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Development of scanning capacitance force microscopy using the dissipative force modulation method

Measurement science & technology, 2020-03, Vol.31 (3), p.35904

2020

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A Nondestructive Method to Evaluate of DC-DC Converters Using Subsurface Magnetic Field Imaging with Pulse Width Modulation

IEEJ JOURNAL OF INDUSTRY APPLICATIONS, 2024-05, Vol.13 (3), p.301-307, Article 23009288

2024

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Evaluation of silicon carbide Schottky barrier diode within guard ring by multifunctional scanning probe microscopy

Japanese Journal of Applied Physics, 2020-08, Vol.59 (SN), p.SN1014

2020

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Cross-sectional observation in nanoscale for Si power MOSFET by atomic force microscopy/Kelvin probe force microscopy/scanning capacitance force microscopy

Japanese Journal of Applied Physics, 2019-08, Vol.58 (SI), p.SIIA04

2019

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Investigation of an n− layer in a silicon fast recovery diode under applied bias voltages using Kelvin probe force microscopy

Japanese Journal of Applied Physics, 2018-08, Vol.57 (8S1), p.8

2018

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Nanoscale investigation of bulk heterojunction organic solar cell by scanning capacitance force microscopy

Japanese Journal of Applied Physics, 2018-08, Vol.57 (8S1), p.8

2018

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Development of atomic force microscopy combined with scanning electron microscopy for investigating electronic devices

AIP advances, 2019-11, Vol.9 (11), p.115011-115011-8

2019

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Surface potential measurement of n-type organic semiconductor thin films by mist deposition via Kelvin probe microscopy

Japanese Journal of Applied Physics, 2017-08, Vol.56 (8S1), p.8

2017

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Nanoscale observation of organic thin film by atomic force microscopy

Japanese Journal of Applied Physics, 2017-08, Vol.56 (8S1), p.8

2017

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Evaluation of carrier concentration reduction in GaN-on-GaN wafers by Raman spectroscopy and Kelvin force microscopy

Japanese Journal of Applied Physics, 2017-08, Vol.56 (8S1), p.8

2017

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Optical and mechanical detection of near-field light by atomic force microscopy using a piezoelectric cantilever

Japanese Journal of Applied Physics, 2016-08, Vol.55 (8S1), p.8

2016

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Nanoscale liquid droplet deposition using the ultrasmall aperture on a dynamic mode AFM tip

Nanotechnology, 2011-04, Vol.22 (17), p.175301

2011

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Development of an Isolated Class-Φ22 DC-DC Converter with Bidirectional Operation

IEEJ JOURNAL OF INDUSTRY APPLICATIONS, 2024, Article 24008043

2024

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Surface Potential Measurement of Organic Multi-layered Films on Electrodes by Kelvin Probe Force Microscopy

IEICE transactions on electronics, 2015, Vol.E98.C (2), p.91-97

2015

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Surface potential measurement of fullerene/copper phthalocyanine films on indium tin oxide electrode by Kelvin probe force microscopy

Japanese Journal of Applied Physics, 2014-05, Vol.53 (5S1), p.5-1-05FY03-4

2014

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Near-field light detection by conservative and dissipative force modulation methods using a piezoelectric cantilever

Applied physics letters, 2010-06, Vol.96 (23), p.233104-233104-3

2010

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Scanning near-field optical microscopy system based on frequency-modulation atomic force microscopy using a piezoelectric cantilever

Japanese Journal of Applied Physics, 2014-12, Vol.53 (12), p.125201-1-125201-5

2014

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Surface Potential Investigation of Fullerene Derivative Film on Platinum Electrode under UV Irradiation by Kelvin Probe Force Microscopy Using a Piezoelectric Cantilever

e-Journal of Surface Science and Nanotechnology, 2015/03/21, Vol.13, pp.102-106

2015

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Surface Potential Measurement of Tris(8-hydroxyquinolinato)aluminum and Bis[N-(1-naphthyl)-N-phenyl]benzidine Thin Films Fabricated on Indium--Tin Oxide by Kelvin Probe Force Microscopy

Japanese Journal of Applied Physics, 2011-07, Vol.50 (7), p.071601-071601-4

2011

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Observation of Power MOSFET Composed of Silicon Carbide with a Planar Type in the Voltage Applying State Using a Scanning Probe Microscope

