UB Paderborn / Katalog / Suche / in CDI

Experimental feasibility of multi-energy photon-counting K-edge imaging in pre-clinical computed tomography

Physics in medicine & biology, 2008-08, Vol.53 (15), p.4031-4047

2008

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Energy-dispersive coherent scatter computed tomography

Applied physics letters, 2006-06, Vol.88 (24), p.243506-243506-3

2006

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X-ray diffraction imaging system for the detection of illicit substances using pixelated CZT-detectors

2013 IEEE Nuclear Science Symposium and Medical Imaging Conference (2013 NSS/MIC), 2013, p.1-5

2013

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IEEE_Xplore

Testing an Energy-Dispersive Counting-Mode Detector With Hard X-Rays From a Synchrotron Source

IEEE transactions on nuclear science, 2008-06, Vol.55 (3), p.1785-1790

2008

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IEEE_Xplore

A reconstruction algorithm for coherent scatter computed tomography based on filtered back-projection

Medical physics (Lancaster), 2003-09, Vol.30 (9), p.2465-2474

2003

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Evidence for density anomalies of liquids at the solid/liquid interface

Europhysics letters, 2000-11, Vol.52 (3), p.330-336

2000

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In situ growth study of NiMnSb films on MgO(001) and Si(001)

Applied physics letters, 2000-04, Vol.76 (15), p.2005-2007

2000

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Observation of Capillary Waves on Liquid Thin Films from Mesoscopic to Atomic Length Scales

Physical review letters, 1999-10, Vol.83 (17), p.3470-3473

1999

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Evidence for Capillary Waves on Dewetted Polymer Film Surfaces: A Combined X-ray and Atomic Force Microscopy Study

Physical review letters, 1998-09, Vol.81 (13), p.2731-2734

1998

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Non-Gaussian Roughness of Interfaces: Cumulant Expansion in X-ray and Neutron Reflectivity

Journal of applied crystallography, 1997-12, Vol.30 (6), p.963-967

1997

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Directional enhancement of characteristic relative to bremsstrahlung X-rays: Foil thickness optimization

Radiation physics and chemistry (Oxford, England : 1993), 2007-07, Vol.76 (7), p.1116-1121

2007

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Structural and magnetic properties of ion beam sputtered NiMnSb films

Physica. B, Condensed matter, 1998-06, Vol.248 (1), p.140-145

1998

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Structural characterization of oxidized allotaxially grown CoSi2 layers by x-ray scattering

Journal of applied physics, 2000-01, Vol.87 (1), p.133-139

2000

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X-ray characterization of buried allotaxially grown CoSi2 layers in Si(100)

Journal of applied physics, 1998-06, Vol.83 (11), p.5823-5830

1998

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CMR2009: 9.04: Multicolored (spectral) CT molecular imaging: the next step in CT imaging

Contrast media and molecular imaging, 2009-11, Vol.4 (6), p.288-289

2009

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Liquid metal anode X-ray sources and their potential applications

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2004, Vol.213, p.189-196

2004

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Roughness of surfaces and interfaces

Physica. B, Condensed matter, 1996-04, Vol.221 (1), p.1-9

1996

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Characterization of Si/Ge interfaces by diffuse X-ray scattering in the region of total external reflection

Physica. B, Condensed matter, 1996-04, Vol.221 (1), p.44-52

1996

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X-ray diffraction from Si/Ge layers: Diffuse scattering in the region of total external reflection

Physical review. B, Condensed matter, 1995-01, Vol.51 (4), p.2311-2321

1995

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Interdiffusion in NiMnSb/V/NiMnSb: X-ray and neutron reflectivity investigation of ion beam sputtered trilayer systems

Journal of applied physics, 1999-11, Vol.86 (9), p.5146-5151

1999

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Dose reduction options by monochromatic X-rays

2003 IEEE Nuclear Science Symposium. Conference Record (IEEE Cat. No.03CH37515), 2003, Vol.4, p.3004-3008 Vol.4

2003

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IEEE_Xplore

A novel CT perfusion protocol for quantitative contrast material mapping

2009 IEEE Nuclear Science Symposium Conference Record (NSS/MIC), 2009, p.3021-3025

2009

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IEEE_Xplore

Correlations in the interface structure of Langmuir-Blodgett films observed by x-ray scattering

Physical review. B, Condensed matter, 1996-08, Vol.54 (7), p.5038-5050

1996

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Structural characterization of oxidized allotaxially grown CoSi{sub 2} layers by x-ray scattering

Journal of applied physics, 2000-01, Vol.87 (1)

2000

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Kardar-Parisi-Zhang growth of amorphous silicon on S i / S i O 2

Physical review. B, Condensed matter, 1997-08, Vol.56 (7), p.4085-4091

1997

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Experimental feasibility of multi-energy photon-counting K-edge imaging in pre-clinical computed tomography

Energy-dispersive coherent scatter computed tomography

X-ray diffraction imaging system for the detection of illicit substances using pixelated CZT-detectors

Testing an Energy-Dispersive Counting-Mode Detector With Hard X-Rays From a Synchrotron Source

A reconstruction algorithm for coherent scatter computed tomography based on filtered back-projection

Evidence for density anomalies of liquids at the solid/liquid interface

In situ growth study of NiMnSb films on MgO(001) and Si(001)

Observation of Capillary Waves on Liquid Thin Films from Mesoscopic to Atomic Length Scales

Evidence for Capillary Waves on Dewetted Polymer Film Surfaces: A Combined X-ray and Atomic Force Microscopy Study

Non-Gaussian Roughness of Interfaces: Cumulant Expansion in X-ray and Neutron Reflectivity

Directional enhancement of characteristic relative to bremsstrahlung X-rays: Foil thickness optimization

Structural and magnetic properties of ion beam sputtered NiMnSb films

Structural characterization of oxidized allotaxially grown CoSi2 layers by x-ray scattering

X-ray characterization of buried allotaxially grown CoSi2 layers in Si(100)

CMR2009: 9.04: Multicolored (spectral) CT molecular imaging: the next step in CT imaging

Liquid metal anode X-ray sources and their potential applications

Roughness of surfaces and interfaces

Characterization of Si/Ge interfaces by diffuse X-ray scattering in the region of total external reflection

X-ray diffraction from Si/Ge layers: Diffuse scattering in the region of total external reflection

Interdiffusion in NiMnSb/V/NiMnSb: X-ray and neutron reflectivity investigation of ion beam sputtered trilayer systems

Dose reduction options by monochromatic X-rays

A novel CT perfusion protocol for quantitative contrast material mapping

Correlations in the interface structure of Langmuir-Blodgett films observed by x-ray scattering

Structural characterization of oxidized allotaxially grown CoSi{sub 2} layers by x-ray scattering

Kardar-Parisi-Zhang growth of amorphous silicon on S i / S i O 2

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