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Verifying the band gap narrowing in tensile strained Ge nanowires by electrical means

Nanotechnology, 2021-04, Vol.32 (14), p.145711-145711

2021

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Bias-tunable temperature coefficient of resistance in Ge transistors

Applied physics letters, 2024-02, Vol.124 (9)

2024

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Electrical characterization and examination of temperature-induced degradation of metastable Ge0.81Sn0.19 nanowires

Nanoscale, 2018-11, Vol.10 (41), p.19443-19449

2018

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Calibrated nanoscale capacitance measurements using a scanning microwave microscope

Review of scientific instruments, 2010-11, Vol.81 (11), p.113701-113701-9

2010

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Germanium nanowire microbolometer

Nanotechnology, 2022-06, Vol.33 (24), p.245201

2022

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Calibrated nanoscale dopant profiling using a scanning microwave microscope

Journal of applied physics, 2012-01, Vol.111 (1), p.014301-014301-9

2012

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Electrical characterization and examination of temperature-induced degradation of metastable Ge 0.81 Sn 0.19 nanowires

Nanoscale, 2018-10, Vol.10 (41), p.19443-19449

2018

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Effective reduction of trap density at the Y2O3/Ge interface by rigorous high-temperature oxygen annealing

Journal of applied physics, 2014-12, Vol.116 (21), p.214111

2014

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Integrating an Ultramicroelectrode in an AFM Cantilever: Combined Technology for Enhanced Information

Analytical chemistry (Washington), 2001-06, Vol.73 (11), p.2491-2500

2001

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Metal-oxide-semiconductor capacitors and Schottky diodes studied with scanning microwave microscopy at 18 GHz

Journal of applied physics, 2014-11, Vol.116 (18)

2014

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Frequency-selective contrast on variably doped p-type silicon with a scanning microwave microscope

Journal of applied physics, 2012-05, Vol.111 (9), p.093727-093727-6

2012

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Rashba effect in type-II resonant tunneling diodes enhanced by in-plane magnetic fields

Physical review. B, Condensed matter and materials physics, 2012-02, Vol.85 (8), Article 085303

2012

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Stability of La2O3 and GeO2 passivated Ge surfaces during ALD of ZrO2 high-k dielectric

Applied surface science, 2012-02, Vol.258 (8), p.3444-3449

2012

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An intercepted feedback mode for light sensitive spectroscopic measurements in atomic force microscopy

Review of scientific instruments, 2007-10, Vol.78 (10), p.106104-106104

2007

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A quantitative analysis of photocurrent signals measured on GaAs using conductive atomic force microscopy

Journal of applied physics, 2011-02, Vol.109 (3), p.034308-034308-4

2011

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FIB processing of silicon in the nanoscale regime

Applied physics. A, Materials science & processing, 2003-03, Vol.76 (4), p.545-548

2003

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Process temperature dependent high frequency capacitance-voltage response of ZrO2/GeO2/germanium capacitors

Applied physics letters, 2010-02, Vol.96 (5)

2010

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Evaluation of Schottky and MgO-based tunnelling diodes with different ferromagnets for spin injection in n-Si

Journal of physics. D, Applied physics, 2009-07, Vol.42 (14), p.145114-145114 (9)

2009

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Variable wavelength photocurrent mapping on PbS quantum dot: fullerene thin films by conductive atomic force microscopy

Semiconductor science and technology, 2011-09, Vol.26 (9), p.095002-6

2011

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Physik der Halbleiterbauelemente

1st edition, 2021

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High resolution photocurrent imaging by atomic force microscopy on the example of single buried InAs quantum dots

Semiconductor science and technology, 2010-06, Vol.25 (6), p.065010-065010

2010

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Quantitative scanning capacitance microscopy on single subsurface InAs quantum dots

Applied physics letters, 2008-03, Vol.92 (9), p.092112-092112-3

2008

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Cross-sectional ballistic electron emission microscopy for Schottky barrier height profiling on heterostructures

Applied physics letters, 2005-05, Vol.86 (20), p.202112-202112-3

2005

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Electron-beam deposited SiO2 investigated by scanning capacitance microscopy

Applied physics letters, 2006-03, Vol.88 (12)

2006

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Quantitative scanning capacitance spectroscopy

Applied physics letters, 2003-11, Vol.83 (20), p.4253-4255

2003

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Verifying the band gap narrowing in tensile strained Ge nanowires by electrical means

Bias-tunable temperature coefficient of resistance in Ge transistors

Electrical characterization and examination of temperature-induced degradation of metastable Ge0.81Sn0.19 nanowires

Calibrated nanoscale capacitance measurements using a scanning microwave microscope

Germanium nanowire microbolometer

Calibrated nanoscale dopant profiling using a scanning microwave microscope

Electrical characterization and examination of temperature-induced degradation of metastable Ge 0.81 Sn 0.19 nanowires

Effective reduction of trap density at the Y2O3/Ge interface by rigorous high-temperature oxygen annealing

Integrating an Ultramicroelectrode in an AFM Cantilever: Combined Technology for Enhanced Information

Metal-oxide-semiconductor capacitors and Schottky diodes studied with scanning microwave microscopy at 18 GHz

Frequency-selective contrast on variably doped p-type silicon with a scanning microwave microscope

Rashba effect in type-II resonant tunneling diodes enhanced by in-plane magnetic fields

Stability of La2O3 and GeO2 passivated Ge surfaces during ALD of ZrO2 high-k dielectric

An intercepted feedback mode for light sensitive spectroscopic measurements in atomic force microscopy

A quantitative analysis of photocurrent signals measured on GaAs using conductive atomic force microscopy

FIB processing of silicon in the nanoscale regime

Process temperature dependent high frequency capacitance-voltage response of ZrO2/GeO2/germanium capacitors

Evaluation of Schottky and MgO-based tunnelling diodes with different ferromagnets for spin injection in n-Si

Variable wavelength photocurrent mapping on PbS quantum dot: fullerene thin films by conductive atomic force microscopy

Physik der Halbleiterbauelemente

High resolution photocurrent imaging by atomic force microscopy on the example of single buried InAs quantum dots

Quantitative scanning capacitance microscopy on single subsurface InAs quantum dots

Cross-sectional ballistic electron emission microscopy for Schottky barrier height profiling on heterostructures

Electron-beam deposited SiO2 investigated by scanning capacitance microscopy

Quantitative scanning capacitance spectroscopy

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