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Proceedings of the 23rd Conference on Design, Automation and Test in Europe, 2020, p.999-1002
2020
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2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), 2020, p.999-1002
2020
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2021 Design, Automation & Test in Europe Conference & Exhibition (DATE), 2021, p.212-217
2021
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Proceedings of the conference on Design, Automation & Test in Europe, 2014, p.1-6
2014
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2014 Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014, p.1-6
2014
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2016 53nd ACM/EDAC/IEEE Design Automation Conference (DAC), 2016, p.1-6
2016
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2011 48th ACM/EDAC/IEEE Design Automation Conference (DAC), 2011, p.860-865
2011
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Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, 2015, p.321-324
2015
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2015 Design, Automation & Test in Europe Conference & Exhibition (DATE), 2015, p.321-324
2015
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Hardware and Software: Verification and Testing, p.166-181
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Unveiling difficult bugs in address translation caching arrays for effective post-silicon validation
2016
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Post-Silicon Validation and Debug, 2018, p.343-363
2018
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IEEE design and test, 2017-02, Vol.34 (1), p.65-76
2017
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