UB Paderborn / Katalog / Suche / in CDI

Sortiert nach

Einfacher Volltextzugriff von (fast) überall

Installieren Sie die LibKey Nomad-Browsererweiterung und erhalten Sie von vielen Webseiten einfachen Zugriff auf lizenzierte Volltexte oder Open Access Publikationen. Mehr erfahren...

Bulk dislocation core dissociation probed by coherent x rays in silicon

Physical review letters, 2011-02, Vol.106 (6), p.065502-065502, Article 065502

2011

Volltextzugriff (PDF)

Solid-state decomposition of silicon carbide for growing ultra-thin heteroepitaxial graphite films

Journal of applied physics, 2002-09, Vol.92 (5), p.2479-2484

2002

Volltextzugriff (PDF)

Geometrical and compositional structure at metal-oxide interfaces: MgO on Fe(001)

Physical review letters, 2001-08, Vol.87 (7), p.076102-076102, Article 076102

2001

Volltextzugriff (PDF)

Surface x-ray diffraction analysis of the MgO/Fe(001) interface: Evidence for an FeO layer

Physical review. B, Condensed matter, 2002-04, Vol.65 (14), Article 144433

2002

Volltextzugriff (PDF)

The hexagonal polar ZnO(0001)-(1×1) surfaces: structural features as stemming from X-ray diffraction

Applied surface science, 2000-08, Vol.162, p.69-73

2000

Volltextzugriff (PDF)

Growth and magnetic properties of vertically aligned epitaxial CoNi nanowires in (Sr, Ba)TiO 3 with diameters in the 1.8-6 nm range

Nanotechnology, 2016-12, Vol.27 (49), p.495601

2016

Volltextzugriff (PDF)

Atomic structure of the (3 × 2) Si–GaAs (0 0 1) reconstructed surface: A clue to δ doping mechanism derived from in situ grazing incidence X-ray diffraction data

Surface science, 2010-02, Vol.604 (3), p.415-419

2010

Volltextzugriff (PDF)

Measuring surface stress discontinuities in self-organized systems with X rays

Physical review letters, 2002-02, Vol.88 (5), p.056103-056103, Article 056103

2002

Volltextzugriff (PDF)

Commensurate and incommensurate phases at reconstructed (In,Ga)As(001) surfaces: x-ray diffraction evidence for a composition lock-in

Physical review letters, 1995-11, Vol.75 (19), p.3485-3488

1995

Volltextzugriff (PDF)

The ZnO non-polar (101̄0) surface: an X-ray structural investigation

Surface science, 2000-07, Vol.460 (1), p.136-143

2000

Volltextzugriff (PDF)

Asymmetric versus symmetric dimerization on the Si(001) and As/Si(001)2 × 1 reconstructed surfaces as observed by grazing incidence X-ray diffraction

Surface science, 1990-05, Vol.230 (1), p.197-204

1990

Volltextzugriff (PDF)

Sensitivity of X-ray diffractometry for strain depth profiling in III-V heterostructures

Journal of applied crystallography, 1987-06, Vol.20 (3), p.222-229

1987

Volltextzugriff (PDF)

In situ monitoring of the c( 4 × 4) to the 2 × 4 surface phase transformation on GaAs(001) by grazing incidence X-ray diffraction

Surface science, 1994-12, Vol.320 (3), p.252-258

1994

Volltextzugriff (PDF)

( 1 × 2 ) Bi chain reconstruction on the InAs(110) surface

Physical review. B, Condensed matter, 1999-06, Vol.59 (24), p.15760-15765

1999

Volltextzugriff (PDF)

Structural approach of the Fe-Si(1 1 1) annealed interface

Physica. B, Condensed matter, 1994-04, Vol.198 (1), p.48-54

1994

Volltextzugriff (PDF)

Fractional stoichiometry of the GaAs(001)c(4×) surface: an in-situ X-ray scattering study

Physical review letters, 1989-01, Vol.62 (5), p.563-566

1989

Volltextzugriff (PDF)

Atomic structure of the (2 x 4) In0.53Ga0.47As/InP(001) reconstructed surface. A study of average strain and growth temperature effects on the indium segregation

Surface science, 1999-04, Vol.425 (2-3), p.165-173

1999

Volltextzugriff (PDF)

X-Ray Photoelectron Spectroscopic Investigation of the GaAs Nitridation Mechanism with an ECR Plasma Source

Physica status solidi. A, Applied research, 1999-11, Vol.176 (1), p.671-676

1999

Volltextzugriff (PDF)

Atomic geometry and the probability distribution of self-assembled Cs nanowires at the InAs(110) surface

