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Carbon nanotubes growth by chemical vapor deposition using thin film nickel catalyst

Materials science & engineering. B, Solid-state materials for advanced technology, 2004-09, Vol.112 (2), p.147-153

2004

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CMOS-Based Active Pixel for Low-Light-Level Detection: Analysis and Measurements

IEEE transactions on electron devices, 2007-12, Vol.54 (12), p.3229-3237

2007

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Micro-Raman stress characterization of polycrystalline silicon films grown at high temperature

Materials science & engineering. B, Solid-state materials for advanced technology, 2004-09, Vol.112 (2), p.160-164

2004

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Structural and surface properties of Si1-xGex thin films obtained by reduced pressure CVD

Applied surface science, 2007-10, Vol.254 (1), p.207-212

2007

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Thermal stability of Ni(Pt) silicide films formed on poly-Si

Microelectronic engineering, 2005-12, Vol.82 (3), p.485-491

2005

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Insulators obtained by electron cyclotron resonance plasmas on Si or GaAs

Materials characterization, 2003-03, Vol.50 (2), p.135-147

2003

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Training direct care staff working with persons with intellectual disabilities and challenging behaviour: A meta-analytic review study

Aggression and violent behavior, 2018-05, Vol.40, p.60-72

2018

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The outcome of institutional youth care compared to non-institutional youth care for children of primary school age and early adolescence: A multi-level meta-analysis

Children and youth services review, 2015-11, Vol.58, p.208-218

2015

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Grabado anisotrópico de silicio para aplicación en micromaquinado usando plasmas de SF6/CH4/O2/Ar y SF6/CF4/O2/Ar

Revista mexicana de física, 2004, Vol.50 (2), p.203-207

2004

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Alliance and Treatment Outcome in Family-Involved Treatment for Youth Problems: A Three-Level Meta-analysis

Clinical child and family psychology review, 2018-06, Vol.21 (2), p.146-170

2018

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The effectiveness of institutional youth care over the past three decades: A meta-analysis

Children and youth services review, 2012-09, Vol.34 (9), p.1818-1824

2012

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The impact of classroom climate on students' perception of social exclusion in secondary special education

Children and youth services review, 2019-08, Vol.103, p.127-134

2019

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Electrolyte-Insulator-Semiconductor Structure for Pb+ Detecting

Procedia engineering, 2014, Vol.87, p.188-191

2014

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Classroom Climate, Identification with School, and General Self-worth Predict Academic Self-Concept in Students Attending Residential Schools for Special Education

Residential treatment for children & youth, 2021-04, Vol.38 (2), p.137-152

2021

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Assessing Classroom Climate in Special Education: A Validation Study of the Special Education Classroom Climate Inventory

Journal of psychoeducational assessment, 2018-10, Vol.36 (7), p.736-749

2018

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Structural and surface properties of Si 1− x Ge x thin films obtained by reduced pressure CVD

Applied surface science, 2007-10, Vol.254 (1), p.207-212

2007

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X-ray multiple diffraction on the shallow junction of B in Si(0 0 1)

Journal of molecular catalysis. A, Chemical, 2005-03, Vol.228 (1), p.177-182

2005

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Controlled Deposition and Electrical Characterization of Multi-Wall Carbon Nanotubes

Journal of nano research, 2008-10, Vol.3, p.25-32

2008

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High quality of ultra-thin silicon oxynitride films formed by low-energy nitrogen implantation into silicon with additional plasma or thermal oxidation

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2000-05, Vol.166-167, p.64-69

2000

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Modification of the refractive index and the dielectric constant of silicon dioxide by means of ion implantation

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2000-05, Vol.166-167, p.171-176

2000

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Education on microfabrication in Latin America and the microelectronics workshop at UNICAMP

IEEE transactions on education, 1998-11, Vol.41 (4), p.253-256

Swart, J.W.

1998

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Inductively coupled plasma etchingof in-based compound semiconductorsin CH4/H2/Ar

Solid-state electronics, 1998-11, Vol.42 (11), p.1947-1951

1998

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Inductively coupled plasma etchingof in-based compound semiconductorsin CH 4/H 2/Ar

Solid-state electronics, 1998, Vol.42 (11), p.1947-1951

1998

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Initiatives for promotion of microelectronics and microfabrication at Sao Paulo State Universities-Brazil

Proceedings of the Fourteenth Biennial University/Government/Industry Microelectronics Symposium (Cat. No.01CH37197), 2001, p.16-19

2001

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Sample preparation method for scanning force microscopy

Brazilian journal of physics, 2001-12, Vol.31 (4), p.552-561

2001

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Carbon nanotubes growth by chemical vapor deposition using thin film nickel catalyst

CMOS-Based Active Pixel for Low-Light-Level Detection: Analysis and Measurements

Micro-Raman stress characterization of polycrystalline silicon films grown at high temperature

Structural and surface properties of Si1-xGex thin films obtained by reduced pressure CVD

Thermal stability of Ni(Pt) silicide films formed on poly-Si

Insulators obtained by electron cyclotron resonance plasmas on Si or GaAs

Training direct care staff working with persons with intellectual disabilities and challenging behaviour: A meta-analytic review study

The outcome of institutional youth care compared to non-institutional youth care for children of primary school age and early adolescence: A multi-level meta-analysis

Grabado anisotrópico de silicio para aplicación en micromaquinado usando plasmas de SF6/CH4/O2/Ar y SF6/CF4/O2/Ar

Alliance and Treatment Outcome in Family-Involved Treatment for Youth Problems: A Three-Level Meta-analysis

The effectiveness of institutional youth care over the past three decades: A meta-analysis

The impact of classroom climate on students' perception of social exclusion in secondary special education

Electrolyte-Insulator-Semiconductor Structure for Pb+ Detecting

Classroom Climate, Identification with School, and General Self-worth Predict Academic Self-Concept in Students Attending Residential Schools for Special Education

Assessing Classroom Climate in Special Education: A Validation Study of the Special Education Classroom Climate Inventory

Structural and surface properties of Si 1− x Ge x thin films obtained by reduced pressure CVD

X-ray multiple diffraction on the shallow junction of B in Si(0 0 1)

Controlled Deposition and Electrical Characterization of Multi-Wall Carbon Nanotubes

High quality of ultra-thin silicon oxynitride films formed by low-energy nitrogen implantation into silicon with additional plasma or thermal oxidation

Modification of the refractive index and the dielectric constant of silicon dioxide by means of ion implantation

Education on microfabrication in Latin America and the microelectronics workshop at UNICAMP

Inductively coupled plasma etchingof in-based compound semiconductorsin CH4/H2/Ar

Inductively coupled plasma etchingof in-based compound semiconductorsin CH 4/H 2/Ar

Initiatives for promotion of microelectronics and microfabrication at Sao Paulo State Universities-Brazil

Sample preparation method for scanning force microscopy

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