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IEEE transactions on semiconductor manufacturing, 2006-02, Vol.19 (1), p.2-9
2006
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IEEE transactions on semiconductor manufacturing, 2009-02, Vol.22 (1), p.72-79
2009
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IEEE transactions on semiconductor manufacturing, 2003-05, Vol.16 (2), p.266-272
2003
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IEEE transactions on semiconductor manufacturing, 2005-05, Vol.18 (2), p.238-245
2005
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IEEE transactions on semiconductor manufacturing, 2002-05, Vol.15 (2), p.214-222
2002
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IEEE transactions on semiconductor manufacturing, 2005-05, Vol.18 (2), p.255-261
2005
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IEEE transactions on semiconductor manufacturing, 2003-05, Vol.16 (2), p.199-206
2003
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IEEE transactions on semiconductor manufacturing, 2004-05, Vol.17 (2), p.84-90
2004
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IEEE transactions on semiconductor manufacturing, 2004-05, Vol.17 (2), p.91-97
2004
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IET nanobiotechnology, 2007-10, Vol.1 (5), p.80-86
2007
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Microelectronic engineering, 2008-05, Vol.85 (5-6), p.1059-1061
2008
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IEEE transactions on semiconductor manufacturing, 2000-05, Vol.13 (2), p.173-180
2000
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IET nanobiotechnology, 2008-09, Vol.2 (3), p.72-79
2008
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2008 IEEE International Conference on Microelectronic Test Structures, 2008, p.123-127
2008
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2009 IEEE International Conference on Microelectronic Test Structures, 2009, p.162-167
2009
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2009 IEEE International Conference on Microelectronic Test Structures, 2009, p.50-55
2009
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2007 IEEE International Conference on Microelectronic Test Structures, 2007, p.3-8
2007
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Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 2006-04, Vol.559 (2), p.513-515
- Hilton, G.C.
- Beall, J.A.
- Doriese, W.B.
- Duncan, W.D.
- Ferreira, L.S.
- Irwin, K.D.
- Reintsema, C.D.
- Ullom, J.N.
- Vale, L.R.
- Xu, Y.
- Zink, B.L.
- Parkes, W.
- Bunting, A.S.
- Dunare, C.C.
- Gundlach, A.M.
- Stevenson, J.T.M.
- Walton, A.J.
- Schulte, E.
- Corrales, E.
- Sienicki, J.P.
- Bintley, Dan
- Ade, P.A.R.
- Sudiwala, Rashmi V.
- Woodcraft, Adam L.
- Halpern, Mark
- Holland, W.
- Audley, M.D.
- MacIntosh, M.
2006
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2009 Proceedings of the European Solid State Device Research Conference, 2009, p.371-374
2009
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2007 IEEE International Conference on Microelectronic Test Structures, 2007, p.218-221
2007
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2007 IEEE International Conference on Microelectronic Test Structures, 2007, p.171-176
2007
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2008 IEEE International Conference on Microelectronic Test Structures, 2008, p.29-34
2008
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2008 IEEE International Conference on Microelectronic Test Structures, 2008, p.228-232
2008
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2006 IEEE International Conference on Microelectronic Test Structures, 2006, p.119-123
2006
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2008 IEEE International Conference on Microelectronic Test Structures, 2008, p.35-39
2008
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