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Quantifying charge carrier concentration in ZnO thin films by Scanning Kelvin Probe Microscopy

Scientific reports, 2014-02, Vol.4 (1), p.4203, Article 4203

2014

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Improved transparency switching in paraffin-PDMS composites

Journal of materials chemistry. C, Materials for optical and electronic devices, 2015-01, Vol.3 (6), p.1371-1377

2015

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Quantifying electrostatic force contributions in electrically biased nanoscale interactions

Journal of applied physics, 2014-03, Vol.115 (12)

2014

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Probing anodic oxidation kinetics and nanoscale heterogeneity within TiO2 films by Conductive Atomic Force Microscopy and combined techniques

Electrochimica acta, 2014-05, Vol.129, p.203-210

2014

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Dynamic electrostatic force microscopy technique for the study of electrical properties with improved spatial resolution

Nanotechnology, 2013-06, Vol.24 (22), p.225703-225703

2013

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Model for Schottky barrier and surface states in nanostructured n -type semiconductors

Journal of applied physics, 2002-01, Vol.91 (2), p.808-814

2002

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Application of a substrate bias to control the droplet density on Cu(In,Ga)Se2 thin films grown by Pulsed Electron Deposition

Thin solid films, 2014-07, Vol.562, p.307-313

2014

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EFM data mapped into 2D images of tip-sample contact potential difference and capacitance second derivative

Scientific reports, 2013-11, Vol.3 (1), p.3352-3352, Article 3352

2013

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Nanoscale Investigation of Photoinduced Hydrophilicity Variations in Anatase and Rutile Nanopowders

Langmuir, 2013-11, Vol.29 (47), p.14512-14518

2013

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High-efficiency beam extraction and collimation using channeling in very short bent crystals

Physical review letters, 2001-08, Vol.87 (9), p.094802-094802, Article 094802

2001

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In situ determination of effective tip radius in dynamic atomic force microscopy

MRS proceedings, 2014, Vol.1652 (1), Article mrsf13-1652-ll05-16

2014

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Experimental study for the feasibility of a crystalline undulator

Physical review letters, 2003-01, Vol.90 (3), p.034801-034801, Article 034801

2003

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High resolution dynamic electrostatic force microscopy technique: quantifying electrical properties at the nanoscale

MRS proceedings, 2014, Vol.1652 (1), Article mrsf13-1652-ll05-15

2014

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Optical efficiency of solar concentrators by a reverse optical path method

Optics letters, 2008-09, Vol.33 (18), p.2044

2008

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Three-Dimensional Cu(InGa)Se Photovoltaic Cells Simulations: Optimization for Limited-Range Wavelength Applications

IEEE journal of photovoltaics, 2013-07, Vol.3 (3), p.1106-1112

2013

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Rondine® PV concentrators: Field results and developments

Progress in photovoltaics, 2009-11, Vol.17 (7), p.451-459

2009

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How to achieve high electrical conductivity in aligned carbon nanotube polymer composites

Carbon (New York), 2013-11, Vol.64, p.150-157

2013

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Contact grid optimization methodology for front contact concentration solar cells

Solar energy materials and solar cells, 2003-10, Vol.80 (2), p.155-166

2003

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Tailoring of silicon crystals for relativistic-particle channeling

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2005-05, Vol.234 (1-2), p.40-46

2005

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Characterization of multi-walled carbon nanotube-polymer nanocomposites by scanning spreading resistance microscopy

Nanotechnology, 2012-10, Vol.23 (40), p.405704-405704

2012

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Crystal undulator as a new compact source of radiation

Physical review special topics. PRST-AB. Accelerators and beams, 2004-02, Vol.7 (2), p.023501, Article 023501

2004

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Mechanical effects of chemical etchings on monocrystalline silicon for photovoltaic use

Solar energy materials and solar cells, 2001-11, Vol.69 (4), p.371-377

2001

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Energy dissipation distributions and dissipative atomic processes in amplitude modulation atomic force microscopy

Nanotechnology, 2012-03, Vol.23 (12), p.125401-1-12

2012

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Crystal deflector for highly efficient channeling extraction of a proton beam from accelerators

Review of scientific instruments, 2002-09, Vol.73 (9), p.3170-3173

2002

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Probing anodic oxidation kinetics and nanoscale heterogeneity within TiO sub(2) films by Conductive Atomic Force Microscopy and combined techniques

Electrochimica acta, 2014-05, Vol.129, p.203-210

2014

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Quantifying charge carrier concentration in ZnO thin films by Scanning Kelvin Probe Microscopy

Improved transparency switching in paraffin-PDMS composites

Quantifying electrostatic force contributions in electrically biased nanoscale interactions

Probing anodic oxidation kinetics and nanoscale heterogeneity within TiO2 films by Conductive Atomic Force Microscopy and combined techniques

Dynamic electrostatic force microscopy technique for the study of electrical properties with improved spatial resolution

Model for Schottky barrier and surface states in nanostructured n -type semiconductors

Application of a substrate bias to control the droplet density on Cu(In,Ga)Se2 thin films grown by Pulsed Electron Deposition

EFM data mapped into 2D images of tip-sample contact potential difference and capacitance second derivative

Nanoscale Investigation of Photoinduced Hydrophilicity Variations in Anatase and Rutile Nanopowders

High-efficiency beam extraction and collimation using channeling in very short bent crystals

In situ determination of effective tip radius in dynamic atomic force microscopy

Experimental study for the feasibility of a crystalline undulator

High resolution dynamic electrostatic force microscopy technique: quantifying electrical properties at the nanoscale

Optical efficiency of solar concentrators by a reverse optical path method

Three-Dimensional Cu(InGa)Se Photovoltaic Cells Simulations: Optimization for Limited-Range Wavelength Applications

Rondine® PV concentrators: Field results and developments

How to achieve high electrical conductivity in aligned carbon nanotube polymer composites

Contact grid optimization methodology for front contact concentration solar cells

Tailoring of silicon crystals for relativistic-particle channeling

Characterization of multi-walled carbon nanotube-polymer nanocomposites by scanning spreading resistance microscopy

Crystal undulator as a new compact source of radiation

Mechanical effects of chemical etchings on monocrystalline silicon for photovoltaic use

Energy dissipation distributions and dissipative atomic processes in amplitude modulation atomic force microscopy

Crystal deflector for highly efficient channeling extraction of a proton beam from accelerators

Probing anodic oxidation kinetics and nanoscale heterogeneity within TiO sub(2) films by Conductive Atomic Force Microscopy and combined techniques

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