UB Paderborn / Katalog / Suche / in CDI

1 – 25 von 105

Sortiert nach

Latency Dose Formation In DMC By Inelastic Electron Scattering

Microscopy and microanalysis, 2022-08, Vol.28 (S1), p.2216-2217

2022

Volltextzugriff (PDF)

Coherence and Inelastic Scattering in Electron Microscopy

Microscopy and microanalysis, 2022-08, Vol.28 (S1), p.2762-2763

2022

Volltextzugriff (PDF)

Growth of polycrystalline zinc phosphide thin films by reactive radio frequency magnetron sputtering

Thin solid films, 2015-09, Vol.591, p.32-38

2015

Volltextzugriff (PDF)

Reaction routes for the synthesis of CuInSe2 using bilayer compound precursors

Progress in photovoltaics, 2012-08, Vol.20 (5), p.543-556

2012

Volltextzugriff (PDF)

Towards a Quantitative Understanding in Electron Tomography

Microscopy and microanalysis, 2009-07, Vol.15 (S2), p.602-603

2009

Volltextzugriff (PDF)

Performance of a Silicon-Drift Detector in 200kV TEM Environments

Microscopy and microanalysis, 2009-07, Vol.15 (S2), p.228-229

2009

Volltextzugriff (PDF)

Effect of potassium addition method on MoS2 performance for the syngas to alcohol reaction

Applied catalysis. A, General, 2013-07, Vol.462-463, p.302-309

2013

Volltextzugriff (PDF)

Evaluation of Methods for Quantification of Transmission Electron Microscopy (TEM) Dispersions

Microscopy and microanalysis, 2009-07, Vol.15 (S2), p.1088-1089

2009

Volltextzugriff (PDF)

Effect of growth conditions on microstructure of sputtered precursor for CuIn1-xGaxSe2 (CIGS) absorber layer deposited on stainless steel substrates

Thin solid films, 2018-11, Vol.665, p.36-45

2018

Volltextzugriff (PDF)

Structures and properties of disordered boron carbide coatings generated by magnetron sputtering

Thin solid films, 1998-11, Vol.332 (1-2), p.80-86

1998

Volltextzugriff (PDF)

Determination of multiple lattice parameters from convergent-beam electron diffraction patterns

Ultramicroscopy, 1993-05, Vol.50 (1), p.41-56

1993

Volltextzugriff (PDF)

Barrier studies on porous silk semiconductor dielectric

Microelectronic engineering, 2003-11, Vol.70 (2), p.352-357

2003

Volltextzugriff (PDF)

Network morphology of straight and polymer modified asphalt cements

Microscopy research and technique, 1997-09, Vol.38 (5), p.529-543

1997

Volltextzugriff (PDF)

Development of a hybrid CVD/SOD integration sequence for reliable, high performance interconnect systems

Microelectronic engineering, 2004-10, Vol.76 (1-4), p.46-51

2004

Volltextzugriff (PDF)

Use of a Ruthenium-Containing Conjugated Polymer as a Photosensitizer in Photovoltaic Devices Fabricated by a Layer-by-Layer Deposition Process

Langmuir, 2006-03, Vol.22 (7), p.3368-3375

2006

Volltextzugriff (PDF)

Reaction routes for the synthesis of CuInSe 2 using bilayer compound precursors

Progress in photovoltaics, 2012-08, Vol.20 (5), p.543-556

2012

Volltextzugriff (PDF)

Effect of potassium addition method on MoS2 performance for the syngas to alcohol reaction

Applied catalysis. A, General, 2013, Vol.462-63, p.302-309

2013

Volltextzugriff (PDF)

In-Situ Low Energy Ion Milling with a FIB-SEM for TEM lift-out Sample Preparation of Copper Damascene Structures Fabricated with Low k porous SiLKTM Semiconductor Dielectric

Microscopy and microanalysis, 2003-08, Vol.9 (S02), p.874-875

2003

Volltextzugriff (PDF)

Effect of potassium addition method on MoS(2) performance for the syngas to alcohol reaction

Applied catalysis. A, General, 2013-07, Vol.462-463, p.302-309

2013

Volltextzugriff (PDF)

Probing for Chemically Functional Groups on Graphene Oxide in an Aberration-Corrected Electron Microscope

Microscopy and microanalysis, 2010-07, Vol.16 (S2), p.130-131

2010

Volltextzugriff (PDF)

Interface structure of a YBa2Cu3O7−x/N/YBa2Cu3O7−x superconductor/normal metal/superconductor Josephson junction using YBa2Cu2.79Co0.21O7−x as the normal barrier N

Journal of materials research, 1996-02, Vol.11 (2), p.281-287

1996

Volltextzugriff (PDF)

