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Identification of oxide defects in semiconductor devices: A systematic approach linking DFT to rate equations and experimental evidence

Microelectronics and reliability, 2018-08, Vol.87, p.286-320

2018

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Adsorptive removal of fluoride using ionic liquid-functionalized chitosan – Equilibrium and mechanism studies

International journal of biological macromolecules, 2022-06, Vol.210, p.483-493

2022

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NBTI Degradation and Recovery in Analog Circuits: Accurate and Efficient Circuit-Level Modeling

IEEE transactions on electron devices, 2019-04, Vol.66 (4), p.1662-1668

2019

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IEEE_Xplore

Highly-stable black phosphorus field-effect transistors with low density of oxide traps

NPJ 2D materials and applications, 2017-12, Vol.1 (1), p.1-7, Article 23

2017

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Superior NBTI in High- k SiGe Transistors–Part I: Experimental

IEEE transactions on electron devices, 2017-05, Vol.64 (5), p.2092-2098

2017

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IEEE_Xplore

Superior NBTI in High-k SiGe Transistors-Part II: Theory

IEEE transactions on electron devices, 2017-05, Vol.64 (5), p.2099-2105

2017

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IEEE_Xplore

Mapping of CMOS FET degradation in bias space—Application to dram peripheral devices

Journal of vacuum science and technology. B, Nanotechnology & microelectronics, 2017-01, Vol.35 (1)

2017

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Variability-Aware DTCO Flow: Projections to N3 FinFET and Nanosheet 6T SRAM

2021 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), 2021, p.15-18

2021

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IEEE_Xplore

Quantum Mechanical Charge Trap Modeling to Explain BTI at Cryogenic Temperatures

2020 IEEE International Reliability Physics Symposium (IRPS), 2020, p.1-6

2020

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IEEE_Xplore

Microscopic oxide defects causing BTI, RTN, and SILC on high-k FinFETs

2015 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), 2015, p.144-147

2015

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IEEE_Xplore

Characterization and modeling of reliability issues in nanoscale devices

2015 IEEE International Symposium on Circuits and Systems (ISCAS), 2015, p.2445-2448

2015

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IEEE_Xplore

Expanding TCAD simulations from grid to cloud

2015 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), 2015, p.186-189

2015

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IEEE_Xplore

Comphy — A compact-physics framework for unified modeling of BTI

Microelectronics and reliability, 2018-06, Vol.85, p.49-65

2018

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Charge feedback mechanisms at forward threshold voltage stress in GaN/AlGaN HEMTs

2015 IEEE International Integrated Reliability Workshop (IIRW), 2015, p.41-45

2015

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IEEE_Xplore

Novel amide derivatives of 1,3-dimethyl-2,6-dioxopurin-7-yl-alkylcarboxylic acids as multifunctional TRPA1 antagonists and PDE4/7 inhibitors: A new approach for the treatment of pain

European journal of medicinal chemistry, 2018-10, Vol.158, p.517-533

2018

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A systematic study of charge trapping in single-layer double-gated GFETs

2016 74th Annual Device Research Conference (DRC), 2016, p.1-2

2016

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Oxide and Interface Defect Analysis of lateral 4H-SiC MOSFETs through CV Characterization and TCAD Simulations

Materials science forum, 2023-05, Vol.1090, p.119-126

2023

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A brief overview of gate oxide defect properties and their relation to MOSFET instabilities and device and circuit time-dependent variability

Microelectronics and reliability, 2018-02, Vol.81, p.186-194

2018

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Performance and Leakage Analysis of Si and Ge NWFETs Using a Combined Subband BTE and WKB Approach

2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), 2020, p.63-66

2020

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IEEE_Xplore

Distribution of secondary minerals in crusts developed on sandstone exposures

Earth surface processes and landforms, 2014-03, Vol.39 (3), p.320-335

2014

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Understanding the ISPP Slope in Charge Trap Flash Memory and its Impact on 3-D NAND Scaling

2021 IEEE International Electron Devices Meeting (IEDM), 2021, p.1-4

2021

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IEEE_Xplore

The Mysterious Bipolar Bias Temperature Stress from the Perspective of Gate-Sided Hydrogen Release

2020 IEEE International Reliability Physics Symposium (IRPS), 2020, p.1-6

2020

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IEEE_Xplore

Utilization of bog iron ores as sorbents of heavy metals

Journal of hazardous materials, 2009-03, Vol.162 (2), p.1007-1013

2009

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Complete extraction of defect bands responsible for instabilities in n and pFinFETs

2016 IEEE Symposium on VLSI Technology, 2016, p.1-2

2016

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Preliminary study on application of impregnated synthetic peptide TLC stationary phases for the pre-screening of 5-HT1A ligands

Biomedical chromatography, 2003-07, Vol.17 (5), p.312-317

2003

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Identification of oxide defects in semiconductor devices: A systematic approach linking DFT to rate equations and experimental evidence

Adsorptive removal of fluoride using ionic liquid-functionalized chitosan – Equilibrium and mechanism studies

NBTI Degradation and Recovery in Analog Circuits: Accurate and Efficient Circuit-Level Modeling

Highly-stable black phosphorus field-effect transistors with low density of oxide traps

Superior NBTI in High- k SiGe Transistors–Part I: Experimental

Superior NBTI in High-k SiGe Transistors-Part II: Theory

Mapping of CMOS FET degradation in bias space—Application to dram peripheral devices

Variability-Aware DTCO Flow: Projections to N3 FinFET and Nanosheet 6T SRAM

Quantum Mechanical Charge Trap Modeling to Explain BTI at Cryogenic Temperatures

Microscopic oxide defects causing BTI, RTN, and SILC on high-k FinFETs

Characterization and modeling of reliability issues in nanoscale devices

Expanding TCAD simulations from grid to cloud

Comphy — A compact-physics framework for unified modeling of BTI

Charge feedback mechanisms at forward threshold voltage stress in GaN/AlGaN HEMTs

Novel amide derivatives of 1,3-dimethyl-2,6-dioxopurin-7-yl-alkylcarboxylic acids as multifunctional TRPA1 antagonists and PDE4/7 inhibitors: A new approach for the treatment of pain

A systematic study of charge trapping in single-layer double-gated GFETs

Oxide and Interface Defect Analysis of lateral 4H-SiC MOSFETs through CV Characterization and TCAD Simulations

A brief overview of gate oxide defect properties and their relation to MOSFET instabilities and device and circuit time-dependent variability

Performance and Leakage Analysis of Si and Ge NWFETs Using a Combined Subband BTE and WKB Approach

Distribution of secondary minerals in crusts developed on sandstone exposures

Understanding the ISPP Slope in Charge Trap Flash Memory and its Impact on 3-D NAND Scaling

The Mysterious Bipolar Bias Temperature Stress from the Perspective of Gate-Sided Hydrogen Release

Utilization of bog iron ores as sorbents of heavy metals

Complete extraction of defect bands responsible for instabilities in n and pFinFETs

Preliminary study on application of impregnated synthetic peptide TLC stationary phases for the pre-screening of 5-HT1A ligands

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