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2017 Symposium on VLSI Technology, 2017, p.T230-T231
- Loubet, N.
- Hook, T.
- Montanini, P.
- Yeung, C-W
- Kanakasabapathy, S.
- Guillom, M.
- Yamashita, T.
- Zhang, J.
- Miao, X.
- Wang, J.
- Young, A.
- Chao, R.
- Kang, M.
- Liu, Z.
- Fan, S.
- Hamieh, B.
- Sieg, S.
- Mignot, Y.
- Xu, W.
- Seo, S-C
- Yoo, J.
- Mochizuki, S.
- Sankarapandian, M.
- Kwon, O.
- Carr, A.
- Greene, A.
- Park, Y.
- Frougier, J.
- Galatage, R.
- Bao, R.
- Shearer, J.
- Conti, R.
- Song, H.
- Lee, D.
- Kong, D.
- Xu, Y.
- Arceo, A.
- Bi, Z.
- Xu, P.
- Muthinti, R.
- Li, J.
- Wong, R.
- Brown, D.
- Oldiges, P.
- Robison, R.
- Arnold, J.
- Felix, N.
- Skordas, S.
- Gaudiello, J.
- Standaert, T.
- Jagannathan, H.
- Corliss, D.
- Na, M-H
- Knorr, A.
- Wu, T.
- Gupta, D.
- Lian, S.
- Divakaruni, R.
- Gow, T.
- Labelle, C.
- Lee, S.
- Paruchuri, V.
- Bu, H.
- Khare, M.
2017
Link zum Volltext
IEEE electron device letters, 2021-05, Vol.42 (5), p.759-762
- Kim, Y.
- Seo, S.-C.
- Consiglio, S.
- Jamison, P.
- Higuchi, H.
- Rasch, M.
- Wu, E. Y.
- Kong, D.
- Saraf, I.
- Catano, C.
- Muralidhar, R.
- Nguyen, S.
- DeVries, S.
- Van der Straten, O.
- Sankarapandian, M.
- Pujari, R. N.
- Gasasira, A.
- Mcdermott, S. M.
- Miyazoe, H.
- Koty, D.
- Yang, Q.
- Yan, H.
- Clark, R.
- Tapily, K.
- Engelmann, S.
- Robison, R. R.
- Wajda, C.
- Mosden, A.
- Tsunomura, T.
- Soave, R.
- Saulnier, N.
- Haensch, W.
- Leusink, G.
- Biolsi, P.
- Narayanan, V.
- Ando, T.
2021
- Link zum Volltext
Chemical engineering science, 2008-07, Vol.63 (13), p.3485-3492
2008
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IEEE electron device letters, 2011-02, Vol.32 (2), p.200-202
2011
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Thin solid films, 2006-05, Vol.504 (1), p.274-278
2006
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Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2013-12, Vol.317, p.242-247
2013
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Journal of radioanalytical and nuclear chemistry, 2006-05, Vol.268 (2), p.349-356
2006
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Journal of radioanalytical and nuclear chemistry, 2006-12, Vol.270 (3), p.575-583
2006
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2014 Symposium on VLSI Technology (VLSI-Technology): Digest of Technical Papers, 2014, p.1-2
- Seo, K.-I
- Haran, B.
- Gupta, D.
- Guo, D.
- Standaert, T.
- Xie, R.
- Shang, H.
- Alptekin, E.
- Bae, D.-I
- Bae, G.
- Boye, C.
- Cai, H.
- Chanemougame, D.
- Chao, R.
- Cheng, K.
- Cho, J.
- Choi, K.
- Hamieh, B.
- Hong, J. G.
- Hook, T.
- Jang, L.
- Jung, J.
- Jung, R.
- Lee, D.
- Lherron, B.
- Kambhampati, R.
- Kim, B.
- Kim, H.
- Kim, K.
- Kim, T. S.
- Ko, S.-B
- Lie, F. L.
- Liu, D.
- Mallela, H.
- Mclellan, E.
- Mehta, S.
- Montanini, P.
- Mottura, M.
- Nam, J.
- Nam, S.
- Nelson, F.
- Ok, I.
- Park, C.
- Park, Y.
- Paul, A.
- Prindle, C.
- Ramachandran, R.
- Sankarapandian, M.
- Sardesai, V.
