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Ion-Induced Energy Pulse Mechanism for Single-Event Burnout in High-Voltage SiC Power MOSFETs and Junction Barrier Schottky Diodes

IEEE transactions on nuclear science, 2020-01, Vol.67 (1), p.22-28

2020

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Alpha Particle-Induced Persistent Effects in a COTS 3-D-Integrated CMOS Imager

IEEE transactions on nuclear science, 2024-04, Vol.71 (4), p.759-769

2024

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Estimating Terrestrial Neutron-Induced SEB Cross Sections and FIT Rates for High-Voltage SiC Power MOSFETs

IEEE transactions on nuclear science, 2019-01, Vol.66 (1), p.337-343

2019

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Predicting Muon-Induced SEU Rates for a 28-nm SRAM Using Protons and Heavy Ions to Calibrate the Sensitive Volume Model

IEEE transactions on nuclear science, 2018-02, Vol.65 (2), p.712-718

2018

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Probing the Single-Event Sensitivity of a COTS 3D-Integrated Imager With Alpha Particle Irradiation

IEEE transactions on nuclear science, 2023-04, Vol.70 (4), p.410-417

2023

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Electron-Induced Single-Event Upsets in Static Random Access Memory

IEEE transactions on nuclear science, 2013-12, Vol.60 (6), p.4122-4129

2013

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Comparison of Total-Ionizing-Dose Effects in Bulk and SOI FinFETs at 90 and 295 K

IEEE transactions on nuclear science, 2019-06, Vol.66 (6), p.911-917

2019

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CRÈME: The 2011 Revision of the Cosmic Ray Effects on Micro-Electronics Code

IEEE transactions on nuclear science, 2012-12, Vol.59 (6), p.3141-3147

2012

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The Contribution of Low-Energy Protons to the Total On-Orbit SEU Rate

IEEE transactions on nuclear science, 2015-12, Vol.62 (6), p.2440-2451

2015

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Electron-Induced Single Event Upsets in 28 nm and 45 nm Bulk SRAMs

IEEE transactions on nuclear science, 2015-12, Vol.62 (6), p.2709-2716

2015

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General Framework for Single Event Effects Rate Prediction in Microelectronics

IEEE transactions on nuclear science, 2009-12, Vol.56 (6), p.3098-3108

2009

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Impact of Ion Energy and Species on Single Event Effects Analysis

IEEE transactions on nuclear science, 2007-12, Vol.54 (6), p.2312-2321

2007

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The SIRE2 Toolkit

Space Weather, 2020-07, Vol.18 (7), p.n/a

2020

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Heavy-Ion-Induced Current Transients in Bulk and SOI FinFETs

IEEE transactions on nuclear science, 2012-12, Vol.59 (6), p.2674-2681

2012

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Multiple-Bit Upset in 130 nm CMOS Technology

IEEE transactions on nuclear science, 2006-12, Vol.53 (6), p.3259-3264

2006

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Reducing Soft Error Rate in Logic Circuits Through Approximate Logic Functions

IEEE transactions on nuclear science, 2006-12, Vol.53 (6), p.3417-3421

2006

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Predicting Thermal Neutron-Induced Soft Errors in Static Memories Using TCAD and Physics-Based Monte Carlo Simulation Tools

IEEE electron device letters, 2007-02, Vol.28 (2), p.180-182

2007

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Impact of Low-Energy Proton Induced Upsets on Test Methods and Rate Predictions

IEEE transactions on nuclear science, 2009-12, Vol.56 (6), p.3085-3092

2009

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The Effects of Neutron Energy and High-Z Materials on Single Event Upsets and Multiple Cell Upsets

IEEE transactions on nuclear science, 2011-12, Vol.58 (6), p.2591-2598

2011

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Monte-Carlo Based On-Orbit Single Event Upset Rate Prediction for a Radiation Hardened by Design Latch

IEEE transactions on nuclear science, 2007-12, Vol.54 (6), p.2419-2425

2007

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Application of RADSAFE to Model the Single Event Upset Response of a 0.25 $\mu$m CMOS SRAM

IEEE transactions on nuclear science, 2007-08, Vol.54 (4), p.898-903

2007

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Satometer: how much have we searched?

IEEE transactions on computer-aided design of integrated circuits and systems, 2003-08, Vol.22 (8), p.995-1004

2003

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Effects of Stopping Ions and LET Fluctuations on Soft Error Rate Prediction

IEEE transactions on nuclear science, 2015-02, Vol.62 (5)

2015

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A Generalized SiGe HBT Single-Event Effects Model for On-Orbit Event Rate Calculations

IEEE transactions on nuclear science, 2007-12, Vol.54 (6), p.2322-2329

2007

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Contribution of Control Logic Upsets and Multi-Node Charge Collection to Flip-Flop SEU Cross-Section in 40-nm CMOS

IEEE transactions on nuclear science, 2010-12, Vol.57 (6), p.3176-3182

2010

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Ion-Induced Energy Pulse Mechanism for Single-Event Burnout in High-Voltage SiC Power MOSFETs and Junction Barrier Schottky Diodes

Alpha Particle-Induced Persistent Effects in a COTS 3-D-Integrated CMOS Imager

Estimating Terrestrial Neutron-Induced SEB Cross Sections and FIT Rates for High-Voltage SiC Power MOSFETs

Predicting Muon-Induced SEU Rates for a 28-nm SRAM Using Protons and Heavy Ions to Calibrate the Sensitive Volume Model

Probing the Single-Event Sensitivity of a COTS 3D-Integrated Imager With Alpha Particle Irradiation

Electron-Induced Single-Event Upsets in Static Random Access Memory

Comparison of Total-Ionizing-Dose Effects in Bulk and SOI FinFETs at 90 and 295 K

CRÈME: The 2011 Revision of the Cosmic Ray Effects on Micro-Electronics Code

The Contribution of Low-Energy Protons to the Total On-Orbit SEU Rate

Electron-Induced Single Event Upsets in 28 nm and 45 nm Bulk SRAMs

General Framework for Single Event Effects Rate Prediction in Microelectronics

Impact of Ion Energy and Species on Single Event Effects Analysis

The SIRE2 Toolkit

Heavy-Ion-Induced Current Transients in Bulk and SOI FinFETs

Multiple-Bit Upset in 130 nm CMOS Technology

Reducing Soft Error Rate in Logic Circuits Through Approximate Logic Functions

Predicting Thermal Neutron-Induced Soft Errors in Static Memories Using TCAD and Physics-Based Monte Carlo Simulation Tools

Impact of Low-Energy Proton Induced Upsets on Test Methods and Rate Predictions

The Effects of Neutron Energy and High-Z Materials on Single Event Upsets and Multiple Cell Upsets

Monte-Carlo Based On-Orbit Single Event Upset Rate Prediction for a Radiation Hardened by Design Latch

Application of RADSAFE to Model the Single Event Upset Response of a 0.25 $\mu$m CMOS SRAM

Satometer: how much have we searched?

Effects of Stopping Ions and LET Fluctuations on Soft Error Rate Prediction

A Generalized SiGe HBT Single-Event Effects Model for On-Orbit Event Rate Calculations

Contribution of Control Logic Upsets and Multi-Node Charge Collection to Flip-Flop SEU Cross-Section in 40-nm CMOS

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