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Flexible thin-film polymer waveguides fabricated in an industrial roll-to-roll process

Applied optics (2004), 2013-07, Vol.52 (19), p.4510

2013

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Three-dimensional finite element simulation of a polycrystalline copper specimen

Acta materialia, 2007-07, Vol.55 (12), p.4121-4136

2007

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In situ Study of Cracking and Buckling of Chromium Films on PET Substrates

Experimental mechanics, 2011-02, Vol.51 (2), p.219-227

2011

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Growth and optical properties of Ag clusters deposited on poly(ethylene terephthalate)

Nanotechnology, 2011-07, Vol.22 (27), p.275710-275710

2011

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Robust mechanical performance of chromium-coated polyethylene terephthalate over a broad range of conditions

Philosophical magazine (2003. Print), 2012-09, Vol.92 (25-27), p.3346-3362

2012

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Interface failure and adhesion measured by focused ion beam cutting of metal-polymer interfaces

Philosophical magazine letters, 2011-08, Vol.91 (8), p.530-536

2011

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GaN: δ -Mg grown by MOVPE: Structural properties and their effect on the electronic and optical behavior

Journal of crystal growth, 2008-01, Vol.310 (1), p.13-21

2008

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In situ and real-time characterization of metal-organic chemical vapor deposition growth by high resolution x-ray diffraction

Review of scientific instruments, 2005-03, Vol.76 (3), p.033101-033101-4

2005

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Characterization of optical anisotropy in oriented poly(ethylene terephthalate) films using reflectance difference spectroscopy

Polymer (Guilford), 2006-06, Vol.47 (13), p.4768-4772

2006

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In-situ and real-time monitoring of MOCVD growth of III-nitrides by simultaneous multi-wavelength-ellipsometry and X-ray-diffraction

Physica status solidi. A, Applications and materials science, 2006-05, Vol.203 (7), p.1704-1707

2006

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In situ spectroscopic ellipsometry of MOCVD-grown GaN compounds for on-line composition determination and growth control

Journal of crystal growth, 2003-02, Vol.248, p.211-215

2003

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In situ X-ray diffraction during MOCVD of III-nitrides: An optimized wobbling compensating evaluation algorithm

Journal of crystal growth, 2007, Vol.298, p.243-245

2007

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In situ X-ray diffraction during MOCVD of III-nitrides

Physica status solidi. A, Applications and materials science, 2007-08, Vol.204 (8), p.2798-2803

2007

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Separation of coherent and incoherent contributions to reflectance difference spectra

Applied physics letters, 2007-06, Vol.90 (23), p.231903-231903-3

2007

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Virtual interface approximation model applied to spectroscopic ellipsometry for on-line composition determination of metalorganic chemical vapor deposition grown ternary nitrides

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 2003-07, Vol.21 (4), p.1825-1827

2003

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In-situ growth monitoring by spectroscopy ellipsometry of MOCVD cubic-GaN(001)

Thin solid films, 2004-05, Vol.455 (Complete), p.684-687

2004

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Optical and mechanical anisotropies of oriented poly(ethylene terephthalate) films

Applied physics letters, 2006-07, Vol.89 (5)

2006

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On-line growth control of MOCVD deposited GaN and related ternary compounds via spectroscopic ellipsometry and X-ray diffraction

Physica status solidi. A, Applied research, 2004-08, Vol.201 (10), p.2259-2264

2004

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Optical and mechanical anisotropies of orientedpoly(ethylene terephthalate) films

Applied physics letters, 2006-08, Vol.89 (5), p.051906-051906-3

2006

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Optical characterization of thin nickel films on polymer substrates using reflectance difference spectroscopy

Journal of applied physics, 2009-06, Vol.105 (12), p.123503-123503-6

2009

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GaN:-Mg grown by MOVPE: Structural properties and their effect on the electronic and optical behavior

Journal of crystal growth, 2008-01, Vol.310 (1), p.13-21

2008

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Auger electron spectroscopy of Au/NiO x contacts on p-GaN annealed in N 2 and O 2 + N 2 ambients

Applied surface science, 2007-01, Vol.253 (6), p.3174-3180

2007

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Auger electron spectroscopy of Au/NiO contacts on p-GaN annealed in N2 and O2+ N2 ambients

Applied surface science, 2007-01, Vol.253 (6), p.3174-3180

2007

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In situ optical analysis of low temperature MOCVD GaN nucleation layer formation via multiple wavelength ellipsometry

Journal of crystal growth, 2004-12, Vol.272 (1), p.106-110

2004

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Auger electron spectroscopy of Au/NiOx contacts on p-GaN annealed in N2 and O2 + N2 ambients

Applied surface science, 2007, Vol.253 (6), p.3174-3180

2007

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Flexible thin-film polymer waveguides fabricated in an industrial roll-to-roll process

Three-dimensional finite element simulation of a polycrystalline copper specimen

In situ Study of Cracking and Buckling of Chromium Films on PET Substrates

Growth and optical properties of Ag clusters deposited on poly(ethylene terephthalate)

Robust mechanical performance of chromium-coated polyethylene terephthalate over a broad range of conditions

Interface failure and adhesion measured by focused ion beam cutting of metal-polymer interfaces

GaN: δ -Mg grown by MOVPE: Structural properties and their effect on the electronic and optical behavior

In situ and real-time characterization of metal-organic chemical vapor deposition growth by high resolution x-ray diffraction

Characterization of optical anisotropy in oriented poly(ethylene terephthalate) films using reflectance difference spectroscopy

In-situ and real-time monitoring of MOCVD growth of III-nitrides by simultaneous multi-wavelength-ellipsometry and X-ray-diffraction

In situ spectroscopic ellipsometry of MOCVD-grown GaN compounds for on-line composition determination and growth control

In situ X-ray diffraction during MOCVD of III-nitrides: An optimized wobbling compensating evaluation algorithm

In situ X-ray diffraction during MOCVD of III-nitrides

Separation of coherent and incoherent contributions to reflectance difference spectra

Virtual interface approximation model applied to spectroscopic ellipsometry for on-line composition determination of metalorganic chemical vapor deposition grown ternary nitrides

In-situ growth monitoring by spectroscopy ellipsometry of MOCVD cubic-GaN(001)

Optical and mechanical anisotropies of oriented poly(ethylene terephthalate) films

On-line growth control of MOCVD deposited GaN and related ternary compounds via spectroscopic ellipsometry and X-ray diffraction

Optical and mechanical anisotropies of orientedpoly(ethylene terephthalate) films

Optical characterization of thin nickel films on polymer substrates using reflectance difference spectroscopy

GaN:-Mg grown by MOVPE: Structural properties and their effect on the electronic and optical behavior

Auger electron spectroscopy of Au/NiO x contacts on p-GaN annealed in N 2 and O 2 + N 2 ambients

Auger electron spectroscopy of Au/NiO contacts on p-GaN annealed in N2 and O2+ N2 ambients

In situ optical analysis of low temperature MOCVD GaN nucleation layer formation via multiple wavelength ellipsometry

Auger electron spectroscopy of Au/NiOx contacts on p-GaN annealed in N2 and O2 + N2 ambients

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