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Transmission electron microscopy investigation of the crystal-amorphous-polycrystal transition in silicon during bismuth room temperature ion implantation

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 1997-11, Vol.132 (3), p.418-424

1997

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NEWLY DIAGNOSED CYSTIC FIBROSIS IN A PREGNANT WOMAN

Tuberkulëz i bolezni lëgkikh, 2019-05, Vol.97 (4), p.47-51

2019

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High-dose phenomena in zinc-implanted silicon crystals

Journal of applied physics, 1996-04, Vol.79 (7), p.3470-3476

1996

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Amorphization and crystallization in high-dose Zn+-implanted silicon

Journal of applied physics, 1997-02, Vol.81 (3), p.1143-1149

1997

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Effects of high dose Bi+ implantation on Si : An atomic force and transmission electron microscopy study

Vacuum, 1998-10, Vol.51 (2), p.285-288

1998

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Morphology of hollow crystals of II–VI compounds

Journal of materials science, 1976-12, Vol.11 (12), p.2319-2332

Simov, S.

1976

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Cubic forms in the surface morphology of CdS evaporated films

Thin solid films, 1973, Vol.15 (1), p.79-86

Simov, S.

1973

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Reverse Engineering of Integrated Circuits using Cross-Sectional Transmission Electron Microscopy-A Morphological and Structural Study

Technical review - IETE, 1998-01, Vol.15 (1-2), p.37-44

1998

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Ion-beam-induced crystallization and amorphization in Zn + -implanted silicon

Journal of physical studies, 1998, Vol.2 (2), p.205-212

1998

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Electron microscope study of surface topography by geometrical determination of metric characteristics of surface elements

Journal of microscopy (Oxford), 1985-01, Vol.137 (1), p.47-55

1985

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A geometric method incorporated with a computer program for indexing crystal faces of microcrystallites

Journal of applied crystallography, 1983-10, Vol.16 (5), p.559-562

1983

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Dependence of glow discharge Si:H:Cl film morphology on diluent gas and SiCl4 partial pressure

Applied Physics A Solids and Surfaces, 1988-11, Vol.47 (3), p.301-307

1988

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Growth and morphology of cadmium oxide whiskers

Journal of materials science, 1983-02, Vol.18 (2), p.623-633

1983

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Structural study of glow discharge a-Si:H films

Applied Physics A Solids and Surfaces, 1986-04, Vol.39 (4), p.297-299

1986

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Thermal regrowth of silicon after high-dose Ar + implantation

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 1986-11, Vol.17 (4), p.331-333

1986

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Three-dimensional reconstruction of electron microscope objects characterized by linear elements, applied to CdO bent whiskers

Journal of materials science letters, 1987-02, Vol.6 (2), p.235-237

1987

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Structural peculiarities in high-dose Ar + implanted silicon

Vacuum, 1985-12, Vol.35 (12), p.527-529

1985

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Thermally stimulated contact potential difference as a possibility to determine the energy position of semiconductor surface levels

Surface science, 1979-08, Vol.87 (1), p.152-160

1979

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Influence of stimulated recrystallization on the crystal and electronic surface structure of thin CdS films

Thin solid films, 1979-01, Vol.57 (1), p.L5-L7

1979

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Growth of cadmium oxide whiskers on cadmium sulphide single crystals with copper as growth activator

Journal of materials science letters, 1985-02, Vol.4 (2), p.181-183

1985

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Study of the morphology of CdTe whiskers by scanning electron microscope

Journal of crystal growth, 1976, Vol.32 (1), p.133-136

1976

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Surface photovoltage spectroscopy study of CdS thin films

Surface science, 1976-01, Vol.59 (1), p.115-127

1976

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Whisker junctions between growth structures on CdS layers

Journal of materials science, 1973-09, Vol.8 (9), p.1215-1217

1973

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Ion-Beam-Assisted Nanocrystal Formation in Silicon Implanted with High Doses of Pb + and Bi + Ions

Japanese Journal of Applied Physics, 2001-10, Vol.40 (10R), p.5841

2001

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Observations on whiskers and skeletal crystals in PbSe layers by scanning electron microscopy

Journal of materials science, 1975-11, Vol.10 (11), p.1943-1946

1975

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Transmission electron microscopy investigation of the crystal-amorphous-polycrystal transition in silicon during bismuth room temperature ion implantation

NEWLY DIAGNOSED CYSTIC FIBROSIS IN A PREGNANT WOMAN

High-dose phenomena in zinc-implanted silicon crystals

Amorphization and crystallization in high-dose Zn+-implanted silicon

Effects of high dose Bi+ implantation on Si : An atomic force and transmission electron microscopy study

Morphology of hollow crystals of II–VI compounds

Cubic forms in the surface morphology of CdS evaporated films

Reverse Engineering of Integrated Circuits using Cross-Sectional Transmission Electron Microscopy-A Morphological and Structural Study

Ion-beam-induced crystallization and amorphization in Zn + -implanted silicon

Electron microscope study of surface topography by geometrical determination of metric characteristics of surface elements

A geometric method incorporated with a computer program for indexing crystal faces of microcrystallites

Dependence of glow discharge Si:H:Cl film morphology on diluent gas and SiCl4 partial pressure

Growth and morphology of cadmium oxide whiskers

Structural study of glow discharge a-Si:H films

Thermal regrowth of silicon after high-dose Ar + implantation

Three-dimensional reconstruction of electron microscope objects characterized by linear elements, applied to CdO bent whiskers

Structural peculiarities in high-dose Ar + implanted silicon

Thermally stimulated contact potential difference as a possibility to determine the energy position of semiconductor surface levels

Influence of stimulated recrystallization on the crystal and electronic surface structure of thin CdS films

Growth of cadmium oxide whiskers on cadmium sulphide single crystals with copper as growth activator

Study of the morphology of CdTe whiskers by scanning electron microscope

Surface photovoltage spectroscopy study of CdS thin films

Whisker junctions between growth structures on CdS layers

Ion-Beam-Assisted Nanocrystal Formation in Silicon Implanted with High Doses of Pb + and Bi + Ions

Observations on whiskers and skeletal crystals in PbSe layers by scanning electron microscopy

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