UB Paderborn / Katalog / Suche / in CDI

Sortiert nach

Einfacher Volltextzugriff von (fast) überall

Installieren Sie die LibKey Nomad-Browsererweiterung und erhalten Sie von vielen Webseiten einfachen Zugriff auf lizenzierte Volltexte oder Open Access Publikationen. Mehr erfahren...

Exact polynomial inversion for top transparent layer parameters on an arbitrary substrate in ellipsometry

Journal of physics. Condensed matter, 2008-07, Vol.20 (28), p.285225-285225(7)

2008

Volltextzugriff (PDF)

A Simple Method for Determination of the Density of Granular Materials

Physics education, 2012-03, Vol.47 (2), p.234-238

2012

Volltextzugriff (PDF)

Note: Simple vacuum feedthrough for optical fiber with SubMiniature version A connectors at both ends

Review of scientific instruments, 2014-07, Vol.85 (7)

2014

Volltextzugriff (PDF)

An experiment on a physical pendulum and Steiner's theorem

Physics education, 2010-01, Vol.45 (1), p.58-62

2010

Volltextzugriff (PDF)

Synthesis and characterization of RBaCo2O5+x (R = La, Nd, Gd, Y and Ho)

Journal of physics. Conference series, 2010, Vol.253 (1), p.012071

2010

Volltextzugriff (PDF)

Spectroscopic ellipsometry of SiO2/TiO2 multilayer periodic structure suitable for Ψ standard

Physica status solidi. C, 2008-05, Vol.5 (5), p.1156-1159

2008

Volltextzugriff (PDF)

Polynomial inversion of the single transparent layer problem in ellipsometry in case of multiple measurements

Physica status solidi. C, 2008-05, Vol.5 (5), p.1054-1058

2008

Volltextzugriff (PDF)

Fourier transform of delta compressed data

Review of scientific instruments, 2005-07, Vol.76 (7), p.075107-075107-4

2005

Volltextzugriff (PDF)

Spectroscopic Ellipsometry of Gold Clusters Embedded in Thin Dielectric Films

Sixth International Conference on Balkan Physical Union (AIP Conference Proceedings Volume 899), 2007, Vol.899, p.803-803

2007

Volltextzugriff (PDF)

Variable distance absolute reflectometry

Journal of the Optical Society of America. A, Optics, image science, and vision, 2012-07, Vol.29 (7), p.1417

2012

Volltextzugriff (PDF)

Standards for which the ellipsometric parameter Ψ remains insensitive to variations in the angle of incidence

Applied Optics, 1998-09, Vol.37 (25), p.5912

1998

Volltextzugriff (PDF)

Spectroscopic ellipsometry of SiO 2 /TiO 2 multilayer periodic structure suitable for Ψ standard

Physica status solidi. C, 2008-05, Vol.5 (5), p.1156-1159

2008

Volltextzugriff (PDF)

Analytical determination of the optical constants of a substrate in the presence of a covering layer by use of ellipsometric data

Journal of the Optical Society of America. A, Optics, image science, and vision, 1999-06, Vol.16 (6), p.1496

1999

Volltextzugriff (PDF)

Synthesis and characterization of RBaCo 2 O 5+ x (R = La, Nd, Gd, Y and Ho)

Journal of physics. Conference series, 2010-11, Vol.253, p.12071

2010

Volltextzugriff (PDF)

Fast algorithm for Fourier coefficient determination of the output signal of rotating element ellipsometers

Journal of optics, 1990-03, Vol.21 (2), p.77-79

1990

Volltextzugriff (PDF)

β-Casein adsorption kinetics on air–water and oil–water interfaces studied by ellipsometry

Colloids and surfaces, B, Biointerfaces, 2000-11, Vol.19 (1), p.89-100

2000

Volltextzugriff (PDF)

Simultaneous Thickness and Refractive Index Determination of Monolayers Deposited on an Aqueous Subphase by Null Ellipsometry

Langmuir, 2001-11, Vol.17 (24), p.7529-7534

2001

Volltextzugriff (PDF)

Analytical Solution of Another Ellipsometric Inverse Problem

Journal of modern optics, 1991-07, Vol.38 (7), p.1217-1222

1991

Volltextzugriff (PDF)

Monolayers of Globular Proteins on the Air/Water Interface: Applicability of the Volmer Equation of State

Langmuir, 2003-09, Vol.19 (18), p.7362-7369

2003

Volltextzugriff (PDF)

Raman spectroscopy and lattice-dynamical calculations of Sc sub(3)CrO sub(6) single crystals

Physical review. B, Condensed matter and materials physics, 2012-06, Vol.85 (21)

