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Measurement. Sensors, 2024-04, Vol.32, p.101063, Article 101063
2024
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Micro and nanostructures (2022), 2024-04, Vol.188, p.207772, Article 207772
2024
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Journal of electronic testing, 2022-02, Vol.38 (1), p.9-20
2022
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An Efficient Wavelet Based Transient Current Test towards Detection of Data Retention Faults in SRAM
2019
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Integration (Amsterdam), 2021-11, Vol.81, p.221-233
2021
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2022 6th International Conference on Devices, Circuits and Systems (ICDCS), 2022, p.342-347
2022
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2022 6th International Conference on Devices, Circuits and Systems (ICDCS), 2022, p.369-374
2022
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Materials today : proceedings, 2019, Vol.11, p.991-1000
2019
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2021 2nd International Conference on Advances in Computing, Communication, Embedded and Secure Systems (ACCESS), 2021, p.308-312
2021
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2019 32nd International Conference on VLSI Design and 2019 18th International Conference on Embedded Systems (VLSID), 2019, p.448-453
2019
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2022 7th International Conference on Communication and Electronics Systems (ICCES), 2022, p.756-760
2022
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2020 5th International Conference on Devices, Circuits and Systems (ICDCS), 2020, p.275-278
2020
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2021 3rd International Conference on Signal Processing and Communication (ICPSC), 2021, p.139-143
2021
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2023 International Conference on Sustainable Computing and Smart Systems (ICSCSS), 2023, p.1466-1470
2023
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2018 International Conference on Circuits and Systems in Digital Enterprise Technology (ICCSDET), 2018, p.1-5
2018
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2020 5th International Conference on Devices, Circuits and Systems (ICDCS), 2020, p.109-112
2020
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2007 International Conference on Industrial and Information Systems, 2007, p.67-72
2007
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