UB Paderborn / Katalog / Suche / in CDI

Sortiert nach

Einfacher Volltextzugriff von (fast) überall

Installieren Sie die LibKey Nomad-Browsererweiterung und erhalten Sie von vielen Webseiten einfachen Zugriff auf lizenzierte Volltexte oder Open Access Publikationen. Mehr erfahren...

Studies of photoconductance decay method for characterization of near-surface electrical properties of semiconductors

Thin solid films, 2011-09, Vol.519 (22), p.7621-7626

2011

Volltextzugriff (PDF)

Measurement of effective carrier lifetime at the semiconductor–dielectric interface by Photoconductive Decay (PCD) Method

Solid-state electronics, 2013-03, Vol.81, p.130-134

2013

Volltextzugriff (PDF)

Characterization of near-surface electrical properties of multi-crystalline silicon wafers

Solid-state electronics, 2011, Vol.55 (1), p.29-36

2011

Volltextzugriff (PDF)

Stable Binary Complementary White Light-Emitting Diodes Based on Quantum-Dot/Polymer-Bilayer Structures

IEEE photonics technology letters, 2008-12, Vol.20 (23), p.1998-2000

2008

Volltextzugriff (PDF)

Studies of Hf(Si,O) dielectrics for metal-oxide-semiconductor applications

Thin solid films, 2007-02, Vol.515 (7), p.3802-3805

2007

Volltextzugriff (PDF)

Studies of mist deposition in the fabrication of blue organic light emitting diodes

Semiconductor science and technology, 2008-07, Vol.23 (7), p.075036

2008

Volltextzugriff (PDF)

Studies of mist deposition for the formation of quantum dot CdSe films

Semiconductor science and technology, 2009-10, Vol.24 (10), p.105024-105024 (5)

2009

Volltextzugriff (PDF)

Studies of solution processed metal oxides on silicon

Microelectronic engineering, 2007-09, Vol.84 (9), p.2294-2297

2007

Volltextzugriff (PDF)

Photoconductance Decay Characterization of 3D Multi-Fin Silicon on SOI Substrates

IEEE electron device letters, 2017-11, Vol.38 (11), p.1513-1515

2017

Volltextzugriff (PDF)

Effect of VUV Lamp on Wafer Charging by Single-Wafer Wet Clean

ECS transactions, 2017, Vol.80 (2), p.81-89

2017

Volltextzugriff (PDF)

Nano-Structures Stiction Suppression by Molecular Structure Optimized Surface Energy Reduction Agent

ECS transactions, 2017, Vol.80 (2), p.53-60

2017

Volltextzugriff (PDF)

Ruzyllo On Transistor (R)evolution and its Multidisciplinary Nature

IEEE potentials, 2012-03, Vol.31 (2), p.6-7

Ruzyllo, J.

2012

Volltextzugriff (PDF)

Study of Copper Surface Preparation by Sequential Atomic Layer Wet Etching and Laser Annealing Treatments

ECS transactions, 2017, Vol.80 (2), p.233-241

2017

Volltextzugriff (PDF)

Electrical Characterization of Silicon-on-Insulator Wafers Using Photo-Conductance Decay (PCD) Method

ECS journal of solid state science and technology, 2016-01, Vol.5 (4), p.P3069-P3072

2016

Volltextzugriff (PDF)

An Accurate Method for Determining Pattern Collapse Occurrence for Nano-Structures

ECS transactions, 2017, Vol.80 (2), p.61-69

2017

Volltextzugriff (PDF)

Reduced Anisotropy in Tetramethylammonium Hydroxide Based Silicon Etchants

ECS transactions, 2017, Vol.80 (2), p.243-247

2017

Volltextzugriff (PDF)

Deep Trenches Cleanliness Challenges for CMOS Image Sensors

ECS transactions, 2017, Vol.80 (2), p.101-109

2017

Volltextzugriff (PDF)

Advanced Wafer Drying Technology for 1x Node and Beyond Using Surface Modification Method

ECS transactions, 2013, Vol.58 (6), p.191-196

2013

Volltextzugriff (PDF)

