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An annealing algorithm to correct positioning errors in ptychography

Ultramicroscopy, 2012-09, Vol.120, p.64-72

2012

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Quantitative electron phase imaging with high sensitivity and an unlimited field of view

Scientific reports, 2015-10, Vol.5 (1), p.14690-14690, Article 14690

2015

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Nano-scale Strain Mapping Using Advanced STEM with a Direct Electron Detector

Microscopy and microanalysis, 2014-08, Vol.20 (S3), p.1046-1047

2014

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Nanoanalysis of a sub-nanometre reaction layer in a metal inserted high-k gate stack

Microelectronic engineering, 2011-07, Vol.88 (7), p.1488-1491

2011

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Atomic resolution transmission imaging at 30keV via electron ptychography

Microscopy and microanalysis, 2012-07, Vol.18 (S2), p.1024-1025

2012

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Using Nion Swift for Data Collection, Analysis and Display

Microscopy and microanalysis, 2014-08, Vol.20 (S3), p.1108-1109

2014

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Analysing interface reactions using EELS

Journal of physics. Conference series, 2012-01, Vol.371 (1), p.12008-4

2012

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Electron Ptychography: Applications Of The Electron Wave Phase

Microscopy and microanalysis, 2012-07, Vol.18 (S2), p.502-503

2012

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High-Precision Chemical Analysis and Structural Determination of Functional Oxides by STEM-EELS

Microscopy and microanalysis, 2013-08, Vol.19 (S2), p.1918-1919

2013

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Defects in Two Dimensional Crystals: An Ultra-high Resolution Aberration-corrected Electron Microscopy Study

Microscopy and microanalysis, 2013-08, Vol.19 (S2), p.618-619

2013

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Statistical Analysis of Point Defects in Hydrogen Storage Materials

Microscopy and microanalysis, 2009-07, Vol.15 (S2), p.462-463

2009

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Microstructure analyses and thermoelectric properties of Ag1−xPb18Sb1+yTe20

Journal of solid state chemistry, 2012-09, Vol.193, p.58-63

2012

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Morphology Effects on Photocatalytic Activity of Niobate Materials

Microscopy and microanalysis, 2008-08, Vol.14 (S2), p.338-339

2008

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Evidence for boron diffusion into sub-stoichiometric MgO (001) barriers in CoFeB/MgO-based magnetic tunnel junctions

Journal of applied physics, 2013-04, Vol.113 (16)

2013

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Quantitative Crystallographic and Statistical Image Processing for Materials Science in Scanning Transmission Electron Microscopy

Microscopy and microanalysis, 2013-08, Vol.19 (S2), p.772-773

2013

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Microstructure analyses and thermoelectric properties of Ag1-xPb18Sb1+yTe20Ag1-xPb18Sb1+yTe20

Journal of solid state chemistry, 2012-09, Vol.193, p.58-63

2012

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Microstructure analyses and thermoelectric properties of Ag 1 − x Pb 18 Sb 1 + y Te 20

Journal of solid state chemistry, 2012-09, Vol.193, p.58-63

2012

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Hydrogen Analysis by Ultra-High Energy Resolution EELS

Microscopy and microanalysis, 2015-08, Vol.21 (S3), p.661-662

2015

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Interfacial Atomic Structure and Chemistry at Ceria Grain Boundaries

Microscopy and microanalysis, 2011-07, Vol.17 (S2), p.1248-1249

2011

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Microstructure analyses and thermoelectric properties of Ag1―xPb18Sb1+yTe20: Solid State Chemistry and Materials Science of Thermoelectric Materials

Journal of solid state chemistry, 2012, Vol.193, p.58-63

2012

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Quantifying stoichiometry-induced variations in structure and energy of a SrTiO sub(3) symmetric capital sigma 13 {510}/ grain boundary

Philosophical magazine (Abingdon, England), 2013-04, Vol.93 (10-12), p.1219-1229

2013

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Quantifying stoichiometry-induced variations in structure and energy of a SrTiO3 symmetric Σ13 {510}/ grain boundary: Celebrating the career of Jany Thibault-Penisson in the microscopy of defects and interfaces

Philosophical magazine (Abingdon, England), 2013, Vol.93 (10-12), p.1219-1229

2013

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Microstructure analyses and thermoelectric properties of Ag{sub 1-x}Pb{sub 18}Sb{sub 1+y}Te{sub 20}

Journal of solid state chemistry, 2012-09, Vol.193

2012

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Novel Multivariate Statistical Analysis Methods for STEM/EELS

Microscopy and microanalysis, 2011-07, Vol.17 (S2), p.1306-1307

2011

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Atomic-scale Interaction Dynamics in Few-layer Hexagonal Boron Nitride (h-BN)

Microscopy and microanalysis, 2011-07, Vol.17 (S2), p.1258-1259

2011

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An annealing algorithm to correct positioning errors in ptychography

Quantitative electron phase imaging with high sensitivity and an unlimited field of view

Nano-scale Strain Mapping Using Advanced STEM with a Direct Electron Detector

Nanoanalysis of a sub-nanometre reaction layer in a metal inserted high-k gate stack

Atomic resolution transmission imaging at 30keV via electron ptychography

Using Nion Swift for Data Collection, Analysis and Display

Analysing interface reactions using EELS

Electron Ptychography: Applications Of The Electron Wave Phase

High-Precision Chemical Analysis and Structural Determination of Functional Oxides by STEM-EELS

Defects in Two Dimensional Crystals: An Ultra-high Resolution Aberration-corrected Electron Microscopy Study

Statistical Analysis of Point Defects in Hydrogen Storage Materials

Microstructure analyses and thermoelectric properties of Ag1−xPb18Sb1+yTe20

Morphology Effects on Photocatalytic Activity of Niobate Materials

Evidence for boron diffusion into sub-stoichiometric MgO (001) barriers in CoFeB/MgO-based magnetic tunnel junctions

Quantitative Crystallographic and Statistical Image Processing for Materials Science in Scanning Transmission Electron Microscopy

Microstructure analyses and thermoelectric properties of Ag1-xPb18Sb1+yTe20Ag1-xPb18Sb1+yTe20

Microstructure analyses and thermoelectric properties of Ag 1 − x Pb 18 Sb 1 + y Te 20

Hydrogen Analysis by Ultra-High Energy Resolution EELS

Interfacial Atomic Structure and Chemistry at Ceria Grain Boundaries

Microstructure analyses and thermoelectric properties of Ag1―xPb18Sb1+yTe20: Solid State Chemistry and Materials Science of Thermoelectric Materials

Quantifying stoichiometry-induced variations in structure and energy of a SrTiO sub(3) symmetric capital sigma 13 {510}/ grain boundary

Quantifying stoichiometry-induced variations in structure and energy of a SrTiO3 symmetric Σ13 {510}/ grain boundary: Celebrating the career of Jany Thibault-Penisson in the microscopy of defects and interfaces

Microstructure analyses and thermoelectric properties of Ag{sub 1-x}Pb{sub 18}Sb{sub 1+y}Te{sub 20}

Novel Multivariate Statistical Analysis Methods for STEM/EELS

Atomic-scale Interaction Dynamics in Few-layer Hexagonal Boron Nitride (h-BN)

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