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Lattice imaging at an accelerating voltage of 30kV using an in-lens type cold field-emission scanning electron microscope

Ultramicroscopy, 2014-10, Vol.145, p.28-35

2014

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Properties of the imaging performance of an electron optical system for SEM

Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 2011-07, Vol.645 (1), p.74-78

Sato, Mitsugu

2011

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Evaluation Method of Image Sharpness of Scanning Electron Microscope (SEM)

Journal of the Japan Society for Precision Engineering, 2013/11/05, Vol.79(11), pp.1009-1012

SATO, Mitsugu

2013

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Evaluation method of image resolution for the aberration-corrected STEM

Microscopy and microanalysis, 2021-08, Vol.27 (S1), p.1594-1595

2021

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Prevalence of insomnia in various psychiatric diagnostic categories

Psychiatry and clinical neurosciences, 2002-06, Vol.56 (3), p.239-240

2002

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International Standardization of Evaluation Methods of Image Sharpness for Scanning Electron Microscope

Eizō Jōhō Media Gakkaishi, 2013, Vol.67 (2), p.141-143

Sato, Mitsugu

2013

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Influence of random noise on the contrast-to-gradient image resolution in scanning electron microscopy

Journal of electron microscopy, 2005-04, Vol.54 (2), p.85-97

2005

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Beam Characterization for Scanning Electron Microscopes by the RPS and IPC Methods

Microscopy and microanalysis, 2015-06, Vol.21 (S4), p.54-59

2015

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Beam characteristics for various sizes of annular aperture on scanning electron microscope

Ultramicroscopy, 2001-08, Vol.88 (3), p.151-170

2001

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走査電子顕微鏡 (SEM) の像シャープネス評価法

精密工学会誌, 2013/11/05, Vol.79(11), pp.1009-1012

佐藤, 貢

2013

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Relation between optimal focus condition and a pixel size or an image magnification in a digital SEM

Physics procedia, 2008, Vol.1 (1), p.127-133

2008

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FIP's Environmentally Conscious Solutions and GOSAT

Fujitsu scientific & technical journal, 2009-01, Vol.45 (1), p.134-140

2009

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Electron Microscope

Journal of the Society of Mechanical Engineers, 2014, Vol.117 (1144), p.142-143

SATO, Mitsugu

2014

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Evaluation of both image resolution and contrast-to-noise ratio in scanning electron microscopy

Journal of electron microscopy, 2007-08, Vol.56 (4), p.145-151

2007

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Contrast-to-gradient method for the evaluation of image resolution in scanning electron microscopy

Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 2004-02, Vol.519 (1), p.251-263

2004

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Evaluation of depth of field in SEM images in terms of the information-passing capacity (IPC) and contrast gradient in SEM image

Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 2004-02, Vol.519 (1), p.280-285

2004

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Influence of a combination of random noise and pattern-edge width (in pixels) on contrast-to-gradient image resolution in scanning electron microscopy

Journal of electron microscopy, 2006-10, Vol.55 (5), p.253-260

2006

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Contrast-to-gradient method for the evaluation of image resolution taking account of random noise in scanning electron microscopy

Journal of electron microscopy, 2004-06, Vol.53 (3), p.245-255

2004

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Contrast‐to‐gradient method for the evaluation of image resolution in scanning electron microscopy

Journal of electron microscopy, 2002-01, Vol.51 (6), p.369-382

2002

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A method for personal expertise-independent evaluation of image resolution in scanning electron microscopy

Scanning, 2002-07, Vol.24 (4), p.191-203

2002

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New concept of information resolution in scanning electron microscope images

Ultramicroscopy, 2000-08, Vol.84 (3), p.199-211

2000

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Low voltage FE‐STEM for characterization of state‐of‐the‐art silicon SRAM

Journal of electron microscopy, 2002-03, Vol.51 (1), p.53-57

2002

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Development of an Ultra-High Resolution In-Lens FESEM

Microscopy and microanalysis, 2000-08, Vol.6 (S2), p.748-749

2000

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SE and BSE Information from CNT Containing Fe at Various Accelerating Voltages

Microscopy and microanalysis, 2004-08, Vol.10 (S02), p.950-951

2004

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Development of FE‐SEM Technologies for Life Science Fields

Biological Field Emission Scanning Electron Microscopy, 2019, p.25-51

2019

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Lattice imaging at an accelerating voltage of 30kV using an in-lens type cold field-emission scanning electron microscope

Properties of the imaging performance of an electron optical system for SEM

Evaluation Method of Image Sharpness of Scanning Electron Microscope (SEM)

Evaluation method of image resolution for the aberration-corrected STEM

Prevalence of insomnia in various psychiatric diagnostic categories

International Standardization of Evaluation Methods of Image Sharpness for Scanning Electron Microscope

Influence of random noise on the contrast-to-gradient image resolution in scanning electron microscopy

Beam Characterization for Scanning Electron Microscopes by the RPS and IPC Methods

Beam characteristics for various sizes of annular aperture on scanning electron microscope

走査電子顕微鏡 (SEM) の像シャープネス評価法

Relation between optimal focus condition and a pixel size or an image magnification in a digital SEM

FIP's Environmentally Conscious Solutions and GOSAT

Electron Microscope

Evaluation of both image resolution and contrast-to-noise ratio in scanning electron microscopy

Contrast-to-gradient method for the evaluation of image resolution in scanning electron microscopy

Evaluation of depth of field in SEM images in terms of the information-passing capacity (IPC) and contrast gradient in SEM image

Influence of a combination of random noise and pattern-edge width (in pixels) on contrast-to-gradient image resolution in scanning electron microscopy

Contrast-to-gradient method for the evaluation of image resolution taking account of random noise in scanning electron microscopy

Contrast‐to‐gradient method for the evaluation of image resolution in scanning electron microscopy

A method for personal expertise-independent evaluation of image resolution in scanning electron microscopy

New concept of information resolution in scanning electron microscope images

Low voltage FE‐STEM for characterization of state‐of‐the‐art silicon SRAM

Development of an Ultra-High Resolution In-Lens FESEM

SE and BSE Information from CNT Containing Fe at Various Accelerating Voltages

Development of FE‐SEM Technologies for Life Science Fields

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