Stability of SiGe(100) Surfaces after Ammonium Sulfide Passivation

ECS transactions, 2017, Vol.80 (2), p.147-153

2017

Volltextzugriff (PDF)

The Impact of Dummy Gate Processing on Si-Cap-Free SiGe Passivation: A Physical Characterization Study on Strained SiGe 25% and 45

ECS transactions, 2017, Vol.80 (2), p.155-162

2017

Volltextzugriff (PDF)

Surface Treatment Method and Its Metrology for Preventing Pattern Collapse

ECS transactions, 2017, Vol.80 (2), p.37-42

2017

Volltextzugriff (PDF)

Room Temperature Photoluminescence Characterization of Silicon Wafers for In-Line Monitoring Applications

ECS transactions, 2017, Vol.80 (2), p.111-118

2017

Volltextzugriff (PDF)

Study of SiGe Surface Cleaning

ECS transactions, 2017, Vol.80 (2), p.141-146

2017

Volltextzugriff (PDF)

Nickel Contamination from Caustic Etching of Silicon Wafers

ECS transactions, 2017-08, Vol.80 (2), p.223-232

Sinha, Drew

2017

Volltextzugriff (PDF)

1 – 25 von 467

Suche als RSS-Feed

Suchergebnisse filtern

Filter anzeigen

Nur zeigen

Geprüft (Peer-Review)
(254)
Mit Volltextzugriff
(221)

Publikationsform

Sprache

Englisch
(421)
Polnisch
(43)
Russisch
(2)
Spanisch
(1)

Erscheinungsjahr

n.n

Thema

15 weitere anzeigen...

Weniger anzeigen...

Menü

Weitere Dienste

Einstellungen

Studies of photoconductance decay method for characterization of near-surface electrical properties of semiconductors

Measurement of effective carrier lifetime at the semiconductor–dielectric interface by Photoconductive Decay (PCD) Method

Characterization of near-surface electrical properties of multi-crystalline silicon wafers

Stable Binary Complementary White Light-Emitting Diodes Based on Quantum-Dot/Polymer-Bilayer Structures

Studies of Hf(Si,O) dielectrics for metal-oxide-semiconductor applications

Studies of mist deposition in the fabrication of blue organic light emitting diodes

Studies of mist deposition for the formation of quantum dot CdSe films

Studies of solution processed metal oxides on silicon

(Invited) Challenges on Surface Conditioning in 3D Device Architectures: Triple-Gate FinFETs, Gate-All-Around Lateral and Vertical Nanowire FETs

Photoconductance Decay Characterization of 3D Multi-Fin Silicon on SOI Substrates

Effect of VUV Lamp on Wafer Charging by Single-Wafer Wet Clean

Nano-Structures Stiction Suppression by Molecular Structure Optimized Surface Energy Reduction Agent

Ruzyllo On Transistor (R)evolution and its Multidisciplinary Nature

Study of Copper Surface Preparation by Sequential Atomic Layer Wet Etching and Laser Annealing Treatments

Electrical Characterization of Silicon-on-Insulator Wafers Using Photo-Conductance Decay (PCD) Method

An Accurate Method for Determining Pattern Collapse Occurrence for Nano-Structures

Reduced Anisotropy in Tetramethylammonium Hydroxide Based Silicon Etchants

Deep Trenches Cleanliness Challenges for CMOS Image Sensors

Advanced Wafer Drying Technology for 1x Node and Beyond Using Surface Modification Method

Stability of SiGe(100) Surfaces after Ammonium Sulfide Passivation

The Impact of Dummy Gate Processing on Si-Cap-Free SiGe Passivation: A Physical Characterization Study on Strained SiGe 25% and 45

Surface Treatment Method and Its Metrology for Preventing Pattern Collapse

Room Temperature Photoluminescence Characterization of Silicon Wafers for In-Line Monitoring Applications

Study of SiGe Surface Cleaning

Nickel Contamination from Caustic Etching of Silicon Wafers

Suchergebnisse filtern