2012

Volltextzugriff (PDF)

Raman spectroscopy and lattice-dynamical calculations of Sc 3 CrO 6 single crystals

Physical review. B, Condensed matter and materials physics, 2012-06, Vol.85 (21), Article 214301

2012

Volltextzugriff (PDF)

Rotating analyzer–fixed analyzer ellipsometer based on null type ellipsometer

Review of scientific instruments, 1999-07, Vol.70 (7), p.3077-3082

1999

Volltextzugriff (PDF)

Representation of the transparent layer–arbitrary substrate system parameters through the Fourier coefficients of the ellipsometric function

Journal of the Optical Society of America. A, Optics, image science, and vision, 1999-02, Vol.16 (2), p.364

Russev, Stoyan C.

1999

Volltextzugriff (PDF)

Polynomial inversion of the single transparent layer problem in ellipsometry

Journal of the Optical Society of America. A, Optics, image science, and vision, 1994-12, Vol.11 (12), p.3284

1994

Volltextzugriff (PDF)

Polynomial solution for two thicknesses of a multilayer system from a single ellipsometric measurement

Journal of the Optical Society of America. A, Optics, image science, and vision, 1996-01, Vol.13 (1), p.152

1996

Volltextzugriff (PDF)

1 – 25 von 62

Suche als RSS-Feed

Suchergebnisse filtern

Filter anzeigen

Nur zeigen

Geprüft (Peer-Review)
(57)
Mit Volltextzugriff
(44)

Publikationsform

Artikel
(57)
Tagungsberichte
(5)

Sprache

Englisch
(60)
Französisch
(2)

Erscheinungsjahr

n.n

Thema

Science & Technology
(45)
Physical Sciences
(33)
Physics
(23)
Technology
(17)
Life Sciences & Biomedicine
(13)
Animals
(9)
Chemistry
(9)
Materials Science
(9)
Optics
(9)
Materials Science, Multidisciplinary
(8)
Physics, Applied
(8)
Humans
(6)
Biochemistry & Molecular Biology
(5)
Chemistry, Multidisciplinary
(5)
Chemistry, Physical
(5)
Ellipsometry
(5)
Male
(5)
Exact Sciences And Technology
(4)
Instruments & Instrumentation
(4)
Methods
(4)

15 weitere anzeigen...

Weniger anzeigen...

Menü

Weitere Dienste

Einstellungen

Exact polynomial inversion for top transparent layer parameters on an arbitrary substrate in ellipsometry

A Simple Method for Determination of the Density of Granular Materials

Note: Simple vacuum feedthrough for optical fiber with SubMiniature version A connectors at both ends

An experiment on a physical pendulum and Steiner's theorem

Synthesis and characterization of RBaCo2O5+x (R = La, Nd, Gd, Y and Ho)

Spectroscopic ellipsometry of SiO2/TiO2 multilayer periodic structure suitable for Ψ standard

Polynomial inversion of the single transparent layer problem in ellipsometry in case of multiple measurements

Fourier transform of delta compressed data

Spectroscopic Ellipsometry of Gold Clusters Embedded in Thin Dielectric Films

Variable distance absolute reflectometry

Standards for which the ellipsometric parameter Ψ remains insensitive to variations in the angle of incidence

Spectroscopic ellipsometry of SiO 2 /TiO 2 multilayer periodic structure suitable for Ψ standard

Analytical determination of the optical constants of a substrate in the presence of a covering layer by use of ellipsometric data

Synthesis and characterization of RBaCo 2 O 5+ x (R = La, Nd, Gd, Y and Ho)

Fast algorithm for Fourier coefficient determination of the output signal of rotating element ellipsometers

β-Casein adsorption kinetics on air–water and oil–water interfaces studied by ellipsometry

Simultaneous Thickness and Refractive Index Determination of Monolayers Deposited on an Aqueous Subphase by Null Ellipsometry

Analytical Solution of Another Ellipsometric Inverse Problem

Monolayers of Globular Proteins on the Air/Water Interface: Applicability of the Volmer Equation of State

Raman spectroscopy and lattice-dynamical calculations of Sc sub(3)CrO sub(6) single crystals

Raman spectroscopy and lattice-dynamical calculations of Sc 3 CrO 6 single crystals

Rotating analyzer–fixed analyzer ellipsometer based on null type ellipsometer

Representation of the transparent layer–arbitrary substrate system parameters through the Fourier coefficients of the ellipsometric function

Polynomial inversion of the single transparent layer problem in ellipsometry

Polynomial solution for two thicknesses of a multilayer system from a single ellipsometric measurement

Suchergebnisse filtern