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Spectral sensitivities and color signals in a polymorphic damselfly

PloS one, 2014-01, Vol.9 (1), p.e87972-e87972

2014

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Study on 20 V LDMOS With Stepped-Gate-Oxide Structure for PMIC Applications: Design, Fabrication, and Characterization

IEEE transactions on electron devices, 2022-02, Vol.69 (2), p.878-881

2022

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Avalanche Ruggedness Capability and Improvement of 5-V n-Channel Large-Array MOSFET in BCD Process

IEEE transactions on electron devices, 2019-07, Vol.66 (7), p.3040-3048

2019

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DNA Methylation Biomarkers as Prediction Tools for Therapeutic Response and Prognosis in Intermediate-Stage Hepatocellular Carcinoma

Cancers, 2023-09, Vol.15 (18), p.4465

2023

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Power-Tracking Embedded Buck-Boost Converter With Fast Dynamic Voltage Scaling for the SoC System

IEEE transactions on power electronics, 2012-03, Vol.27 (3), p.1271-1282

2012

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Fast Transient (FT) Technique With Adaptive Phase Margin (APM) for Current Mode DC-DC Buck Converters

IEEE transactions on very large scale integration (VLSI) systems, 2012-10, Vol.20 (10), p.1781-1793

2012

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Color Change from male-mimic to Gynomorphic: a New Aspect of Signaling Sexual Status in Damselflies (Odonata, Zygoptera)

Behavioral ecology, 2012-11, Vol.23 (6), p.1269-1275

2012

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30.8 3D Wireless Power Transfer with Noise Cancellation Technique for −62dB Noise Suppression and 90.1% Efficiency

2023 IEEE International Solid- State Circuits Conference (ISSCC), 2023, p.452-454

2023

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Monolithic GaN-Based Gate Driver With On-Chip Adaptive On-Time Controller and Negative Current Slope Detector to Prevent Shoot-Through

IEEE solid-state circuits letters, 2023, Vol.6, p.217-220

2023

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A Concise Electrothermal Model to Characterize the Thermal Safe-Operating Area of Power Transistor

2023 IEEE International Reliability Physics Symposium (IRPS), 2023, p.1-6

2023

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20.3 A GaN Gate Driver with On-chip Adaptive On-time Controller and Negative Current Slope Detector

2023 IEEE International Solid-State Circuits Conference (ISSCC), 2023, p.306-308

2023

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The Transition Behavior of Power LDNMOS at the ON-OFF Transient During Unclamped Inductive-Switching (UIS) Test

IEEE transactions on electron devices, 2024-07, Vol.71 (7), p.4247-4252

2024

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Optimizing the on-chip electrostatic discharge protection device by Taguchi's methodology

Microelectronics and reliability, 2022-09, Vol.136, p.114662, Article 114662

2022

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Semiself-Protection Scheme for Gigahertz High-Frequency Output ESD Protection

IEEE transactions on electron devices, 2011-07, Vol.58 (7), p.1914-1921

2011

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Predation by an exotic lizard, Anolis sagrei, alters the ant community structure in betelnut palm plantations in southern Taiwan

Ecological entomology, 2008-10, Vol.33 (5), p.569-576

2008

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Effects of the Brown Anole Invasion and Betelnut Palm Planting on Arthropod Diversity in Southern Taiwan

Zoological Science, 2008-11, Vol.25 (11), p.1121-1129

2008

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Large array device characteristics improvements

Microelectronics and reliability, 2021-10, Vol.125, p.114353, Article 114353

2021

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Substrate Pick-Up Impacting on ESD Performances of Cascode NMOS Transistors

IEICE transactions on fundamentals of electronics, communications and computer sciences, 2011, Vol.E94-A (2), p.688-695

2011

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Embedded I/O PAD Circuit Design for OTP Memory Power-Switch Functionality

IEEE transactions on very large scale integration (VLSI) systems, 2012-04, Vol.20 (4), p.746-750

2012

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Improving ESD protection of 5 V NMOSFET large array device in 0.4 μm BCD process

Microelectronics and reliability, 2018-05, Vol.84, p.48-54

2018

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Package and Chip Accelerated Aging Methods for Power MOSFET Reliability Evaluation

2019 Design, Automation & Test in Europe Conference & Exhibition (DATE), 2019, p.1661-1666

2019

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Multi-color LC/BL algorithm in field-sequential-color LCD for color-breakup suppression

Journal of the Society for Information Display, 2011-02, Vol.19 (2), p.170-177

2011

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A Combination of Implant Shadow and Skin Effects Leading to HV Devices Failure during the ESD Event

2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), 2023, p.1-7

2023

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RESURF Region Variation Induced Current Crowding Effect on HV p-LDMOS

2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), 2023, p.1-7

2023

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Bipolar Transistors' Holding Phenomena

2023 International Conference on Consumer Electronics - Taiwan (ICCE-Taiwan), 2023, p.221-222

2023

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Spectral sensitivities and color signals in a polymorphic damselfly

Study on 20 V LDMOS With Stepped-Gate-Oxide Structure for PMIC Applications: Design, Fabrication, and Characterization

Avalanche Ruggedness Capability and Improvement of 5-V n-Channel Large-Array MOSFET in BCD Process

DNA Methylation Biomarkers as Prediction Tools for Therapeutic Response and Prognosis in Intermediate-Stage Hepatocellular Carcinoma

Power-Tracking Embedded Buck-Boost Converter With Fast Dynamic Voltage Scaling for the SoC System

Fast Transient (FT) Technique With Adaptive Phase Margin (APM) for Current Mode DC-DC Buck Converters

Color Change from male-mimic to Gynomorphic: a New Aspect of Signaling Sexual Status in Damselflies (Odonata, Zygoptera)

30.8 3D Wireless Power Transfer with Noise Cancellation Technique for −62dB Noise Suppression and 90.1% Efficiency

Monolithic GaN-Based Gate Driver With On-Chip Adaptive On-Time Controller and Negative Current Slope Detector to Prevent Shoot-Through

A Concise Electrothermal Model to Characterize the Thermal Safe-Operating Area of Power Transistor

20.3 A GaN Gate Driver with On-chip Adaptive On-time Controller and Negative Current Slope Detector

The Transition Behavior of Power LDNMOS at the ON-OFF Transient During Unclamped Inductive-Switching (UIS) Test

Optimizing the on-chip electrostatic discharge protection device by Taguchi's methodology

Semiself-Protection Scheme for Gigahertz High-Frequency Output ESD Protection

Predation by an exotic lizard, Anolis sagrei, alters the ant community structure in betelnut palm plantations in southern Taiwan

Effects of the Brown Anole Invasion and Betelnut Palm Planting on Arthropod Diversity in Southern Taiwan

Large array device characteristics improvements

Substrate Pick-Up Impacting on ESD Performances of Cascode NMOS Transistors

Embedded I/O PAD Circuit Design for OTP Memory Power-Switch Functionality

Improving ESD protection of 5 V NMOSFET large array device in 0.4 μm BCD process

Package and Chip Accelerated Aging Methods for Power MOSFET Reliability Evaluation

Multi-color LC/BL algorithm in field-sequential-color LCD for color-breakup suppression

A Combination of Implant Shadow and Skin Effects Leading to HV Devices Failure during the ESD Event

RESURF Region Variation Induced Current Crowding Effect on HV p-LDMOS

Bipolar Transistors' Holding Phenomena

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