture Camera with Bayer Color-filter Low-noise CMOS Image Sensors

ITE Transactions on Media Technology and Applications, 2015, Vol.3(4), pp.234-239

2015

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Single-event transient imaging with an ultra-high-speed temporally compressive multi-aperture CMOS image sensor

Optics express, 2016-02, Vol.24 (4), p.4155-4176

2016

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A Low-Noise High Intrascene Dynamic Range CMOS Image Sensor With a 13 to 19b Variable-Resolution Column-Parallel Folding-Integration/Cyclic ADC

IEEE journal of solid-state circuits, 2012-01, Vol.47 (1), p.272-283

2012

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IEEE_Xplore

A Submillimeter Range Resolution Time-of-Flight Range Imager With Column-Wise Skew Calibration

IEEE transactions on electron devices, 2016-01, Vol.63 (1), p.182-188

2016

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An indirect time-of-flight measurement technique with impulse photocurrent response for sub-millimeter range resolved imaging

Optics express, 2014-08, Vol.22 (16), p.18904-18913

2014

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A 38µm Range Precision Time-of-Flight CMOS Range Line Imager with Gating Driver Jitter Reduction Using Charge-Injection Pseudo Photocurrent Reference

2022 IEEE International Solid- State Circuits Conference (ISSCC), 2022, Vol.65, p.100-102

2022

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IEEE_Xplore

A Low-Noise High-Dynamic-Range 17-b 1.3-Megapixel 30-fps CMOS Image Sensor With Column-Parallel Two-Stage Folding-Integration/Cyclic ADC

IEEE transactions on electron devices, 2012-12, Vol.59 (12), p.3396-3400

2012

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IEEE_Xplore

A Low Noise Wide Dynamic Range CMOS Image Sensor With Low-Noise Transistors and 17b Column-Parallel ADCs

IEEE sensors journal, 2013-08, Vol.13 (8), p.2922-2929

2013

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IEEE_Xplore

6.4 Single-shot 200Mfps 5×3-aperture compressive CMOS imager

2015 IEEE International Solid-State Circuits Conference - (ISSCC) Digest of Technical Papers, 2015, p.1-3

2015

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IEEE_Xplore

11.2 A 10.8ps-time-resolution 256×512 image sensor with 2-Tap true-CDS lock-in pixels for fluorescence lifetime imaging

2015 IEEE International Solid-State Circuits Conference - (ISSCC) Digest of Technical Papers, 2015, p.1-3

2015

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IEEE_Xplore

7.5 A 0.3mm-resolution Time-of-Flight CMOS range imager with column-gating clock-skew calibration

2014 IEEE International Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2014, p.132-133

2014

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IEEE_Xplore

7.4 A 413×240-pixel sub-centimeter resolution Time-of-Flight CMOS image sensor with in-pixel background canceling using lateral-electric-field charge modulators

2014 IEEE International Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2014, p.130-131

2014

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IEEE_Xplore

An 80μVrms-temporal-noise 82dB-dynamic-range CMOS Image Sensor with a 13-to-19b variable-resolution column-parallel folding-integration/cyclic ADC

2011 IEEE International Solid-State Circuits Conference, 2011, p.400-402

2011

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IEEE_Xplore

A low noise wide dynamic range CMOS image sensor with low-noise transistors and 17b column-parallel ADC

2012 IEEE Sensors, 2012, p.1-4

2012

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IEEE_Xplore

A Distance Measurement Method Using A Time-of-Flight CMOS Range Image Sensor with 4-Tap Output Pixels and Multiple Time-Windows

Electronic Imaging, 2018-01, Vol.30 (11), p.326-1-326-4

2018

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A Time-of-Flight CMOS Range Image Sensor Using 4-Tap Output Pixels with Lateral-Electric-Field Control

Electronic Imaging, 2016-02, Vol.28 (12), p.1-6

2016

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A Lateral Electric Field charge Modulator with Bipolar-gates for Time-resolved Imaging

Electronic Imaging, 2017-01, Vol.29 (11), p.64-67

2017

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Resolving Multi-Path Interference in Compressive Time-of-Flight Depth Imaging with a Multi-Tap Macro-Pixel Computational CMOS Image Sensor

A Dual-Mode 303-Megaframes-per-Second Charge-Domain Time-Compressive Computational CMOS Image Sensor

A Time-of-Flight Range Image Sensor With Background Canceling Lock-in Pixels Based on Lateral Electric Field Charge Modulation

Multi-Aperture-Based Probabilistic Noise Reduction of Random Telegraph Signal Noise and Photon Shot Noise in Semi-Photon-Counting Complementary-Metal-Oxide-Semiconductor Image Sensor

RTS noise and dark current white defects reduction using selective averaging based on a multi-aperture system

[Papers] Separation of Multi-path Components in Sweep-less Time-of-flight Depth Imaging with a Temporally-compressive Multi-aperture Image Sensor

[Paper] Dark Current Characterization of Low-noise CMOS Global Shutter Pixels Using Pinned Storage Diodes

A low-noise high-sensitivity CMOS image sensor for scientific and industrial applications

[Paper] Low-light Color Reproduction by Selective Averaging in Multi-aperture Camera with Bayer Color-filter Low-noise CMOS Image Sensors

Single-event transient imaging with an ultra-high-speed temporally compressive multi-aperture CMOS image sensor

A Low-Noise High Intrascene Dynamic Range CMOS Image Sensor With a 13 to 19b Variable-Resolution Column-Parallel Folding-Integration/Cyclic ADC

A Submillimeter Range Resolution Time-of-Flight Range Imager With Column-Wise Skew Calibration

An indirect time-of-flight measurement technique with impulse photocurrent response for sub-millimeter range resolved imaging

A 38µm Range Precision Time-of-Flight CMOS Range Line Imager with Gating Driver Jitter Reduction Using Charge-Injection Pseudo Photocurrent Reference

A Low-Noise High-Dynamic-Range 17-b 1.3-Megapixel 30-fps CMOS Image Sensor With Column-Parallel Two-Stage Folding-Integration/Cyclic ADC

A Low Noise Wide Dynamic Range CMOS Image Sensor With Low-Noise Transistors and 17b Column-Parallel ADCs

6.4 Single-shot 200Mfps 5×3-aperture compressive CMOS imager

11.2 A 10.8ps-time-resolution 256×512 image sensor with 2-Tap true-CDS lock-in pixels for fluorescence lifetime imaging

7.5 A 0.3mm-resolution Time-of-Flight CMOS range imager with column-gating clock-skew calibration

7.4 A 413×240-pixel sub-centimeter resolution Time-of-Flight CMOS image sensor with in-pixel background canceling using lateral-electric-field charge modulators

An 80μVrms-temporal-noise 82dB-dynamic-range CMOS Image Sensor with a 13-to-19b variable-resolution column-parallel folding-integration/cyclic ADC

A low noise wide dynamic range CMOS image sensor with low-noise transistors and 17b column-parallel ADC

A Distance Measurement Method Using A Time-of-Flight CMOS Range Image Sensor with 4-Tap Output Pixels and Multiple Time-Windows

A Time-of-Flight CMOS Range Image Sensor Using 4-Tap Output Pixels with Lateral-Electric-Field Control

A Lateral Electric Field charge Modulator with Bipolar-gates for Time-resolved Imaging

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