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On the systematics of the fungus gnat subfamily Mycetophilinae (Diptera): a combined morphological and molecular approach

Journal of zoological systematics and evolutionary research, 2009-08, Vol.47 (3), p.227-233

2009

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Vocal cord dysfunction: An uncommon cause of stridor

The Journal of emergency medicine, 2005, Vol.28 (1), p.31-33

2005

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On-chip p-MOSFET dosimetry (CMOS ICs)

IEEE transactions on nuclear science, 1993-12, Vol.40 (6), p.1442-1449

1993

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IEEE_Xplore

Total dose testing of a CMOS charged particle spectrometer

IEEE transactions on nuclear science, 1997-12, Vol.44 (6), p.1957-1964

1997

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IEEE_Xplore

Introduction of invertebrates into the High Arctic via imported soils: the case of Barentsburg in the Svalbard

Biological invasions, 2013, Vol.15 (1), p.1-5

2013

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The invertebrate fauna of anthropogenic soils in the High-Arctic settlement of Barentsburg, Svalbard

Polar research, 2013-01, Vol.32 (1), p.19273-12

2013

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CMOS charged particle spectrometers

IEEE transactions on nuclear science, 1996-06, Vol.43 (3), p.1516-1520

1996

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IEEE_Xplore

CRRES microelectronic test chip orbital data. II

IEEE transactions on nuclear science, 1992-12, Vol.39 (6), p.1840-1845

1992

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IEEE_Xplore

Improvement of a wine Saccharomyces cerevisiae strain by a breeding program

Applied and Environmental Microbiology, 1985-10, Vol.50 (4), p.1064-1067

1985

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Psychometric Analysis of the Organizational Cynicism Scale in workers from Arequipa City, Peru

Cuadernos de administración (Cali, Colombia), 2023-05, Vol.39 (76)

2023

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Bench-level characterization of a CMOS standard-cell D-latch using alpha-particle sensitive test circuits

IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), 1991-12, Vol.38 (6), p.1486-1492

1991

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IEEE_Xplore

Clementine RRELAX SRAM particle spectrometer

IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), 1994-12, Vol.41 (6), p.2404-2411

1994

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IEEE_Xplore

Proton-sensitive custom SRAM detector

IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), 1992-10, Vol.39 (5), p.1374-1378

1992

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IEEE_Xplore

Single event induced transients in I/O devices: a characterization

IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (USA), 1990-12, Vol.37 (6), p.1974-1980

1990

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IEEE_Xplore

Proton irradiation effects on strained Si1-xGex/Si heterostructures

Applied physics letters, 1993-12, Vol.63 (25), p.3497-3499

1993

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Clementine dosimetry

Journal of spacecraft and rockets, 1995-11, Vol.32 (6), p.1065-1070

1995

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Linear-mode single-photon-sensitive avalanche photodiodes for GHz-rate near-infrared quantum communications

MILCOM 2008 - 2008 IEEE Military Communications Conference, 2008, p.1-6

2008

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IEEE_Xplore

Procedure for mutagenizing spores of Saccharomyces cerevisiae

Journal of Bacteriology, 1983-11, Vol.156 (2), p.907-908

1983

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Active pixel sensors for mass spectrometry

International journal of mass spectrometry, 2002-04, Vol.215 (1), p.101-111

2002

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Experimental Evidence for a New Single-Event Upset (SEU) Mode in a CMOS SRAM Obtained from Model Verification

IEEE transactions on nuclear science, 1987-12, Vol.34 (6), p.1292-1299

1987

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IEEE_Xplore

PC based graphic display real-time particle beam uniformity

IEEE (Institute of Electrical and Electronics Engineers) Transactions on Nuclear Science; (USA), 1989-10, Vol.36 (5), p.1738-1740

1989

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IEEE_Xplore

Update on parts SEE suspectibility from heavy ions

IEEE transactions on nuclear science, 1991-12, Vol.38 (6), p.1529-1539

1991

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IEEE_Xplore

Update on parts SEE susceptibility from heavy ions

IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), 1991-12, Vol.38 (6), p.1529-1539

1991

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A method of "staining" bacterial cells for the scanning electron microscope

Microscopica acta, 1972-07, Vol.72 (2), p.150

Soli, G

1972

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Single-Event Upset (SEU) Model Verification and Threshold Determination Using Heavy Ions in a Bipolar Static RAM

IEEE transactions on nuclear science, 1985-12, Vol.32 (6), p.4164-4169

1985

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IEEE_Xplore

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On the systematics of the fungus gnat subfamily Mycetophilinae (Diptera): a combined morphological and molecular approach

Vocal cord dysfunction: An uncommon cause of stridor

On-chip p-MOSFET dosimetry (CMOS ICs)

Total dose testing of a CMOS charged particle spectrometer

Introduction of invertebrates into the High Arctic via imported soils: the case of Barentsburg in the Svalbard

The invertebrate fauna of anthropogenic soils in the High-Arctic settlement of Barentsburg, Svalbard

CMOS charged particle spectrometers

CRRES microelectronic test chip orbital data. II

Improvement of a wine Saccharomyces cerevisiae strain by a breeding program

Psychometric Analysis of the Organizational Cynicism Scale in workers from Arequipa City, Peru

Bench-level characterization of a CMOS standard-cell D-latch using alpha-particle sensitive test circuits

Clementine RRELAX SRAM particle spectrometer

Proton-sensitive custom SRAM detector

Single event induced transients in I/O devices: a characterization

Proton irradiation effects on strained Si1-xGex/Si heterostructures

Clementine dosimetry

Linear-mode single-photon-sensitive avalanche photodiodes for GHz-rate near-infrared quantum communications

Procedure for mutagenizing spores of Saccharomyces cerevisiae

Active pixel sensors for mass spectrometry

Experimental Evidence for a New Single-Event Upset (SEU) Mode in a CMOS SRAM Obtained from Model Verification

PC based graphic display real-time particle beam uniformity

Update on parts SEE suspectibility from heavy ions

Update on parts SEE susceptibility from heavy ions

A method of "staining" bacterial cells for the scanning electron microscope

Single-Event Upset (SEU) Model Verification and Threshold Determination Using Heavy Ions in a Bipolar Static RAM

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