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Overview of oxidative stress findings in hepatic encephalopathy: From cellular and ammonium-based animal models to human data

Analytical biochemistry, 2022-10, Vol.654, p.114795-114795, Article 114795

2022

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P36 Brain Regional Differences in the Developing Brain Using an Animal Model of Type C Hepatic Encephalopathy

The American journal of gastroenterology, 2023-09, Vol.118 (9S), p.S24-S25

2023

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P17 The Beneficial Effect of Oral Cr Supplementation in an Early Childhood Rat Model of Chronic Hepatic Encephalopathy: In Vivo Longitudinal 1H and 31P Magnetic Resonance Spectroscopy Study

The American journal of gastroenterology, 2023-09, Vol.118 (9S), p.S12-S13

2023

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Central nervous system and systemic oxidative stress interplay with inflammation in a bile duct ligation rat model of type C hepatic encephalopathy

Free radical biology & medicine, 2022-01, Vol.178, p.295-307

2022

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Corrigendum to “Central nervous system and systemic oxidative stress interplay with inflammation in a bile duct ligation rat model of type C hepatic encephalopathy” [Free Radical Biol. Med. 178 (2022) 295–307 ISSN 0891–5849]

Free radical biology & medicine, 2022-03, Vol.182, p.289-289

2022

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Behavior of a Railgun Launch Package at the Muzzle and During Sabot Discard

IEEE transactions on plasma science, 2019-05, Vol.47 (5), p.2545-2549

2019

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Developing a Launch Package for the PEGASUS Launcher

IEEE transactions on plasma science, 2017-07, Vol.45 (7), p.1234-1238

2017

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Increasing Launch Efficiency With the PEGASUS Launcher

IEEE transactions on plasma science, 2017-07, Vol.45 (7), p.1607-1613

2017

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Experiments to Increase the Used Energy With the PEGASUS Railgun

IEEE transactions on plasma science, 2014-10, Vol.42 (10), p.3180-3185

2014

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Acceleration of Aluminum Booster Projectiles With PEGASUS

IEEE transactions on plasma science, 2015-05, Vol.43 (5), p.1147-1151

2015

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Further Experiments With an UHF Radio Link to a Railgun Projectile

IEEE transactions on plasma science, 2015-05, Vol.43 (5), p.1152-1155

2015

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Investigations on the frictional behavior of electromagnetic Railgun armatures

2015 IEEE Pulsed Power Conference (PPC), 2015, p.1-5

2015

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Acceleration of aluminum booster projectiles with PEGASUS

2014 17th International Symposium on Electromagnetic Launch Technology, 2014, p.1-5

2014

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Further experiments with an UHF radio link to a railgun projectile

2014 17th International Symposium on Electromagnetic Launch Technology, 2014, p.1-4

2014

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Experiments to increase the used energy with the PEGASUS railgun

2013 19th IEEE Pulsed Power Conference (PPC), 2013, p.1-6

2013

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Comphy — A compact-physics framework for unified modeling of BTI

Microelectronics and reliability, 2018-06, Vol.85, p.49-65

2018

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A brief overview of gate oxide defect properties and their relation to MOSFET instabilities and device and circuit time-dependent variability

Microelectronics and reliability, 2018-02, Vol.81, p.186-194

2018

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The defect-centric perspective of device and circuit reliability—From gate oxide defects to circuits

Solid-state electronics, 2016-11, Vol.125, p.52-62

2016

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Advanced MOSFET variability and reliability characterization array

2015 IEEE International Integrated Reliability Workshop (IIRW), 2015, p.73-76

2015

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Statistical assessment of the full VG/VD degradation space using dedicated device arrays

2017 IEEE International Reliability Physics Symposium (IRPS), 2017, p.2D-5.1-2D-5.6

2017

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Si/SiGe superlattice I/O finFETs in a vertically-stacked Gate-All-Around horizontal Nanowire Technology

2018 IEEE Symposium on VLSI Technology, 2018, p.85-86

2018

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Defect-based compact modeling for RTN and BTI variability

2017 IEEE International Reliability Physics Symposium (IRPS), 2017, p.CR-7.1-CR-7.6

2017

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CDM-Time Domain Turn-on Transient of ESD Diodes in Bulk FinFET and GAA NW Technologies

2019 IEEE International Reliability Physics Symposium (IRPS), 2019, p.1-7

2019

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Self-heating-aware CMOS reliability characterization using degradation maps

2018 IEEE International Reliability Physics Symposium (IRPS), 2018, p.2A.3-1-2A.3-6

2018

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Characterization and simulation methodology for time-dependent variability in advanced technologies

2015 IEEE Custom Integrated Circuits Conference (CICC), 2015, p.1-8

2015

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Overview of oxidative stress findings in hepatic encephalopathy: From cellular and ammonium-based animal models to human data

P36 Brain Regional Differences in the Developing Brain Using an Animal Model of Type C Hepatic Encephalopathy

P17 The Beneficial Effect of Oral Cr Supplementation in an Early Childhood Rat Model of Chronic Hepatic Encephalopathy: In Vivo Longitudinal 1H and 31P Magnetic Resonance Spectroscopy Study

Central nervous system and systemic oxidative stress interplay with inflammation in a bile duct ligation rat model of type C hepatic encephalopathy

Corrigendum to “Central nervous system and systemic oxidative stress interplay with inflammation in a bile duct ligation rat model of type C hepatic encephalopathy” [Free Radical Biol. Med. 178 (2022) 295–307 ISSN 0891–5849]

Behavior of a Railgun Launch Package at the Muzzle and During Sabot Discard

Developing a Launch Package for the PEGASUS Launcher

Increasing Launch Efficiency With the PEGASUS Launcher

Experiments to Increase the Used Energy With the PEGASUS Railgun

Acceleration of Aluminum Booster Projectiles With PEGASUS

Further Experiments With an UHF Radio Link to a Railgun Projectile

Investigations on the frictional behavior of electromagnetic Railgun armatures

Acceleration of aluminum booster projectiles with PEGASUS

Further experiments with an UHF radio link to a railgun projectile

Experiments to increase the used energy with the PEGASUS railgun

Comphy — A compact-physics framework for unified modeling of BTI

A brief overview of gate oxide defect properties and their relation to MOSFET instabilities and device and circuit time-dependent variability

The defect-centric perspective of device and circuit reliability—From gate oxide defects to circuits

Advanced MOSFET variability and reliability characterization array

Statistical assessment of the full VG/VD degradation space using dedicated device arrays

Si/SiGe superlattice I/O finFETs in a vertically-stacked Gate-All-Around horizontal Nanowire Technology

Defect-based compact modeling for RTN and BTI variability

CDM-Time Domain Turn-on Transient of ESD Diodes in Bulk FinFET and GAA NW Technologies

Self-heating-aware CMOS reliability characterization using degradation maps

Characterization and simulation methodology for time-dependent variability in advanced technologies

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