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Measurement of InAsSb bandgap energy and InAs/InAsSb band edge positions using spectroscopic ellipsometry and photoluminescence spectroscopy

Journal of applied physics, 2015-12, Vol.118 (24)

2015

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Atomic layer deposition of LiF using LiN(SiMe3)2 and SF6 plasma

Physical chemistry chemical physics : PCCP, 2021-01, Vol.23 (15), p.9304-9314

2021

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Transparent polycrystalline Gd2Hf2O7 ceramics

Journal of the American Ceramic Society, 2018-09, Vol.101 (9), p.3797-3807

2018

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Spectroscopic ellipsometry characterization of indium tin oxide film microstructure and optical constants

Thin solid films, 1998-02, Vol.313 (1-2), p.394-397

Synowicki, R.A

1998

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Atomic layer deposition of LiF using LiN(SiMe 3 ) 2 and SF 6 plasma

Physical chemistry chemical physics : PCCP, 2021-04, Vol.23 (15), p.9304-9314

2021

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Suppression of backside reflections from transparent substrates

Physica status solidi. C, 2008-05, Vol.5 (5), p.1085-1088

Synowicki, R. A.

2008

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Absorption properties of type-II InAs/InAsSb superlattices measured by spectroscopic ellipsometry

Applied physics letters, 2015-02, Vol.106 (6)

2015

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Rare-Earth Monopnictide Alloys for Tunable, Epitaxial, Designer Plasmonics

ACS photonics, 2018-08, Vol.5 (8), p.3051-3056

2018

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Design and Testing of a Multivariate Optical Element: The First Demonstration of Multivariate Optical Computing for Predictive Spectroscopy

Analytical chemistry (Washington), 2001-03, Vol.73 (6), p.1069-1079

2001

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Optical constants of electroplated gold from spectroscopic ellipsometry

Applied surface science, 2017-11, Vol.421, p.824-830

2017

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Atomic layer deposition of LiF using LiN(SiMe) and SF plasma

Physical chemistry chemical physics : PCCP, 2021-04, Vol.23 (15), p.934-9314

2021

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Design and Testing of a Multivariate Optical Element: The First Demonstration of Multivariate Optical Computing for Predictive Spectroscopy

Analytical chemistry (Washington), 2001-09, Vol.73 (17), p.4393-4393

2001

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Atomic layer deposition of aluminum fluoride using Al(CH3)3 and SF6 plasma

Applied physics letters, 2017-09, Vol.111 (11)

2017

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Polydimethylsiloxane: Optical properties from 191 to 1688 nm (0.735–6.491 eV) of the liquid material by spectroscopic ellipsometry

Surface science spectra, 2018-12, Vol.25 (2)

2018

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Transparent polycrystalline Gd 2 Hf 2 O 7 ceramics

Journal of the American Ceramic Society, 2018-09, Vol.101 (9), p.3797-3807

2018

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Mueller matrix ellipsometry study of uniaxial deuterated potassium dihydrogen phosphate (DKDP)

Thin solid films, 2004-05, Vol.455, p.624-627

2004

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Structural, electrical, and optical properties of thermally evaporated nanocrystalline PbTe films

Journal of applied physics, 2008-09, Vol.104 (5), p.053707-053707-5

2008

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Thin film materials exposure to low Earth orbit aboard Space Shuttle

Journal of spacecraft and rockets, 1995-01, Vol.32 (1), p.97-102

1995

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Microstructural characterization of SiOx surface contaminants on ashed aluminum thin films

Surface & coatings technology, 1997-03, Vol.90 (1-2), p.150-155

1997

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Optical constants of (Al0.98Ga0.02)xOy native oxides

Applied physics letters, 1998-12, Vol.73 (24), p.3512-3514

1998

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Low-Earth-orbit exposure of carbon-based materials aboard Shuttle flight STS-46

Journal of spacecraft and rockets, 1995-11, Vol.32 (6), p.1015-1017

1995

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Low Earth orbit effects on indium tin oxide and polyester and comparison with laboratory simulations

Surface & coatings technology, 1993-12, Vol.62 (1), p.499-503

1993

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Oxygen plasma asher contamination: An analysis of sources and remedies

Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 1996-11, Vol.14 (6), p.3075-3081

1996

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Errata-Low Earth Orbit Simulation and Materials Characterization

Journal of spacecraft and rockets, 1993-11, Vol.30 (6), p.788-788

1993

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Degradation of thin films: comparison between low Earth orbit experiments and laboratory simulations of the space environment

Thin solid films, 1994-04, Vol.241 (1), p.218-221

1994

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Measurement of InAsSb bandgap energy and InAs/InAsSb band edge positions using spectroscopic ellipsometry and photoluminescence spectroscopy

Atomic layer deposition of LiF using LiN(SiMe3)2 and SF6 plasma

Transparent polycrystalline Gd2Hf2O7 ceramics

Spectroscopic ellipsometry characterization of indium tin oxide film microstructure and optical constants

Atomic layer deposition of LiF using LiN(SiMe 3 ) 2 and SF 6 plasma

Suppression of backside reflections from transparent substrates

Absorption properties of type-II InAs/InAsSb superlattices measured by spectroscopic ellipsometry

Rare-Earth Monopnictide Alloys for Tunable, Epitaxial, Designer Plasmonics

Design and Testing of a Multivariate Optical Element: The First Demonstration of Multivariate Optical Computing for Predictive Spectroscopy

Optical constants of electroplated gold from spectroscopic ellipsometry

Atomic layer deposition of LiF using LiN(SiMe) and SF plasma

Design and Testing of a Multivariate Optical Element: The First Demonstration of Multivariate Optical Computing for Predictive Spectroscopy

Atomic layer deposition of aluminum fluoride using Al(CH3)3 and SF6 plasma

Polydimethylsiloxane: Optical properties from 191 to 1688 nm (0.735–6.491 eV) of the liquid material by spectroscopic ellipsometry

Transparent polycrystalline Gd 2 Hf 2 O 7 ceramics

Mueller matrix ellipsometry study of uniaxial deuterated potassium dihydrogen phosphate (DKDP)

Structural, electrical, and optical properties of thermally evaporated nanocrystalline PbTe films

Thin film materials exposure to low Earth orbit aboard Space Shuttle

Microstructural characterization of SiOx surface contaminants on ashed aluminum thin films

Optical constants of (Al0.98Ga0.02)xOy native oxides

Low-Earth-orbit exposure of carbon-based materials aboard Shuttle flight STS-46

Low Earth orbit effects on indium tin oxide and polyester and comparison with laboratory simulations

Oxygen plasma asher contamination: An analysis of sources and remedies

Errata-Low Earth Orbit Simulation and Materials Characterization

Degradation of thin films: comparison between low Earth orbit experiments and laboratory simulations of the space environment

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