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Relation between image charge and potential alignment corrections for charged defects in periodic boundary conditions

The Journal of chemical physics, 2018-07, Vol.149 (2), p.024103-024103

2018

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Influence of ions on two-dimensional and three-dimensional atomic force microscopy at fluorite-water interfaces

Nanotechnology, 2017-06, Vol.28 (24), p.245701-245701

2017

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Trapping, self-trapping and the polaron family

Journal of physics. Condensed matter, 2007-06, Vol.19 (25), p.255208-255208 (22)

2007

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Intrinsic electron traps in atomic-layer deposited HfO2 insulators

Applied physics letters, 2016-05, Vol.108 (22)

2016

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Optical signatures of intrinsic electron localization in amorphous SiO2

Journal of physics. Condensed matter, 2015-07, Vol.27 (26), p.265501-265501

2015

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A mechanism of Cu work function reduction in CsBr/Cu photocathodes

Physical chemistry chemical physics : PCCP, 2016-03, Vol.18 (1), p.7427-7434

2016

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Simple Model for DNA Adsorption onto a Mica Surface in 1:1 and 2:1 Electrolyte Solutions

Langmuir, 2006-08, Vol.22 (18), p.7678-7688

2006

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Mechanism of interstitial oxygen diffusion in hafnia

Physical review letters, 2002-11, Vol.89 (22), p.225901-225901, Article 225901

2002

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Origin of the Asymmetry in the Magnitude of the Statistical Variability of n- and p-Channel Poly-Si Gate Bulk MOSFETs

IEEE electron device letters, 2008-08, Vol.29 (8), p.913-915

2008

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The role of nitrogen-related defects in high- k dielectric oxides: Density-functional studies

Journal of applied physics, 2005-03, Vol.97 (5), p.053704-053704-13

2005

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Photoinduced Br Desorption from CsBr Thin Films Grown on Cu(100)

Journal of physical chemistry. C, 2015-10, Vol.119 (42), p.24036-24045

2015

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Role of applied bias and tip electronic structure in the scanning tunneling microscopy imaging of highly oriented pyrolytic graphite

Physical review. B, Condensed matter and materials physics, 2012-02, Vol.85 (8), Article 085433

2012

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Unambiguous interpretation of atomically resolved force microscopy images of an insulator

Physical review letters, 2001-03, Vol.86 (11), p.2373-2376

2001

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Mechanism of laser assisted field evaporation from insulating oxides

Ultramicroscopy, 2011-05, Vol.111 (6), p.567-570

2011

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Relative energies of surface and defect states: ab initio calculations for the MgO (001) surface

Surface science, 2000-04, Vol.450 (3), p.153-170

2000

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Electronic properties of defects in polycrystalline dielectric materials

Microelectronic engineering, 2009-07, Vol.86 (7), p.1751-1755

2009

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Recombination defects at the 4H-SiC/SiO2 interface investigated with electrically detected magnetic resonance and ab initio calculations

Journal of applied physics, 2018-07, Vol.124 (4)

2018

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Contrast formation in atomic resolution scanning force microscopy on CaF2(111): experiment and theory

Journal of physics. Condensed matter, 2001-03, Vol.13 (10), p.2061-2079

2001

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Negative oxygen vacancies in HfO2 as charge traps in high-k stacks

Applied physics letters, 2006-08, Vol.89 (8)

2006

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Theoretical prediction of intrinsic self-trapping of electrons and holes in monoclinic HfO2

Physical review letters, 2007-10, Vol.99 (15), p.155504-155504

2007

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Atomically resolved edges and kinks of NaCl islands on Cu(111): Experiment and theory

Physical review. B, Condensed matter, 2000-07, Vol.62 (3), p.2074-2084

2000

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Modeling HfO2/SiO2/Si interface

Microelectronic engineering, 2007-09, Vol.84 (9-10), p.2412-2415

2007

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Intrinsic Resistance Switching in Amorphous Silicon Suboxides: The Role of Columnar Microstructure

Scientific reports, 2017-08, Vol.7 (1), p.9274-7, Article 9274

2017

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Excitation, Ionization, and Desorption: How Sub-Band Gap Photons Modify the Structure of Oxide Nanoparticles

Journal of physical chemistry. C, 2009-01, Vol.113 (4), p.1274-1279

2009

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Crystallographic phase transition and high-Tc superconductivity in LaFeAsO:F

Superconductor science & technology, 2008-12, Vol.21 (12), p.125028-125028 (9)

2008

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Relation between image charge and potential alignment corrections for charged defects in periodic boundary conditions

Influence of ions on two-dimensional and three-dimensional atomic force microscopy at fluorite-water interfaces

Trapping, self-trapping and the polaron family

Intrinsic electron traps in atomic-layer deposited HfO2 insulators

Optical signatures of intrinsic electron localization in amorphous SiO2

A mechanism of Cu work function reduction in CsBr/Cu photocathodes

Simple Model for DNA Adsorption onto a Mica Surface in 1:1 and 2:1 Electrolyte Solutions

Mechanism of interstitial oxygen diffusion in hafnia

Origin of the Asymmetry in the Magnitude of the Statistical Variability of n- and p-Channel Poly-Si Gate Bulk MOSFETs

The role of nitrogen-related defects in high- k dielectric oxides: Density-functional studies

Photoinduced Br Desorption from CsBr Thin Films Grown on Cu(100)

Role of applied bias and tip electronic structure in the scanning tunneling microscopy imaging of highly oriented pyrolytic graphite

Unambiguous interpretation of atomically resolved force microscopy images of an insulator

Mechanism of laser assisted field evaporation from insulating oxides

Relative energies of surface and defect states: ab initio calculations for the MgO (001) surface

Electronic properties of defects in polycrystalline dielectric materials

Recombination defects at the 4H-SiC/SiO2 interface investigated with electrically detected magnetic resonance and ab initio calculations

Contrast formation in atomic resolution scanning force microscopy on CaF2(111): experiment and theory

Negative oxygen vacancies in HfO2 as charge traps in high-k stacks

Theoretical prediction of intrinsic self-trapping of electrons and holes in monoclinic HfO2

Atomically resolved edges and kinks of NaCl islands on Cu(111): Experiment and theory

Modeling HfO2/SiO2/Si interface

Intrinsic Resistance Switching in Amorphous Silicon Suboxides: The Role of Columnar Microstructure

Excitation, Ionization, and Desorption: How Sub-Band Gap Photons Modify the Structure of Oxide Nanoparticles

Crystallographic phase transition and high-Tc superconductivity in LaFeAsO:F

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