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Free-Radical Generation from Bulk Nanobubbles in Aqueous Electrolyte Solutions: ESR Spin-Trap Observation of Microbubble-Treated Water

Langmuir, 2021-04, Vol.37 (16), p.5005-5011

2021

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Continuous Creation and Productization of Outstanding Image Sensors

Seikei-Kakou, 2022/12/20, Vol.35(1), pp.21-22

Sugawa, Shigetoshi

2022

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Over 100 Million Frames per Second 368 Frames Global Shutter Burst CMOS Image Sensor with Pixel-wise Trench Capacitor Memory Array

Sensors (Basel, Switzerland), 2020-02, Vol.20 (4), p.1086

2020

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Selective composition modification deposition utilizing ion bombardment-induced interfacial mixing during plasma-enhanced atomic layer deposition

Japanese Journal of Applied Physics, 2019-11, Vol.58 (11), p.110902

2019

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Control of ion-flux and ion-energy in direct inductively coupled plasma reactor for interfacial-mixing plasma-enhanced atomic layer deposition

Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 2020-05, Vol.38 (3)

2020

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Accelerated germination of aged recalcitrant seeds by K + -rich bulk oxygen nanobubbles

Scientific reports, 2023-02, Vol.13 (1), p.3301-3301, Article 3301

2023

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Two High-Precision Proximity Capacitance CMOS Image Sensors with Large Format and High Resolution

Sensors (Basel, Switzerland), 2022-04, Vol.22 (7), p.2770

2022

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[Foreword] Welcome to the Special Section on Advanced Image Sensor Technology

ITE Transactions on Media Technology and Applications, 2016, Vol.4(2), pp.84-84

Sugawa, Shigetoshi

2016

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Stable yttrium oxyfluoride used in plasma process chamber

Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 2017-03, Vol.35 (2)

2017

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A Highly Robust Silicon Ultraviolet Selective Radiation Sensor Using Differential Spectral Response Method

Sensors (Basel, Switzerland), 2019-06, Vol.19 (12), p.2755

2019

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High capacitance density highly reliable textured deep trench SiN capacitors toward 3D integration

Japanese Journal of Applied Physics, 2021-05, Vol.60 (SB), p.SBBC06

2021

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A 70-dB SNR High-Speed Global Shutter CMOS Image Sensor for in Situ Fluid Concentration Distribution Measurements

IEEE transactions on electron devices, 2022-06, Vol.69 (6), p.2965-2972

2022

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Hole-Trapping Process at Al2O3/GaN Interface Formed by Atomic Layer Deposition

IEEE electron device letters, 2017-09, Vol.38 (9), p.1309-1312

2017

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[Paper] High-Resolution Defect Detection for Flat Panel Display Using Proximity Capacitance Image Sensor

ITE Transactions on Media Technology and Applications, 2023, Vol.11(4), pp.158-163

2023

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[Invited Paper] A High SNR Global Shutter CMOS Image Sensor Technology for High Precision Absorption Imaging Applications

ITE Transactions on Media Technology and Applications, 2024, Vol.12(2), pp.167-174

2024

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Performances of accumulation-mode n- and p-MOSFETs on Si(110) wafers

Japanese Journal of Applied Physics, 2017-04, Vol.56 (4S), p.4-04CD15

2017

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Experimental investigation of localized stress-induced leakage current distribution in gate dielectrics using array test circuit

Japanese Journal of Applied Physics, 2018-04, Vol.57 (4S), p.4

2018

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[Paper] Preserved Color Pixel: high-resolution and high-colorfidelity image acquisition using single image sensor with sub-half-micron pixels

ITE Transactions on Media Technology and Applications, 2020, Vol.8(3), pp.161-169

2020

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Impact of CoFeB surface roughness on reliability of MgO films in CoFeB/MgO/CoFeB magnetic tunnel junction

Japanese Journal of Applied Physics, 2019-08, Vol.58 (SI), p.SIIB29

2019

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A Statistical Evaluation of Random Telegraph Noise of In-Pixel Source Follower Equivalent Surface and Buried Channel Transistors

