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EP24.13: Giant right atrial aneurysm as a unique finding of malformation: a case report

Ultrasound in obstetrics & gynecology, 2023-10, Vol.62 (S1), p.253-254

2023

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Predictive factors for Day 7 positive patch test readings at a secondary referral centre

Skin health and disease, 2022-03, Vol.2 (1), p.e79-n/a

2022

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Eine multizystische Raumforderung der Fossa infratemporalis

Laryngo- rhino- otologie, 2016-04, Vol.95 (4), p.264-265

2016

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A Multicystic Tumor in the Infratemporal Fossa

Laryngo- rhino- otologie, 2016-04, Vol.95 (4), p.264

2016

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Fab-Independent Antiadhesion Effects of Secretory Immunoglobulin A on S-Fimbriated Escherichia coli Are Mediated by Sialyloligosaccharides

Infection and Immunity, 1998-08, Vol.66 (8), p.3971-3973

1998

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LSI yield modeling and process monitoring

IBM journal of research and development, 2000-01, Vol.44 (1.2), p.112-118

Stapper, C. H.

2000

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Eine seltene Raumforderung des Mittelohres – von der Parazentese zur Diagnose

Laryngo- rhino- otologie, 2018-09, Vol.97 (9), p.636-638

2018

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Integrated circuit yield management and yield analysis: development and implementation

IEEE transactions on semiconductor manufacturing, 1995-05, Vol.8 (2), p.95-102

1995

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Synergistic fault-tolerance for memory chips

IEEE transactions on computers, 1992-09, Vol.41 (9), p.1078-1087

1992

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On yield, fault distributions, and clustering of particles

IBM journal of research and development, 1986-05, Vol.30 (3), p.326-338

Stapper, C. H.

1986

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Modeling of Integrated Circuit Defect Sensitivities

IBM journal of research and development, 1983-11, Vol.27 (6), p.549-557

Stapper, C. H.

1983

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Modeling of defects in integrated circuit photolithographic patterns

IBM journal of research and development, 1984-07, Vol.28 (4), p.461-475

Stapper, C. H.

1984

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A 50-ns 16-Mb DRAM with a 10-ns data rate and on-chip ECC

IEEE journal of solid-state circuits, 1990-10, Vol.25 (5), p.1118-1128

1990

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Improved yield models for fault-tolerant memory chips

IEEE transactions on computers, 1993-07, Vol.42 (7), p.872-881

Stapper, C.H.

1993

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The effects of wafer to wafer defect density variations on integrated circuit defect and fault distributions

IBM journal of research and development, 1985-01, Vol.29 (1), p.87-97

Stapper, C. H.

1985

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Large-area fault clusters and fault tolerance in VLSI circuits: A review

IBM journal of research and development, 1989-03, Vol.33 (2), p.162-173

Stapper, C. H.

1989

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Simulation of spatial fault distributions for integrated circuit yield estimations

IEEE transactions on computer-aided design of integrated circuits and systems, 1989-12, Vol.8 (12), p.1314-1318

Stapper, C.H.

1989

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A new and efficient synthesis of (−)-indolizidine 167B by tandem metathesis

Tetrahedron letters, 2002-09, Vol.43 (38), p.6739-6741

2002

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Enantioselective Synthesis of (−)-Anaferine Dihydrochloride by a Ruthenium-Catalysed Tandem Ring Rearrangement Metathesis

European journal of organic chemistry, 2002-08, Vol.2002 (16), p.2855-2858

2002

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Correlation analysis of particle clusters on integrated circuit wafers

IBM journal of research and development, 1987-11, Vol.31 (6), p.641-650

Stapper, C. H.

1987

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A unified negative-binomial distribution for yield analysis of defect-tolerant circuits

IEEE transactions on computers, 1993-06, Vol.42 (6), p.724-734

1993

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Small-area fault clusters and fault tolerance in VLSI circuits

IBM journal of research and development, 1989-03, Vol.33 (2), p.174-177

Stapper, C. H.

1989

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Statistics associated with spatial fault simulation used for evaluating integrated circuit yield enhancement

IEEE transactions on computer-aided design of integrated circuits and systems, 1991-03, Vol.10 (3), p.399-406

Stapper, C.H.

1991

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High-reliability fault-tolerant 16-MBit memory chip

IEEE transactions on reliability, 1993-12, Vol.42 (4), p.596-603

1993

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Fault-simulation programs for integrated-circuit yield estimations

IBM journal of research and development, 1989-11, Vol.33 (6), p.647-652

Stapper, Charles H.

1989

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EP24.13: Giant right atrial aneurysm as a unique finding of malformation: a case report

Predictive factors for Day 7 positive patch test readings at a secondary referral centre

Eine multizystische Raumforderung der Fossa infratemporalis

A Multicystic Tumor in the Infratemporal Fossa

Fab-Independent Antiadhesion Effects of Secretory Immunoglobulin A on S-Fimbriated Escherichia coli Are Mediated by Sialyloligosaccharides

LSI yield modeling and process monitoring

Eine seltene Raumforderung des Mittelohres – von der Parazentese zur Diagnose

Integrated circuit yield management and yield analysis: development and implementation

Synergistic fault-tolerance for memory chips

On yield, fault distributions, and clustering of particles

Modeling of Integrated Circuit Defect Sensitivities

Modeling of defects in integrated circuit photolithographic patterns

A 50-ns 16-Mb DRAM with a 10-ns data rate and on-chip ECC

Improved yield models for fault-tolerant memory chips

The effects of wafer to wafer defect density variations on integrated circuit defect and fault distributions

Large-area fault clusters and fault tolerance in VLSI circuits: A review

Simulation of spatial fault distributions for integrated circuit yield estimations

A new and efficient synthesis of (−)-indolizidine 167B by tandem metathesis

Enantioselective Synthesis of (−)-Anaferine Dihydrochloride by a Ruthenium-Catalysed Tandem Ring Rearrangement Metathesis

Correlation analysis of particle clusters on integrated circuit wafers

A unified negative-binomial distribution for yield analysis of defect-tolerant circuits

Small-area fault clusters and fault tolerance in VLSI circuits

Statistics associated with spatial fault simulation used for evaluating integrated circuit yield enhancement

High-reliability fault-tolerant 16-MBit memory chip

Fault-simulation programs for integrated-circuit yield estimations

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