Electron microscopy of high- T c Josephson junctions formed in the epitaxial layer ramp-edge geometry: YBCO/barrier/YBCO

Micron (Oxford, England : 1993), 1999-10, Vol.30 (5), p.539-559

1999

Volltextzugriff (PDF)

Effect of crystal and beam tilt on simulated high-resolution TEM images of interfaces

Microscopy research and technique, 1992-11, Vol.23 (3), p.230-238

1992

Volltextzugriff (PDF)

Interface microstructure and composition of a YBa2Cu3O7-x/N/YBa2Cu3O7-x SNS edge junction with CaRuO3 as the metallic barrier

Physica. C, Superconductivity, 1995-10, Vol.252 (3-4), p.348-360

1995

Volltextzugriff (PDF)

The Impact of Aberration-Corrected Transmission Electron Microscopy on Catalysis Investigations

Microscopy and microanalysis, 2010-07, Vol.16 (S2), p.122-123

2010

Volltextzugriff (PDF)

1 – 25 von 105

Suche als RSS-Feed

Suchergebnisse filtern

Filter anzeigen

Nur zeigen

Geprüft (Peer-Review)
(82)
Mit Volltextzugriff
(96)

Publikationsform

Sprache

Englisch
(105)
Japanisch
(13)

Erscheinungsjahr

n.n

Thema

Science & Technology
(51)
Technology
(30)
Physical Sciences
(25)
Materials Science
(22)
Materials Science, Multidisciplinary
(19)
Chemistry
(17)
Life Sciences & Biomedicine
(15)
Physics
(15)
Chemistry, Physical
(12)
Physics, Applied
(12)
Exact Sciences And Technology
(11)
Humans
(10)
Microscopy
(8)
Physics, Condensed Matter
(8)
Science & Technology - Other Topics
(8)
Transmission Electron Microscopy
(8)
Engineering
(7)
Nanoscience & Nanotechnology
(7)
Catalysts
(6)
Electron Microscopy
(6)

15 weitere anzeigen...

Weniger anzeigen...

Menü

Weitere Dienste

Einstellungen

Latency Dose Formation In DMC By Inelastic Electron Scattering

Coherence and Inelastic Scattering in Electron Microscopy

Growth of polycrystalline zinc phosphide thin films by reactive radio frequency magnetron sputtering

Reaction routes for the synthesis of CuInSe2 using bilayer compound precursors

Towards a Quantitative Understanding in Electron Tomography

Performance of a Silicon-Drift Detector in 200kV TEM Environments

Effect of potassium addition method on MoS2 performance for the syngas to alcohol reaction

Evaluation of Methods for Quantification of Transmission Electron Microscopy (TEM) Dispersions

Effect of growth conditions on microstructure of sputtered precursor for CuIn1-xGaxSe2 (CIGS) absorber layer deposited on stainless steel substrates

Structures and properties of disordered boron carbide coatings generated by magnetron sputtering

Determination of multiple lattice parameters from convergent-beam electron diffraction patterns

Barrier studies on porous silk semiconductor dielectric

Network morphology of straight and polymer modified asphalt cements

Development of a hybrid CVD/SOD integration sequence for reliable, high performance interconnect systems

Use of a Ruthenium-Containing Conjugated Polymer as a Photosensitizer in Photovoltaic Devices Fabricated by a Layer-by-Layer Deposition Process

Reaction routes for the synthesis of CuInSe 2 using bilayer compound precursors

Effect of potassium addition method on MoS2 performance for the syngas to alcohol reaction

In-Situ Low Energy Ion Milling with a FIB-SEM for TEM lift-out Sample Preparation of Copper Damascene Structures Fabricated with Low k porous SiLKTM Semiconductor Dielectric

Effect of potassium addition method on MoS(2) performance for the syngas to alcohol reaction

Probing for Chemically Functional Groups on Graphene Oxide in an Aberration-Corrected Electron Microscope

Interface structure of a YBa2Cu3O7−x/N/YBa2Cu3O7−x superconductor/normal metal/superconductor Josephson junction using YBa2Cu2.79Co0.21O7−x as the normal barrier N

Electron microscopy of high- T c Josephson junctions formed in the epitaxial layer ramp-edge geometry: YBCO/barrier/YBCO

Effect of crystal and beam tilt on simulated high-resolution TEM images of interfaces

Interface microstructure and composition of a YBa2Cu3O7-x/N/YBa2Cu3O7-x SNS edge junction with CaRuO3 as the metallic barrier

The Impact of Aberration-Corrected Transmission Electron Microscopy on Catalysis Investigations

Suchergebnisse filtern