IEEE transactions on electron devices, 2013-10, Vol.60 (10), p.3555-3561

2013

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Impact of doping concentration on 1/f noise performances of accumulation-mode Si(100) n-MOSFETs

Japanese Journal of Applied Physics, 2016-04, Vol.55 (4S), p.4

2016

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Atomically Flat Silicon Surface and Silicon/Insulator Interface Formation Technologies for (100) Surface Orientation Large-Diameter Wafers Introducing High Performance and Low-Noise Metal-Insulator-Silicon FETs

IEEE transactions on electron devices, 2009-02, Vol.56 (2), p.291-298

2009

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[Papers] Impacts of Random Telegraph Noise with Various Time Constants and Number of States in Temporal Noise of CMOS Image Sensors

ITE Transactions on Media Technology and Applications, 2018, Vol.6(3), pp.171-179

2018

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High Quality SiO2/Al2O3 Gate Stack for GaN Metal--Oxide--Semiconductor Field-Effect Transistor

Jpn J Appl Phys, 2013-04, Vol.52 (4), p.04CF09-04CF09-6

2013

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Low-cost Xe sputtering of amorphous In-Ga-Zn-O thin-film transistors by rotation magnet sputtering incorporating a Xe recycle-and-supply system

Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 2014-03, Vol.32 (2)

2014

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Free-Radical Generation from Bulk Nanobubbles in Aqueous Electrolyte Solutions: ESR Spin-Trap Observation of Microbubble-Treated Water

Continuous Creation and Productization of Outstanding Image Sensors

Over 100 Million Frames per Second 368 Frames Global Shutter Burst CMOS Image Sensor with Pixel-wise Trench Capacitor Memory Array

Selective composition modification deposition utilizing ion bombardment-induced interfacial mixing during plasma-enhanced atomic layer deposition

Control of ion-flux and ion-energy in direct inductively coupled plasma reactor for interfacial-mixing plasma-enhanced atomic layer deposition

Accelerated germination of aged recalcitrant seeds by K + -rich bulk oxygen nanobubbles

Two High-Precision Proximity Capacitance CMOS Image Sensors with Large Format and High Resolution

[Foreword] Welcome to the Special Section on Advanced Image Sensor Technology

Stable yttrium oxyfluoride used in plasma process chamber

A Highly Robust Silicon Ultraviolet Selective Radiation Sensor Using Differential Spectral Response Method

High capacitance density highly reliable textured deep trench SiN capacitors toward 3D integration

A 70-dB SNR High-Speed Global Shutter CMOS Image Sensor for in Situ Fluid Concentration Distribution Measurements

Hole-Trapping Process at Al2O3/GaN Interface Formed by Atomic Layer Deposition

[Paper] High-Resolution Defect Detection for Flat Panel Display Using Proximity Capacitance Image Sensor

[Invited Paper] A High SNR Global Shutter CMOS Image Sensor Technology for High Precision Absorption Imaging Applications

Performances of accumulation-mode n- and p-MOSFETs on Si(110) wafers

Experimental investigation of localized stress-induced leakage current distribution in gate dielectrics using array test circuit

[Paper] Preserved Color Pixel: high-resolution and high-colorfidelity image acquisition using single image sensor with sub-half-micron pixels

Impact of CoFeB surface roughness on reliability of MgO films in CoFeB/MgO/CoFeB magnetic tunnel junction

A Statistical Evaluation of Random Telegraph Noise of In-Pixel Source Follower Equivalent Surface and Buried Channel Transistors

Impact of doping concentration on 1/f noise performances of accumulation-mode Si(100) n-MOSFETs

Atomically Flat Silicon Surface and Silicon/Insulator Interface Formation Technologies for (100) Surface Orientation Large-Diameter Wafers Introducing High Performance and Low-Noise Metal-Insulator-Silicon FETs

[Papers] Impacts of Random Telegraph Noise with Various Time Constants and Number of States in Temporal Noise of CMOS Image Sensors

High Quality SiO2/Al2O3 Gate Stack for GaN Metal--Oxide--Semiconductor Field-Effect Transistor

Low-cost Xe sputtering of amorphous In-Ga-Zn-O thin-film transistors by rotation magnet sputtering incorporating a Xe recycle-and-supply system

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