Sortiert nach
Computational materials science, 2010-10, Vol.49 (4), p.S235-S238
2010
Link zum Volltext
IEEE journal of the Electron Devices Society, 2016-11, Vol.4 (6), p.459-465
2016
Link zum Volltext
Microelectronic engineering, 2009-04, Vol.86 (4), p.761-764
2009
Link zum Volltext
IEEE electron device letters, 2008-12, Vol.29 (12), p.1367-1369
2008
- Link zum Volltext
Microelectronics and reliability, 2019-09, Vol.100-101, p.113318, Article 113318
2019
Link zum Volltext
Microelectronics and reliability, 2018-09, Vol.88-90, p.147-151
2018
Link zum Volltext
Microelectronics and reliability, 2017-09, Vol.76-77, p.136-140
2017
Link zum Volltext
Microelectronics and reliability, 2008-08, Vol.48 (8), p.1139-1143
2008
Link zum Volltext
IEEE electron device letters, 2010-06, Vol.31 (6), p.528-530
2010
- Link zum Volltext
Microelectronic engineering, 2017-06, Vol.177, p.13-18
2017
Link zum Volltext
2020 IEEE International Reliability Physics Symposium (IRPS), 2020, p.1-6
2020
- Link zum Volltext
Journal of micromechanics and microengineering, 2009-06, Vol.19 (6), p.065012-065012 (7)
2009
Link zum Volltext
2019 IEEE International Integrated Reliability Workshop (IIRW), 2019, p.1-4
2019
- Link zum Volltext
2016 IEEE International Integrated Reliability Workshop (IIRW), 2016, p.65-68
2016
- Link zum Volltext
IEEE journal of solid-state circuits, 2007-03, Vol.42 (3), p.540-550
2007
- Link zum Volltext
2016 International Conference on Microelectronic Test Structures (ICMTS), 2016, p.10-14
2016
- Link zum Volltext
Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 2011-05, Vol.633, p.S194-S197
2011
Link zum Volltext
IEEE electron device letters, 2008-06, Vol.29 (6), p.585-587
2008
- Link zum Volltext
2013 IEEE International Conference on Microelectronic Test Structures (ICMTS), 2013, p.53-58
2013
- Link zum Volltext
Journal of applied physics, 2003-10, Vol.94 (7), p.4296-4305
2003
Link zum Volltext
New journal of chemistry, 2008, Vol.32 (4), p.652
2008
Link zum Volltext
IEEE transactions on electron devices, 2004-06, Vol.51 (6), p.1017-1024
2004
- Link zum Volltext
IEEE electron device letters, 2005-10, Vol.26 (10), p.764-766
2005
- Link zum Volltext
Microelectronics and reliability, 2007-04, Vol.47 (4), p.577-580
2007
Link zum Volltext
IEEE transactions on electron devices, 2000-04, Vol.47 (4), p.848-855
2000
- Link zum Volltext
Suchergebnisse filtern
Filter anzeigenNur zeigen
Publikationsform
Erscheinungsjahr
n.n
n.n
Thema
- Science & Technology
- Technology
- Engineering
- Engineering, Electrical & Electronic
- Physical Sciences
- Physics
- Physics, Applied
- Applied Sciences
- Electronics
- Exact Sciences And Technology
- Nanoscience & Nanotechnology
- Science & Technology - Other Topics
- Semiconductor Electronics. Microelectronics. Optoelectronics. Solid State Devices
- Design. Technologies. Operation Analysis. Testing
- Devices
- Integrated Circuits
- Transistors
- Capacitance
- Fabrication
- Frequency Measurement
Kollektion
Zeitschrift / Serie
- Microelectronics And Reliability
- Ieee Electron Device Letters
- Ieee Transactions On Electron Devices
- Microelectronic Engineering
- Computational Materials Science
- Ieee Journal Of Solid-State Circuits
- Ieee Journal Of The Electron Devices Society
- Ieee Transactions On Device And Materials Reliability
- Journal Of Applied Physics
- Journal Of Micromechanics And Microengineering