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Installieren Sie die LibKey Nomad-Browsererweiterung und erhalten Sie von vielen Webseiten einfachen Zugriff auf lizenzierte Volltexte oder Open Access Publikationen. Mehr erfahren...IEEE transactions on components, packaging, and manufacturing technology (2011), 2023-10, Vol.13 (10), p.1-1
2023
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Power cycling and temperature endurance test of a GaN switching cell with substrate integrated chips
2019
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Microelectronics and reliability, 2000-08, Vol.40 (8-10), p.1521-1525
2000
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IEEE transactions on power electronics, 2005-03, Vol.20 (2), p.268-275
2005
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IEEE transactions on power electronics, 2005-05, Vol.20 (3), p.566-575
2005
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IEEE transactions on industry applications, 2004-07, Vol.40 (4), p.1031-1038
2004
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Microelectronics and reliability, 2002-09, Vol.42 (9), p.1605-1610
2002
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Microelectronics and reliability, 2003-09, Vol.43 (9), p.1839-1846
2003
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Microelectronics and reliability, 2002-09, Vol.42 (9), p.1597-1604
2002
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Fourtieth IAS Annual Meeting. Conference Record of the 2005 Industry Applications Conference, 2005, 2005, Vol.2, p.1144-1151 Vol. 2
2005
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Journal of electrostatics, 2000-08, Vol.49 (3), p.195-213
2000
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Solid-state electronics, 1997-09, Vol.41 (9), p.1285-1292
1997
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Sensors and actuators. A, Physical, 1998-06, Vol.68 (1), p.372-377
1998
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2015 International EURASIP Workshop on RFID Technology (EURFID), 2015, p.87-93
2015
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Conference Record of the 2002 IEEE Industry Applications Conference. 37th IAS Annual Meeting (Cat. No.02CH37344), 2002, Vol.2, p.948-954 vol.2
2002
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Microelectronics and reliability, 1999, Vol.39 (6), p.1143-1148
1999
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Microelectronics and reliability, 1997-10, Vol.37 (10), p.1727-1730
1997
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Microelectronics and reliability, 1999, Vol.39 (6), p.925-930
1999
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High temperature reliability on automotive power modules verified by power cycling tests up to 150°C
2003
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Conference Record of the 2001 IEEE Industry Applications Conference. 36th IAS Annual Meeting (Cat. No.01CH37248), 2001, Vol.4, p.2224-2231 vol.4
2001
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Microelectronics and reliability, 2003-09, Vol.43 (9), p.1877-1882
2003
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Proceedings of the 10th International Symposium on Power Semiconductor Devices and ICs. ISPSD'98 (IEEE Cat. No.98CH36212), 1998, p.199-202
1998
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2004 IEEE 35th Annual Power Electronics Specialists Conference (IEEE Cat. No.04CH37551), 2004, Vol.6, p.4655-4661 Vol.6
2004
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2007 Power Conversion Conference - Nagoya, 2007, p.563-568
2007
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South African journal of science, 2004-05, Vol.100 (5), p.273-278
2004
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