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Journal of applied electrochemistry, 2011-05, Vol.41 (5), p.561-576
2011
Link zum Volltext
2016 IEEE International Interconnect Technology Conference / Advanced Metallization Conference (IITC/AMC), 2016, p.105-107
2016
- Link zum Volltext
2014 Symposium on VLSI Technology (VLSI-Technology): Digest of Technical Papers, 2014, p.1-2
- Cheng, K.
- Seo, S.
- Faltermeier, J.
- Lu, D.
- Standaert, T.
- Ok, I.
- Khakifirooz, A.
- Vega, R.
- Levin, T.
- Li, J.
- Demarest, J.
- Surisetty, C.
- Song, D.
- Utomo, H.
- Chao, R.
- He, H.
- Madan, A.
- DeHaven, P.
- Klymko, N.
- Zhu, Z.
- Naczas, S.
- Yin, Y.
- Kuss, J.
- Jacob, A.
- Bae, D.
- Seo, K.
- Kleemeier, W.
- Sampson, R.
- Hook, T.
- Haran, B.
- Gifford, G.
- Gupta, D.
- Shang, H.
- Bu, H.
- Na, M.
- Oldiges, P.
- Wu, T.
- Doris, B.
- Rim, K.
- Nowak, E.
- Divakaruni, R.
- Khare, M.
2014
- Link zum Volltext
2014 Symposium on VLSI Technology (VLSI-Technology): Digest of Technical Papers, 2014, p.1-2
- Seo, K.-I
- Haran, B.
- Gupta, D.
- Guo, D.
- Standaert, T.
- Xie, R.
- Shang, H.
- Alptekin, E.
- Bae, D.-I
- Bae, G.
- Boye, C.
- Cai, H.
- Chanemougame, D.
- Chao, R.
- Cheng, K.
- Cho, J.
- Choi, K.
- Hamieh, B.
- Hong, J. G.
- Hook, T.
- Jang, L.
- Jung, J.
- Jung, R.
- Lee, D.
- Lherron, B.
- Kambhampati, R.
- Kim, B.
- Kim, H.
- Kim, K.
- Kim, T. S.
- Ko, S.-B
- Lie, F. L.
- Liu, D.
- Mallela, H.
- Mclellan, E.
- Mehta, S.
- Montanini, P.
- Mottura, M.
- Nam, J.
- Nam, S.
- Nelson, F.
- Ok, I.
- Park, C.
- Park, Y.
- Paul, A.
- Prindle, C.
- Ramachandran, R.
- Sankarapandian, M.
- Sardesai, V.
- Scholze, A.
- Seo, S.-C
- Shearer, J.
- Southwick, R.
- Sreenivasan, R.
- Stieg, S.
- Strane, J.
- Sun, X.
- Sung, M. G.
- Surisetty, C.
- Tsutsui, G.
- Tripathi, N.
- Vega, R.
- Waskiewicz, C.
- Weybright, M.
- Yeh, C.-C
- Bu, H.
- Burns, S.
- Canaperi, D.
- Celik, M.
- Colburn, M.
- Jagannathan, H.
- Kanakasabaphthy, S.
- Kleemeier, W.
- Liebmann, L.
- Mcherron, D.
- Oldiges, P.
- Paruchuri, V.
- Spooner, T.
- Stathis, J.
- Divakaruni, R.
- Gow, T.
- Iacoponi, J.
- Jenq, J.
- Sampson, R.
- Khare, M.
2014
- Link zum Volltext
2017 Symposium on VLSI Technology, 2017, p.T216-T217
2017
Link zum Volltext
2016 IEEE International Electron Devices Meeting (IEDM), 2016, p.2.7.1-2.7.4
- Xie, R.
- Montanini, P.
- Akarvardar, K.
- Tripathi, N.
- Haran, B.
- Johnson, S.
- Hook, T.
- Hamieh, B.
- Corliss, D.
- Wang, J.
- Miao, X.
- Sporre, J.
- Fronheiser, J.
- Loubet, N.
- Sung, M.
- Sieg, S.
- Mochizuki, S.
- Prindle, C.
- Seo, S.
- Greene, A.
- Shearer, J.
- Labonte, A.
- Fan, S.
- Liebmann, L.
- Chao, R.
- Arceo, A.
- Chung, K.
- Cheon, K.
- Adusumilli, P.
- Amanapu, H. P.
- Bi, Z.
- Cha, J.
- Chen, H.-C
- Conti, R.
- Galatage, R.
- Gluschenkov, O.
- Kamineni, V.
- Kim, K.
- Lee, C.
- Lie, F.
- Liu, Z.
- Mehta, S.
- Miller, E.
- Niimi, H.
- Niu, C.
- Park, C.
- Park, D.
- Raymond, M.
- Sahu, B.
- Sankarapandian, M.
- Siddiqui, S.
- Southwick, R.
- Sun, L.
- Surisetty, C.
- Tsai, S.
- Whang, S.
- Xu, P.
- Xu, Y.
- Yeh, C.
- Zeitzoff, P.
- Zhang, J.
- Li, J.
- Demarest, J.
- Arnold, J.
- Canaperi, D.
- Dunn, D.
- Felix, N.
- Gupta, D.
- Jagannathan, H.
- Kanakasabapathy, S.
- Kleemeier, W.
- Labelle, C.
- Mottura, M.
- Oldiges, P.
- Skordas, S.
- Standaert, T.
- Yamashita, T.
- Colburn, M.
- Na, M.
- Paruchuri, V.
- Lian, S.
- Divakaruni, R.
- Gow, T.
- Lee, S.
- Knorr, A.
- Bu, H.
- Khare, M.
2016
- Link zum Volltext
2016 IEEE International Electron Devices Meeting (IEDM), 2016, p.17.1.1-17.1.4
2016
- Link zum Volltext
Ocean & coastal management, 2023-09, Vol.243, p.106776, Article 106776
2023
Link zum Volltext
Journal of Earth System Science, 2021-12, Vol.130 (4), p.242, Article 242
2021
Link zum Volltext
Natural hazards (Dordrecht), 2023-05, Vol.117 (1), p.313-337
2023
Link zum Volltext
Chemical engineering science, 2010-08, Vol.65 (16), p.4535-4547
2010
Link zum Volltext
Chemical engineering science, 2010-10, Vol.65 (19), p.5402-5410
2010
Link zum Volltext
Dependable Computing - EDCC 5, 2005, p.415-434
2005
Link zum Volltext
2014 IEEE Symposium on Visual Languages and Human-Centric Computing (VL/HCC), 2014, p.197-198
2014
- Link zum Volltext
2023 IEEE International Conference on Data Mining Workshops (ICDMW), 2023, p.1149-1156
2023
- Link zum Volltext
2015 IEEE Symposium on Visual Languages and Human-Centric Computing (VL/HCC), 2015, p.261-269
2015
- Link zum Volltext
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