- Scholze, A.
- Seo, S.-C
- Shearer, J.
- Southwick, R.
- Sreenivasan, R.
- Stieg, S.
- Strane, J.
- Sun, X.
- Sung, M. G.
- Surisetty, C.
- Tsutsui, G.
- Tripathi, N.
- Vega, R.
- Waskiewicz, C.
- Weybright, M.
- Yeh, C.-C
- Bu, H.
- Burns, S.
- Canaperi, D.
- Celik, M.
- Colburn, M.
- Jagannathan, H.
- Kanakasabaphthy, S.
- Kleemeier, W.
- Liebmann, L.
- Mcherron, D.
- Oldiges, P.
- Paruchuri, V.
- Spooner, T.
- Stathis, J.
- Divakaruni, R.
- Gow, T.
- Iacoponi, J.
- Jenq, J.
- Sampson, R.
- Khare, M.
2014
- Link zum Volltext
Journal of the Korean Physical Society, 2015, 66(3), , pp.443-448
2015
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2022 International Electron Devices Meeting (IEDM), 2022, p.33.7.1-33.7.4
- Gong, N.
- Rasch, M.J.
- Seo, S.-C.
- Gasasira, A.
- Solomon, P.
- Bragaglia, V.
- Consiglio, S.
- Higuchi, H.
- Park, C.
- Brew, K.
- Jamison, P.
- Catano, C.
- Saraf, I.
- Athena, F.F.
- Silvestre, C.
- Liu, X.
- Khan, B.
- Jain, N.
- Mcdermott, S.
- Johnson, R.
- Estrada-Raygoza, I.
- Li, J.
- Gokmen, T.
- Li, N.
- Pujari, R.
- Carta, F.
- Miyazoe, H.
- Frank, M.M.
- Koty, D.
- Yang, Q.
- Clark, R.
- Tapily, K.
- Wajda, C.
- Mosden, A.
- Shearer, J.
- Metz, A.
- Teehan, S.
- Saulnier, N.
- Offrein, B. J.
- Tsunomura, T.
- Leusink, G.
- Narayanan, V.
- Ando, T.
2022
- Link zum Volltext
2004 IEEE International Reliability Physics Symposium. Proceedings, 2004, p.222-228
2004
- Link zum Volltext
South African journal of botany, 2020-05, Vol.130, p.471-474
2020
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Review of scientific instruments, 2011-06, Vol.82 (6), p.063507-063507-6
2011
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Few-body systems, 2013-08, Vol.54 (7-10), p.961-966
2013
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2009 Symposium on VLSI Technology, 2009, p.212-213
- Cheng, K.
- Khakifirooz, A.
- Kulkarni, P.
- Kanakasabapathy, S.
- Schmitz, S.
- Reznicek, A.
- Adam, T.
- Zhu, Y.
- Li, J.
- Faltermeier, J.
- Furukawa, T.
- Edge, L.F.
- Haran, B.
- Seo, S.-C.
- Jamison, P.
- Holt, J.
- Li, X.
- Loesing, R.
- Zhu, Z.
- Johnson, R.
- Upham, A.
- Levin, T.
- Smalley, M.
- Herman, J.
- Di, M.
- Wang, J.
- Sadana, D.
- Kozlowski, P.
- Bu, H.
- Doris, B.
- O'Neill, J.
2009
- Link zum Volltext
Nuclear fusion, 2007-05, Vol.47 (5), p.463-468
2007
Link zum Volltext
Applied physics letters, 2004-06, Vol.84 (24), p.4986-4988
2004
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Review of scientific instruments, 2008-02, Vol.79 (2), p.02C104-02C104-3
2008
Link zum Volltext
2010 IEEE International SOI Conference (SOI), 2010, p.1-4
2010
- Link zum Volltext
Journal of ultrasound in medicine, 1999-04, Vol.18 (4), p.261-264
1999
Link zum Volltext
The Journal of urology, 2019-03, Vol.201 (3), p.417-418
2019
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Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2017-11, Vol.410, p.108-113
2017
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Journal of radioanalytical and nuclear chemistry, 2006-12, Vol.270 (3), p.489-493
2006
Link zum Volltext
Atmospheric environment (1994), 2007-12, Vol.41 (37), p.8140-8149
2007
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