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A Digital Testing Strategy for Characterizing an Analog Circuit Block

IEEE transactions on instrumentation and measurement, 2016-06, Vol.65 (6), p.1374-1384

Ting, Hsin-Wen

2016

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Analysis of Nonideal Behaviors Based on INL/DNL Plots for SAR ADCs

IEEE transactions on instrumentation and measurement, 2016-08, Vol.65 (8), p.1804-1817

2016

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A VLSI On-Chip Analog High-Order Low-Pass Filter Performance Evaluation Strategy

IEEE transactions on instrumentation and measurement, 2018-03, Vol.67 (3), p.621-633

2018

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Analyses of Splittable Amplifier Technique and Cancellation of Memory Effect for Opamp Sharing

IEEE transactions on very large scale integration (VLSI) systems, 2017-02, Vol.25 (2), p.621-634

2017

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A Histogram-Based Testing Method for Estimating A/D Converter Performance

IEEE transactions on instrumentation and measurement, 2008-02, Vol.57 (2), p.420-427

2008

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Transition-Code Based Linearity Test Method for Pipelined ADCs With Digital Error Correction

IEEE transactions on very large scale integration (VLSI) systems, 2011-12, Vol.19 (12), p.2158-2169

2011

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A capacitance-ratio quantification design for linearity test in differential top-plate sampling sar ADCS

International journal of circuit theory and applications, 2015-10, Vol.43 (10), p.1333-1350

2015

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A performance evaluation method suitable for characterizing wide types of analog filters

Journal of the Chinese Institute of Engineers, 2021-02, Vol.44 (2), p.138-148

2021

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Realization of High Octave Decomposition for Breast Cancer Feature Extraction on Ultrasound Images

IEEE transactions on circuits and systems. I, Regular papers, 2011-06, Vol.58 (6), p.1287-1299

2011

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A Low-Cost Stimulus Design for Linearity Test in SAR ADCs

IEICE transactions on electronics, 2014, Vol.E97.C (6), p.538-545

2014

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A design and its practical application to the pseudo two-step successive-approximation register analog-to-digital converter with the active charge transfer technique

Journal of the Chinese Institute of Engineers, 2017-08, Vol.40 (6), p.514-524

2017

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A Third-Order Low-Distortion Delta-Sigma Modulator with Opamp Sharing and Relaxed Feedback Path Timing

IEICE transactions on electronics, 2012, Vol.E95.C (11), p.1799-1809

2012

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Digital-Compatible Testing Scheme for Operational Amplifier

Journal of electronic testing, 2012-06, Vol.28 (3), p.267-277

Ting, Hsin-Wen

2012

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An Output Response Analyzer Circuit for ADC Built-in Self-Test

Journal of electronic testing, 2011-08, Vol.27 (4), p.455-464

Ting, Hsin-Wen

2011

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A simple voltage-to-frequency converter with modulated duty cycle

Journal of the Chinese Institute of Engineers, 2015-01, Vol.38 (1), p.109-119

2015

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Histogram Based Testing Strategy for ADC

2006 15th Asian Test Symposium, 2006, p.51-54

2006

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Digital Design-for-Diagnosis Method for Error Identification of Pipelined ADCs

Journal of electronic testing, 2011-12, Vol.27 (6), p.697-709

2011

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A Simple Capacitive Sensor with Digital-Compatibility Output

Sensor letters, 2012-05, Vol.10 (5), p.1252-1257

2012

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Electronically Adjustable Capacitor Multiplier Based Low-Pass Filter

Advanced science letters, 2012-04, Vol.8 (1), p.754-758

2012

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A Layout Strategy for Reducing the Random Error of Analog Circuit Blocks

2016 3rd International Conference on Green Technology and Sustainable Development (GTSD), 2016, p.24-27

2016

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A simple testing structure for analog circuits

2012 International Conference on Information Security and Intelligent Control, 2012, p.25-28

Hsin-Wen Ting

2012

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Design of 20-Gb/s four-level pulse amplitude modulation VCSEL driver in 90-nm CMOS technology

2016 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC), 2016, p.195-198

2016

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A time domain built-in self-test methodology for SNDR and ENOB tests of analog-to-digital converters

13th Asian Test Symposium, 2004, p.52-57

2004

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An overkill detection system for improving the testing quality of semiconductor

2012 International Conference on Information Security and Intelligent Control, 2012, p.29-32

2012

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Oscillator-Based Reconfigurable Sinusoidal Signal Generator for ADC BIST

Journal of electronic testing, 2007-12, Vol.23 (6), p.549-558

2007

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A Digital Testing Strategy for Characterizing an Analog Circuit Block

Analysis of Nonideal Behaviors Based on INL/DNL Plots for SAR ADCs

A VLSI On-Chip Analog High-Order Low-Pass Filter Performance Evaluation Strategy

Analyses of Splittable Amplifier Technique and Cancellation of Memory Effect for Opamp Sharing

A Histogram-Based Testing Method for Estimating A/D Converter Performance

Transition-Code Based Linearity Test Method for Pipelined ADCs With Digital Error Correction

A capacitance-ratio quantification design for linearity test in differential top-plate sampling sar ADCS

A performance evaluation method suitable for characterizing wide types of analog filters

Realization of High Octave Decomposition for Breast Cancer Feature Extraction on Ultrasound Images

A Low-Cost Stimulus Design for Linearity Test in SAR ADCs

A design and its practical application to the pseudo two-step successive-approximation register analog-to-digital converter with the active charge transfer technique

A Third-Order Low-Distortion Delta-Sigma Modulator with Opamp Sharing and Relaxed Feedback Path Timing

Digital-Compatible Testing Scheme for Operational Amplifier

An Output Response Analyzer Circuit for ADC Built-in Self-Test

A simple voltage-to-frequency converter with modulated duty cycle

Histogram Based Testing Strategy for ADC

Digital Design-for-Diagnosis Method for Error Identification of Pipelined ADCs

A Simple Capacitive Sensor with Digital-Compatibility Output

Electronically Adjustable Capacitor Multiplier Based Low-Pass Filter

A Layout Strategy for Reducing the Random Error of Analog Circuit Blocks

A simple testing structure for analog circuits

Design of 20-Gb/s four-level pulse amplitude modulation VCSEL driver in 90-nm CMOS technology

A time domain built-in self-test methodology for SNDR and ENOB tests of analog-to-digital converters

An overkill detection system for improving the testing quality of semiconductor

Oscillator-Based Reconfigurable Sinusoidal Signal Generator for ADC BIST

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