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A New Defect Etch for Polycrystalline Silicon

Journal of the Electrochemical Society, 1984-03, Vol.131 (3), p.667-672

Sopori, B. L.

1984

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Hydrogen in silicon: A discussion of diffusion and passivation mechanisms

Solar energy materials and solar cells, 1996, Vol.41, p.159-169

1996

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Use of optical scattering to characterize dislocations in semiconductors

Applied Optics, 1988-11, Vol.27 (22), p.4676

Sopori, B. L.

1988

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The Principle of Dislocation Analysis by Coherent Optical Scattering from a Defect‐Etched Surface

Journal of the Electrochemical Society, 1988-10, Vol.135 (10), p.2601-2606

Sopori, B. L.

1988

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Fabrication of diode arrays for photovoltaic characterization of silicon substrates

Applied physics letters, 1988-05, Vol.52 (20), p.1718-1720

SOPORI, B. L

1988

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Atomic force microscopy study of FG-annealed and PECVD silicon nitride AR-coated silicon solar cells

Renewable energy, 1995-07, Vol.6 (5), p.589-591

1995

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Broadband very low reflectance surface

Applied Optics, 1988-01, Vol.27 (1), p.25

Sopori, B. L.

1988

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A backside hydrogenation technique for defect passivation in silicon solar cells

Journal of applied physics, 1988-11, Vol.64 (10), p.5264-5266

SOPORI, B. L

1988

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Principle of a new reflectometer for measuring dielectric film thickness on substrates of arbitrary surface characteristics

Review of scientific instruments, 1988-05, Vol.59 (5), p.725-727

Sopori, B. L.

1988

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Optical Losses in Amorphous Silicon Solar Cells due to Back Reflectors

MRS proceedings, 1997, Vol.467, p.777-782, Article 777

1997

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A Rapid Wax Mounting Technique for Cross‐Sectioning and Angle Polishing Metallographic Samples

Journal of the Electrochemical Society, 1989-01, Vol.136 (1), p.287-291

1989

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Reflectance calculations of alkaline textured multicrystalline silicon: a new approach

Emerging materials research, 2014-02, Vol.3 (1), p.10-18

2014

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Measurement of high boron concentrations in silicon by infrared spectroscopy

Applied physics letters, 1985-01, Vol.47 (1), p.39-41

SOPORI, B. L

1985

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Applications of Scanning Defect Mapping System for Semiconductor Characterization

MRS proceedings, 1995, Vol.378, p.579-583, Article 579

1995

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On the Mechanism of Hydrogen Diffusion in Si Solar Cells Using PECVD SiN:H

MRS proceedings, 2004, Vol.813, Article H6.2

2004

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Observation of enhanced hydrogen diffusion in solar cell silicon

Applied physics letters, 1992-11, Vol.61 (21), p.2560-2562

1992

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Optical diffraction technique for determination of crystal orientations

Applied Optics, 1981-05, Vol.20 (10), p.1758

Sopori, B. L.

1981

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Damage‐Free Polishing of Polycrystalline Silicon

Journal of the Electrochemical Society, 1981-01, Vol.128 (1), p.215-218

1981

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A comparison of gettering in single- and multicrystalline silicon for solar cells

Conference Record of the Twenty Fifth IEEE Photovoltaic Specialists Conference - 1996, 1996, p.625-628

1996

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Characteristics of HEM silicon produced in a reusable crucible

Conference Record of the Twenty Third IEEE Photovoltaic Specialists Conference - 1993 (Cat. No.93CH3283-9), 1993, p.73-77

1993

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Reflection characteristics of textured polycrystalline silicon substrates for solar cells

Solar cells, 1988-10, Vol.25 (1), p.15-26

Sopori, B.L.

1988

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Studies on the use of liquid surface passivation for lifetime measurements on good-quality silicon wafers

2011 37th IEEE Photovoltaic Specialists Conference, 2011, p.001647-001651

2011

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Optimization of antireflection coating thickness for textured polycrystalline silicon solar cells — an experimental study

Solar cells, 1990-04, Vol.28 (3), p.253-260

Sopori, B.L.

1990

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Detection of hairline cracks in textured silicon solar cells

Applied Optics, 1979-03, Vol.18 (5), p.605

1979

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Efficient optical waveguide coupler

Applied Optics, 1980-03, Vol.19 (5), p.790

1980

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A New Defect Etch for Polycrystalline Silicon

Hydrogen in silicon: A discussion of diffusion and passivation mechanisms

Use of optical scattering to characterize dislocations in semiconductors

The Principle of Dislocation Analysis by Coherent Optical Scattering from a Defect‐Etched Surface

Fabrication of diode arrays for photovoltaic characterization of silicon substrates

Atomic force microscopy study of FG-annealed and PECVD silicon nitride AR-coated silicon solar cells

Broadband very low reflectance surface

A backside hydrogenation technique for defect passivation in silicon solar cells

Principle of a new reflectometer for measuring dielectric film thickness on substrates of arbitrary surface characteristics

Optical Losses in Amorphous Silicon Solar Cells due to Back Reflectors

A Rapid Wax Mounting Technique for Cross‐Sectioning and Angle Polishing Metallographic Samples

Reflectance calculations of alkaline textured multicrystalline silicon: a new approach

Measurement of high boron concentrations in silicon by infrared spectroscopy

Applications of Scanning Defect Mapping System for Semiconductor Characterization

On the Mechanism of Hydrogen Diffusion in Si Solar Cells Using PECVD SiN:H

Observation of enhanced hydrogen diffusion in solar cell silicon

Optical diffraction technique for determination of crystal orientations

Damage‐Free Polishing of Polycrystalline Silicon

A comparison of gettering in single- and multicrystalline silicon for solar cells

Characteristics of HEM silicon produced in a reusable crucible

Reflection characteristics of textured polycrystalline silicon substrates for solar cells

Studies on the use of liquid surface passivation for lifetime measurements on good-quality silicon wafers

Optimization of antireflection coating thickness for textured polycrystalline silicon solar cells — an experimental study

Detection of hairline cracks in textured silicon solar cells

Efficient optical waveguide coupler

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