UB Paderborn / Katalog / Suche / in CDI

Quantitative comparison of high resolution TEM images with image simulations

Ultramicroscopy, 1994, Vol.53 (3), p.191-203

1994

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Investigation of interfacial segregation at antiphase boundaries in a ternary alloy 84.8Ni–12.8Al–2.4Ta

Materials science & engineering. A, Structural materials : properties, microstructure and processing, 2003-11, Vol.360 (1-2), p.356-364

2003

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Interfacial segregation and influence of antiphase boundaries on rafting in a γ/γ' alloy

Metallurgical and materials transactions. A, Physical metallurgy and materials science, 2004-03, Vol.35 (3), p.733-740

2004

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The structure of {111} age-hardening precipitates in Al-Cu-Mg-Ag alloys

Acta crystallographica. Section B, Structural science, 1988-06, Vol.44 (3), p.207-227

1988

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Weak beam under convergent beam illumination

Ultramicroscopy, 2000-06, Vol.83 (3), p.145-157

2000

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The morphology of ordered structures in III–V alloys: inferences from a TEM study

Journal of crystal growth, 1991-06, Vol.112 (2), p.373-385

1991

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A transmission electron microscopy study of the crystallinity and secondary phase formation in melt-processed YBa2Cu3O7−δ

Journal of materials research, 1996-12, Vol.11 (12), p.2990-2999

1996

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A transmission electron microscopy investigation of SiC films grown on Si(111) substrates by solid-source molecular beam epitaxy

Journal of materials research, 1998-12, Vol.13 (12), p.3571-3579

1998

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The HREM use of the FEGTEM for the study of interfaces

Ultramicroscopy, 1995-06, Vol.58 (3), p.275-287

1995

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Considerations in the use of yield asymmetries for the analysis of internal stresses in metal matrix composites

Materials science & engineering. A, Structural materials : properties, microstructure and processing, 1992-12, Vol.159 (1), p.51-63

1992

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Internal stress induced debonding in a zirconia-reinforced 6061 aluminium alloy composite

Materials science & engineering. A, Structural materials : properties, microstructure and processing, 1993-11, Vol.171 (1), p.1-11

1993

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Momentum dependent energy loss near edge structures using a CTEM: the reliability of the methods available

Ultramicroscopy, 1995-07, Vol.59 (1), p.93-107

1995

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Assessment of convergence effects in weak-beam transmission electron microscopy in partial spacing measurements in Ni3Al

Philosophical magazine letters, 1997-04, Vol.75 (4), p.179-186

1997

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Composition determination in the GaAs/(Al, Ga)As system using contrast in dark-field transmission electron microscope images

Philosophical magazine. A, Physics of condensed matter. Defects and mechanical properties, 1989-07, Vol.60 (1), p.39-62

1989

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Spatial coherence effects in the use of high resolution approaches for the characterisation of the compositional abruptness of an interface

Ultramicroscopy, 1993-12, Vol.52 (3), p.267-275

1993

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High superconducting transition temperatures in sputter-deposited YBaCuO thin films

Nature (London), 1987-04, Vol.326 (6116), p.857-859

1987

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The α-fringe contrast of thin twins in relation to the anomalous weak-beam contrast of stacking faults

Ultramicroscopy, 1995-06, Vol.58 (3), p.289-305

1995

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Electron-state lifetimes in submicron diameter resonant tunneling diodes

Applied physics letters, 1991-10, Vol.59 (16), p.1966-1968

1991

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Computer modelling for Fresnel contrast analysis

Philosophical magazine. A, Physics of condensed matter. Defects and mechanical properties, 1991-01, Vol.63 (1), p.37-70

1991

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III-V ternary semiconductor heterostructures : the choice of an appropriate compositional analysis technique

Journal of applied physics, 1991-02, Vol.69 (4), p.2149-2155

1991

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Boundary characterisation methods using the TEM

Ultramicroscopy, 1992-03, Vol.40 (3), p.300-312

Stobbs, W.M.

1992

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Thermal stability of biatomic Si sheets in Ge

Semiconductor science and technology, 1994-02, Vol.9 (2), p.150-157

1994

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High-resolution lattice imaging reveals a 'phase transition' in Cu/NiPd multilayers

Nature (London), 1986-08, Vol.322 (6082), p.814-816

1986

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Quantification of the spinodal wave in Cu2.5Mn0.5Al by dark-field image analysis

Philosophical magazine. A, Physics of condensed matter. Defects and mechanical properties, 1994-02, Vol.69 (2), p.349-377

1994

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Chemical and Structural Changes in Manganese-Doped Yttria-Stabilized Zirconia Studied by Electron Energy Loss Spectroscopy Combined with Electron Diffraction

Journal of the American Ceramic Society, 1999-02, Vol.82 (2), p.429-435

1999

Volltextzugriff (PDF)

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Quantitative comparison of high resolution TEM images with image simulations

Investigation of interfacial segregation at antiphase boundaries in a ternary alloy 84.8Ni–12.8Al–2.4Ta

Interfacial segregation and influence of antiphase boundaries on rafting in a γ/γ' alloy

The structure of {111} age-hardening precipitates in Al-Cu-Mg-Ag alloys

Weak beam under convergent beam illumination

The morphology of ordered structures in III–V alloys: inferences from a TEM study

A transmission electron microscopy study of the crystallinity and secondary phase formation in melt-processed YBa2Cu3O7−δ

A transmission electron microscopy investigation of SiC films grown on Si(111) substrates by solid-source molecular beam epitaxy

The HREM use of the FEGTEM for the study of interfaces

Considerations in the use of yield asymmetries for the analysis of internal stresses in metal matrix composites

Internal stress induced debonding in a zirconia-reinforced 6061 aluminium alloy composite

Momentum dependent energy loss near edge structures using a CTEM: the reliability of the methods available

Assessment of convergence effects in weak-beam transmission electron microscopy in partial spacing measurements in Ni3Al

Composition determination in the GaAs/(Al, Ga)As system using contrast in dark-field transmission electron microscope images

Spatial coherence effects in the use of high resolution approaches for the characterisation of the compositional abruptness of an interface

High superconducting transition temperatures in sputter-deposited YBaCuO thin films

The α-fringe contrast of thin twins in relation to the anomalous weak-beam contrast of stacking faults

Electron-state lifetimes in submicron diameter resonant tunneling diodes

Computer modelling for Fresnel contrast analysis

III-V ternary semiconductor heterostructures : the choice of an appropriate compositional analysis technique

Boundary characterisation methods using the TEM

Thermal stability of biatomic Si sheets in Ge

High-resolution lattice imaging reveals a 'phase transition' in Cu/NiPd multilayers

Quantification of the spinodal wave in Cu2.5Mn0.5Al by dark-field image analysis

Chemical and Structural Changes in Manganese-Doped Yttria-Stabilized Zirconia Studied by Electron Energy Loss Spectroscopy Combined with Electron Diffraction

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