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Langmuir, 2008-07, Vol.24 (14), p.7532-7537
2008
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Inorganic chemistry, 2007-06, Vol.46 (12), p.4951-4959
2007
Link zum Volltext
IET networks, 2012-09, Vol.1 (3), p.181-188
2012
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Solid state communications, 2010-10, Vol.150 (37-38), p.1782-1784
2010
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2013 IEEE International Reliability Physics Symposium (IRPS), 2013, p.MY.2.1-MY.2.5
2013
- Link zum Volltext
IEEE sensors journal, 2004-12, Vol.4 (6), p.749-758
2004
- Link zum Volltext
Carbon (New York), 2002-09, Vol.40 (11), p.2013-2020
2002
Link zum Volltext
Physics of Semiconductors; Part B, 2005, Vol.772, p.1349-1350
2005
Link zum Volltext
IEEE transactions on circuits and systems. 2, Analog and digital signal processing, 1999-04, Vol.46 (4), p.370-375
1999
- Link zum Volltext
2014 Symposium on VLSI Technology (VLSI-Technology): Digest of Technical Papers, 2014, p.1-2
- Seo, K.-I
- Haran, B.
- Gupta, D.
- Guo, D.
- Standaert, T.
- Xie, R.
- Shang, H.
- Alptekin, E.
- Bae, D.-I
- Bae, G.
- Boye, C.
- Cai, H.
- Chanemougame, D.
- Chao, R.
- Cheng, K.
- Cho, J.
- Choi, K.
- Hamieh, B.
- Hong, J. G.
- Hook, T.
- Jang, L.
- Jung, J.
- Jung, R.
- Lee, D.
- Lherron, B.
- Kambhampati, R.
- Kim, B.
- Kim, H.
- Kim, K.
- Kim, T. S.
- Ko, S.-B
- Lie, F. L.
- Liu, D.
- Mallela, H.
- Mclellan, E.
- Mehta, S.
- Montanini, P.
- Mottura, M.
- Nam, J.
- Nam, S.
- Nelson, F.
- Ok, I.
- Park, C.
- Park, Y.
- Paul, A.
- Prindle, C.
- Ramachandran, R.
- Sankarapandian, M.
- Sardesai, V.
- Scholze, A.
- Seo, S.-C
- Shearer, J.
- Southwick, R.
- Sreenivasan, R.
- Stieg, S.
- Strane, J.
- Sun, X.
- Sung, M. G.
- Surisetty, C.
- Tsutsui, G.
- Tripathi, N.
- Vega, R.
- Waskiewicz, C.
- Weybright, M.
- Yeh, C.-C
- Bu, H.
- Burns, S.
- Canaperi, D.
- Celik, M.
- Colburn, M.
- Jagannathan, H.
- Kanakasabaphthy, S.
- Kleemeier, W.
- Liebmann, L.
- Mcherron, D.
- Oldiges, P.
- Paruchuri, V.
- Spooner, T.
- Stathis, J.
- Divakaruni, R.
- Gow, T.
- Iacoponi, J.
- Jenq, J.
- Sampson, R.
- Khare, M.
2014
- Link zum Volltext
2011 IEEE International Integrated Reliability Workshop Final Report, 2011, p.146-150
2011
- Link zum Volltext
Solid state communications, 2010-10, Vol.150 (37-38), p.1782-1784
2010
Link zum Volltext
Inorganic chemistry, 2007-06, Vol.46 (12), p.4951-4959
2007
Link zum Volltext
ChemInform, 2007-08, Vol.38 (35), p.no-no
2007
Link zum Volltext
Sensors and actuators. A. Physical., 2005-01, Vol.117 (1), p.41-49
2005
Link zum Volltext
Applied physics letters, 2003-04, Vol.82 (17), p.2770-2772
2003
Link zum Volltext
Carbon (New York), 2004, Vol.42 (12), p.2738-2741
2004
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The journal of microbiology, 2007-01, Vol.45 (2), p.113-121
2007
Link zum Volltext
Materia Japan, 2001/06/20, Vol.40(6), pp.568-572
2001
Link zum Volltext
2012 International Electron Devices Meeting, 2012, p.20.4.1-20.4.3
2012
- Link zum Volltext
2006 Symposium on VLSI Technology, 2006. Digest of Technical Papers, 2006, p.74-75
2006
- Link zum Volltext
ETRI journal, 2005-04, Vol.27 (2), p.188-194
2005
Link zum Volltext
2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual, 2007, p.610-611
2007
- Link zum Volltext
2005 IEEE International Symposium on Circuits and Systems (ISCAS), 2005, p.5573-5576 Vol. 6
2005
- Link zum Volltext
Japanese Journal of Applied Physics, 1999-12, Vol.38 (12S), p.7094
1999
Link zum Volltext
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