IEEJ transactions on sensors and micromachines, 2021-10, Vol.141 (10), p.349-355

2021

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Investigation of the depletion layer by scanning capacitance force microscopy with Kelvin probe force microscopy

Japanese Journal of Applied Physics, 2016-08, Vol.55 (8S1), p.8

2016

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Observation of silicon carbide Schottky barrier diode under applied reverse bias using atomic force microscopy/Kelvin probe force microscopy/scanning capacitance force microscopy

Japanese Journal of Applied Physics, 2017-08, Vol.56 (8S1), p.8

2017

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Multi-Probe Atomic Force Microscopy with Optical Beam Deflection Method

Japanese Journal of Applied Physics, 2007-08, Vol.46 (8S), p.5636

2007

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Multi-Probe Atomic Force Microscopy Using Piezo-Resistive Cantilevers and Interaction between Probes

e-Journal of Surface Science and Nanotechnology, 2013/01/26, Vol.11, pp.13-17

2013

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Surface Potential Measurement of Tris(8-hydroxyquinolinato)aluminum and Bis[ N -(1-naphthyl)- N -phenyl]benzidine Thin Films Fabricated on Indium–Tin Oxide by Kelvin Probe Force Microscopy

Japanese Journal of Applied Physics, 2011-07, Vol.50 (7R), p.71601

2011

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Development of scanning capacitance force microscopy using the dissipative force modulation method

A Nondestructive Method to Evaluate of DC-DC Converters Using Subsurface Magnetic Field Imaging with Pulse Width Modulation

Evaluation of silicon carbide Schottky barrier diode within guard ring by multifunctional scanning probe microscopy

Cross-sectional observation in nanoscale for Si power MOSFET by atomic force microscopy/Kelvin probe force microscopy/scanning capacitance force microscopy

Investigation of an n− layer in a silicon fast recovery diode under applied bias voltages using Kelvin probe force microscopy

Nanoscale investigation of bulk heterojunction organic solar cell by scanning capacitance force microscopy

Development of atomic force microscopy combined with scanning electron microscopy for investigating electronic devices

Surface potential measurement of n-type organic semiconductor thin films by mist deposition via Kelvin probe microscopy

Nanoscale observation of organic thin film by atomic force microscopy

Evaluation of carrier concentration reduction in GaN-on-GaN wafers by Raman spectroscopy and Kelvin force microscopy

Optical and mechanical detection of near-field light by atomic force microscopy using a piezoelectric cantilever

Nanoscale liquid droplet deposition using the ultrasmall aperture on a dynamic mode AFM tip

Development of an Isolated Class-Φ22 DC-DC Converter with Bidirectional Operation

Surface Potential Measurement of Organic Multi-layered Films on Electrodes by Kelvin Probe Force Microscopy

Surface potential measurement of fullerene/copper phthalocyanine films on indium tin oxide electrode by Kelvin probe force microscopy

Near-field light detection by conservative and dissipative force modulation methods using a piezoelectric cantilever

Scanning near-field optical microscopy system based on frequency-modulation atomic force microscopy using a piezoelectric cantilever

Surface Potential Investigation of Fullerene Derivative Film on Platinum Electrode under UV Irradiation by Kelvin Probe Force Microscopy Using a Piezoelectric Cantilever

Surface Potential Measurement of Tris(8-hydroxyquinolinato)aluminum and Bis[N-(1-naphthyl)-N-phenyl]benzidine Thin Films Fabricated on Indium--Tin Oxide by Kelvin Probe Force Microscopy

Observation of Power MOSFET Composed of Silicon Carbide with a Planar Type in the Voltage Applying State Using a Scanning Probe Microscope

Investigation of the depletion layer by scanning capacitance force microscopy with Kelvin probe force microscopy

Observation of silicon carbide Schottky barrier diode under applied reverse bias using atomic force microscopy/Kelvin probe force microscopy/scanning capacitance force microscopy

Multi-Probe Atomic Force Microscopy with Optical Beam Deflection Method

Multi-Probe Atomic Force Microscopy Using Piezo-Resistive Cantilevers and Interaction between Probes

Surface Potential Measurement of Tris(8-hydroxyquinolinato)aluminum and Bis[ N -(1-naphthyl)- N -phenyl]benzidine Thin Films Fabricated on Indium–Tin Oxide by Kelvin Probe Force Microscopy

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