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Universal Equation for Argon Gas Cluster Sputtering Yields

Journal of physical chemistry. C, 2013-06, Vol.117 (24), p.12622-12632

Seah, M. P

2013

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Simple universal curve for the energy-dependent electron attenuation length for all materials

Surface and interface analysis, 2012-10, Vol.44 (10), p.1353-1359

Seah, M. P.

2012

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An accurate and simple universal curve for the energy-dependent electron inelastic mean free path

Surface and interface analysis, 2012-04, Vol.44 (4), p.497-503

Seah, M. P.

2012

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Sputtering yields of compounds using argon ions

Journal of physics. D, Applied physics, 2010-06, Vol.43 (25), p.253001

2010

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Peptide Fragmentation and Surface Structural Analysis by Means of ToF-SIMS Using Large Cluster Ion Sources

Analytical chemistry (Washington), 2016-04, Vol.88 (7), p.3592-3597

2016

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Argon Cluster Ion Beams for Organic Depth Profiling: Results from a VAMAS Interlaboratory Study

Analytical chemistry (Washington), 2012-09, Vol.84 (18), p.7865-7873

2012

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Organic Depth Profiling of a Nanostructured Delta Layer Reference Material Using Large Argon Cluster Ions

Analytical chemistry (Washington), 2010-01, Vol.82 (1), p.98-105

2010

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Microfluidic chip for stacking, separation and extraction of multiple DNA fragments

Journal of Chromatography A, 2016-03, Vol.1437, p.219-225

2016

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Angle Dependence of Argon Gas Cluster Sputtering Yields for Organic Materials

The journal of physical chemistry. B, 2015-02, Vol.119 (7), p.3297-3303

2015

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Quantitative characterization of defect size in graphene using Raman spectroscopy

Applied physics letters, 2014-12, Vol.105 (25)

2014

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SIMS of Delta Layers in Organic Materials: Amount of Substance, Secondary Ion Species, Matrix Effects, and Anomalous Structures in Argon Gas Cluster Depth Profiles

Journal of physical chemistry. C, 2016-11, Vol.120 (46), p.26328-26335

2016

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Summary of ISO/TC 201 Standard: VII ISO 15472 : 2001-surface chemical analysis-x-ray photoelectron spectrometers-calibration of energy scales

Surface and interface analysis, 2001-08, Vol.31 (8), p.721-723

Seah, M. P.

2001

Volltextzugriff (PDF)

Universal Equation for Argon Cluster Size-Dependence of Secondary Ion Spectra in SIMS of Organic Materials

Journal of physical chemistry. C, 2014-06, Vol.118 (24), p.12862-12872

2014

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The determination of atomic force microscope cantilever spring constants via dimensional methods for nanomechanical analysis

Nanotechnology, 2005-09, Vol.16 (9), p.1666-1680

2005

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Quantification issues in the identification of nanoscale regions of homopolymers using modulus measurement via AFM nanoindentation

Applied surface science, 2005-12, Vol.252 (5), p.1915-1933

2005

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Sputtering Yields for Mixtures of Organic Materials Using Argon Gas Cluster Ions

The journal of physical chemistry. B, 2015-10, Vol.119 (42), p.13433-13439

2015

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Argon cluster cleaning of Ga+ FIB‐milled sections of organic and hybrid materials

Surface and interface analysis, 2020-06, Vol.52 (6), p.327-334

2020

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Depth resolution at organic interfaces sputtered by argon gas cluster ions: the effect of energy, angle and cluster size

Analyst (London), 2015-10, Vol.14 (19), p.658-6516

2015

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Quantifying SIMS of Organic Mixtures and Depth Profiles—Characterizing Matrix Effects of Fragment Ions

Journal of the American Society for Mass Spectrometry, 2019-02, Vol.30 (2), p.309-320

2019

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VAMAS Interlaboratory Study for Desorption Electrospray Ionization Mass Spectrometry (DESI MS) Intensity Repeatability and Constancy

Analytical chemistry (Washington), 2014-10, Vol.86 (19), p.9603-9611

2014

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Penetrating cardiac trauma caused by a nail-gun: A case report and narrative review

Trauma case reports, 2022-06, Vol.39, p.100649, Article 100649

2022

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Traumatic tricuspid valve regurgitation: A two case series

Trauma case reports, 2022-02, Vol.37, p.100593, Article 100593

2022

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Ultrathin SiO2 on Si II. Issues in quantification of the oxide thickness

Surface and interface analysis, 2002-08, Vol.33 (8), p.640-652

2002

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Attenuation lengths in organic materials

Surface and interface analysis, 2011-03, Vol.43 (3), p.744-751

2011

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Electron Flood Gun Damage Effects in 3D Secondary Ion Mass Spectrometry Imaging of Organics

Journal of the American Society for Mass Spectrometry, 2014-09, Vol.25 (9), p.1565-1571

2014

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Universal Equation for Argon Gas Cluster Sputtering Yields

Simple universal curve for the energy-dependent electron attenuation length for all materials

An accurate and simple universal curve for the energy-dependent electron inelastic mean free path

Sputtering yields of compounds using argon ions

Peptide Fragmentation and Surface Structural Analysis by Means of ToF-SIMS Using Large Cluster Ion Sources

Argon Cluster Ion Beams for Organic Depth Profiling: Results from a VAMAS Interlaboratory Study

Organic Depth Profiling of a Nanostructured Delta Layer Reference Material Using Large Argon Cluster Ions

Microfluidic chip for stacking, separation and extraction of multiple DNA fragments

Angle Dependence of Argon Gas Cluster Sputtering Yields for Organic Materials

Quantitative characterization of defect size in graphene using Raman spectroscopy

SIMS of Delta Layers in Organic Materials: Amount of Substance, Secondary Ion Species, Matrix Effects, and Anomalous Structures in Argon Gas Cluster Depth Profiles

Summary of ISO/TC 201 Standard: VII ISO 15472 : 2001-surface chemical analysis-x-ray photoelectron spectrometers-calibration of energy scales

Universal Equation for Argon Cluster Size-Dependence of Secondary Ion Spectra in SIMS of Organic Materials

The determination of atomic force microscope cantilever spring constants via dimensional methods for nanomechanical analysis

Quantification issues in the identification of nanoscale regions of homopolymers using modulus measurement via AFM nanoindentation

Sputtering Yields for Mixtures of Organic Materials Using Argon Gas Cluster Ions

Argon cluster cleaning of Ga+ FIB‐milled sections of organic and hybrid materials

Depth resolution at organic interfaces sputtered by argon gas cluster ions: the effect of energy, angle and cluster size

Quantifying SIMS of Organic Mixtures and Depth Profiles—Characterizing Matrix Effects of Fragment Ions

VAMAS Interlaboratory Study for Desorption Electrospray Ionization Mass Spectrometry (DESI MS) Intensity Repeatability and Constancy

Penetrating cardiac trauma caused by a nail-gun: A case report and narrative review

Traumatic tricuspid valve regurgitation: A two case series

Ultrathin SiO2 on Si II. Issues in quantification of the oxide thickness

Attenuation lengths in organic materials

Electron Flood Gun Damage Effects in 3D Secondary Ion Mass Spectrometry Imaging of Organics

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