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2006 IEEE International Reliability Physics Symposium Proceedings, 2006, p.448-453
2006
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2009 IEEE International Integrated Reliability Workshop Final Report, 2009, p.30-35
2009
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2006 43rd ACM/IEEE Design Automation Conference, 2006, p.193-198
2006
- Link zum Volltext
2018 48th European Solid-State Device Research Conference (ESSDERC), 2018, p.218-221
2018
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2011 International Reliability Physics Symposium, 2011, p.2B.6.1-2B.6.5
2011
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2011 IEEE International Integrated Reliability Workshop Final Report, 2011, p.77-81
2011
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2010 Symposium on VLSI Technology, 2010, p.27-28
2010
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2008 IEEE International Integrated Reliability Workshop Final Report, 2008, p.1-6
2008
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Advances in radio science, 2009-01, Vol.7 (14), p.201-211
2009
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2007 IEEE International Electron Devices Meeting, 2007, p.801-804
2007
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Microelectronics and reliability, 2012-09, Vol.52 (9-10), p.1891-1894
2012
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Applying the universal recovery equation for fast wafer level reliability monitoring NBTI assessment
2009
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2008 IEEE International Integrated Reliability Workshop Final Report, 2008, p.86-90
2008
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2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual, 2003, p.5-10
2003
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Microelectronics and reliability, 2000-08, Vol.40 (8-10), p.1545-1554
2000
Link zum Volltext
2010 IEEE International Reliability Physics Symposium, 2010, p.7-15
2010
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2012 IEEE International Integrated Reliability Workshop Final Report, 2012, p.85-89
2012
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2012 IEEE International Reliability Physics Symposium (IRPS), 2012, p.2F.4.1-2F.4.6
2012
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Schmerz (Berlin, Germany), 1992-12, Vol.6 (4), p.229
1992
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2011 IEEE International Integrated Reliability Workshop Final Report, 2011, p.7-11
2011
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2010 IEEE International Integrated Reliability Workshop Final Report, 2010, p.12-16
2010
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2008 IEEE International Integrated Reliability Workshop Final Report, 2008, p.1-17
2008
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Microelectronics and reliability, 2018-03, Vol.82, p.1-10
2018
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Microelectronics and reliability, 2005, Vol.45 (1), p.39-46
2005
Link zum Volltext
2012 IEEE International Reliability Physics Symposium (IRPS), 2012, p.XT.11.1-XT.11.6
2012
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