Physical review. B, Condensed matter, 2002-08, Vol.66 (8), Article 085335

2002

Volltextzugriff (PDF)

Hydrogen induced derelaxation on a MBE grown GaAs(110) surface

Surface science, 1994-04, Vol.307, p.662-667

1994

Volltextzugriff (PDF)

Influence of the interface layer on the strain relaxation of ZnSe epitaxial layers grown by MBE on (001)GaAs

Journal of physics. D, Applied physics, 1999-05, Vol.32 (10A), p.A51-A55

1999

Volltextzugriff (PDF)

Reconstruction and stoichiometry of CdTe(001) surfaces: a grazing incidence X-ray diffraction and reflection high energy electron diffraction study

Journal of crystal growth, 1996-02, Vol.159 (1-4), p.694-702

1996

Volltextzugriff (PDF)

X-ray diffraction evidence for transient composition effects in MOVPE multilayer growth for Ga1−xAlxAs alloys

Journal of applied crystallography, 1987-06, Vol.20 (3), p.230-234

1987

Volltextzugriff (PDF)

Two-layer behaviour during low-energy ion ablation of CdTe(001) studied by in situ X-ray diffraction and by Monte Carlo simulation

Europhysics letters, 1996-11, Vol.36 (4), p.271-276

1996

Volltextzugriff (PDF)

Heteroepitaxial growth of InAs on GaAs(100) mediated by Te at the interface

Solid state communications, 1995, Vol.95 (12), p.873-877

1995

Volltextzugriff (PDF)

1 – 25 von 81

Suche als RSS-Feed

Suchergebnisse filtern

Filter anzeigen

Nur zeigen

Geprüft (Peer-Review)
(55)
Mit Volltextzugriff
(79)

Publikationsform

Artikel
(76)
Tagungsberichte
(5)

Sprache

Erscheinungsjahr

n.n

Menü

Weitere Dienste

Einstellungen

Bulk dislocation core dissociation probed by coherent x rays in silicon

Solid-state decomposition of silicon carbide for growing ultra-thin heteroepitaxial graphite films

Geometrical and compositional structure at metal-oxide interfaces: MgO on Fe(001)

Surface x-ray diffraction analysis of the MgO/Fe(001) interface: Evidence for an FeO layer

The hexagonal polar ZnO(0001)-(1×1) surfaces: structural features as stemming from X-ray diffraction

Growth and magnetic properties of vertically aligned epitaxial CoNi nanowires in (Sr, Ba)TiO 3 with diameters in the 1.8-6 nm range

Atomic structure of the (3 × 2) Si–GaAs (0 0 1) reconstructed surface: A clue to δ doping mechanism derived from in situ grazing incidence X-ray diffraction data

Measuring surface stress discontinuities in self-organized systems with X rays

Commensurate and incommensurate phases at reconstructed (In,Ga)As(001) surfaces: x-ray diffraction evidence for a composition lock-in

The ZnO non-polar (101̄0) surface: an X-ray structural investigation

Asymmetric versus symmetric dimerization on the Si(001) and As/Si(001)2 × 1 reconstructed surfaces as observed by grazing incidence X-ray diffraction

Sensitivity of X-ray diffractometry for strain depth profiling in III-V heterostructures

In situ monitoring of the c( 4 × 4) to the 2 × 4 surface phase transformation on GaAs(001) by grazing incidence X-ray diffraction

( 1 × 2 ) Bi chain reconstruction on the InAs(110) surface

Structural approach of the Fe-Si(1 1 1) annealed interface

Fractional stoichiometry of the GaAs(001)c(4×) surface: an in-situ X-ray scattering study

Atomic structure of the (2 x 4) In0.53Ga0.47As/InP(001) reconstructed surface. A study of average strain and growth temperature effects on the indium segregation

X-Ray Photoelectron Spectroscopic Investigation of the GaAs Nitridation Mechanism with an ECR Plasma Source

Atomic geometry and the probability distribution of self-assembled Cs nanowires at the InAs(110) surface

Hydrogen induced derelaxation on a MBE grown GaAs(110) surface

Influence of the interface layer on the strain relaxation of ZnSe epitaxial layers grown by MBE on (001)GaAs

Reconstruction and stoichiometry of CdTe(001) surfaces: a grazing incidence X-ray diffraction and reflection high energy electron diffraction study

X-ray diffraction evidence for transient composition effects in MOVPE multilayer growth for Ga1−xAlxAs alloys

Two-layer behaviour during low-energy ion ablation of CdTe(001) studied by in situ X-ray diffraction and by Monte Carlo simulation

Heteroepitaxial growth of InAs on GaAs(100) mediated by Te at the interface

Suchergebnisse filtern