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Weight-scale, XRR and corona charge method on back-end dielectrics for 65 and 45 nm technology nodes

Microelectronic engineering, 2008-10, Vol.85 (10), p.2105-2106

2008

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Measuring the Young’s modulus of ultralow- k materials with the non destructive picosecond ultrasonic method

Microelectronic engineering, 2006-11, Vol.83 (11), p.2346-2350

2006

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X-ray metrology for advanced silicon processes

Applied surface science, 2006-10, Vol.253 (1), p.21-27

2006

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In-line characterization of dielectric constant and leakage currents of low-k films with corona charge method

Journal of materials science. Materials in electronics, 2008-02, Vol.19 (2), p.115-118

2008

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Gate oxide process control optimization by x-ray photoelectron spectroscopy in a semiconductor fabrication line

Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 2008-07, Vol.26 (4), p.805-811

2008

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Comparison Of Several Metrology Techniques For In-line Process Monitoring Of Porous SiOCH

AIP conference proceedings, 2007, Vol.931 (1), p.362-366

2007

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Meiotic behavior and linkage relationships in the secondarily homothallic fungus Agaricus bisporus

Genetics (Austin), 1993-02, Vol.133 (2), p.225-236

1993

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In-line monitoring of advanced microelectronic processes using combined X-ray techniques

Thin solid films, 2004-02, Vol.450 (1), p.84-89

2004

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Process Monitoring And Surface Characterization By XPS In A Semiconductor Fabrication Line

Frontiers of Characterization and Metrology for Nanoelectronics: 2007 (AIP Conference Proceedings Volume 931), 2007, Vol.931, p.191-195

2007

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Ultra Low-kappa Metrology Using X-Ray Reflectivity And Small-Angle X-Ray Scattering Techniques

Frontiers of Characterization and Metrology for Nanoelectronics: 2007 (AIP Conference Proceedings Volume 931), 2007, Vol.931, p.347-351

2007

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Xylanase production by Trichoderma longibrachiatum

Enzyme and microbial technology, 1989, Vol.11 (7), p.405-410

1989

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An Operational Approach to the Semantics of Classes: Application to Type Checking

Programming and computer software, 2002-05, Vol.28 (3), p.127-147

Royer, J.-C

2002

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Interrelationship of xylanase induction and cellulase induction of Trichoderma longibrachiatum

Applied and Environmental Microbiology, 1990-08, Vol.56 (8), p.2535-2539

1990

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Fusarium graminearum A 3/5 as a novel host for heterologous protein production

Bio/technology (New York, N.Y. 1983), 1995-12, Vol.13 (13), p.1479-1483

1995

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Purification and characterization of an endo-(1,3)-beta-D-glucanase from Trichoderma longibrachiatum

Applied and Environmental Microbiology, 1989-01, Vol.55 (1), p.177-184

1989

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Simple, Sensitive Zymogram Technique for Detection of Xylanase Activity in Polyacrylamide Gels

Applied and Environmental Microbiology, 1990-06, Vol.56 (6), p.1516-1517

1990

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A global semantics for views

Lecture notes in computer science, 2000, p.165-180

2000

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Homology between mitochondrial DNA of Agaricus bisporus and an internal portion of a linear mitochondrial plasmid of Agaricus bitorquis

Current genetics, 1991-06, Vol.19 (6), p.495-502

1991

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Analysis of a high frequency transformation system for Ophiostoma ulmi, the causal agent of Dutch elm disease

Molecular & general genetics, 1991, Vol.225 (1), p.168-176

1991

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Electrophoretic karyotype analysis of the button mushroom, Agaricus bisporus

Genome, 1992-08, Vol.35 (4), p.694-698

1992

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Grenoble Large Scale Facilities for Advanced Characterisation of Microelectronics Devices

2015 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS), 2015, p.1-4

2015

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Concurrency and Data Types: A Specification Method An Example with LOTOS

Lecture notes in computer science, 1999, p.277-293

1999

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Deletion of the Trichodiene Synthase Gene of Fusarium venenatum: Two Systems for Repeated Gene Deletions

Fungal genetics and biology, 1999-10, Vol.28 (1), p.68-78

1999

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Apparent cellulase activity of purified xylanase is due to contamination of assay substrate with xylan

Journal of Industrial Microbiology, 1992-11, Vol.11 (1), p.59-61

1992

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gene associated with filamentous growth in Ophiostoma novo-ulmi has RNA-binding motifs and is similar to a yeast gene involved in mRNA splicing

Current genetics, 2000-02, Vol.37 (2), p.94-103

2000

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Weight-scale, XRR and corona charge method on back-end dielectrics for 65 and 45 nm technology nodes

Measuring the Young’s modulus of ultralow- k materials with the non destructive picosecond ultrasonic method

X-ray metrology for advanced silicon processes

In-line characterization of dielectric constant and leakage currents of low-k films with corona charge method

Gate oxide process control optimization by x-ray photoelectron spectroscopy in a semiconductor fabrication line

Comparison Of Several Metrology Techniques For In-line Process Monitoring Of Porous SiOCH

Meiotic behavior and linkage relationships in the secondarily homothallic fungus Agaricus bisporus

In-line monitoring of advanced microelectronic processes using combined X-ray techniques

Process Monitoring And Surface Characterization By XPS In A Semiconductor Fabrication Line

Ultra Low-kappa Metrology Using X-Ray Reflectivity And Small-Angle X-Ray Scattering Techniques

Xylanase production by Trichoderma longibrachiatum

An Operational Approach to the Semantics of Classes: Application to Type Checking

Interrelationship of xylanase induction and cellulase induction of Trichoderma longibrachiatum

Fusarium graminearum A 3/5 as a novel host for heterologous protein production

Purification and characterization of an endo-(1,3)-beta-D-glucanase from Trichoderma longibrachiatum

Simple, Sensitive Zymogram Technique for Detection of Xylanase Activity in Polyacrylamide Gels

A global semantics for views

Homology between mitochondrial DNA of Agaricus bisporus and an internal portion of a linear mitochondrial plasmid of Agaricus bitorquis

Analysis of a high frequency transformation system for Ophiostoma ulmi, the causal agent of Dutch elm disease

Electrophoretic karyotype analysis of the button mushroom, Agaricus bisporus

Grenoble Large Scale Facilities for Advanced Characterisation of Microelectronics Devices

Concurrency and Data Types: A Specification Method An Example with LOTOS

Deletion of the Trichodiene Synthase Gene of Fusarium venenatum: Two Systems for Repeated Gene Deletions

Apparent cellulase activity of purified xylanase is due to contamination of assay substrate with xylan

gene associated with filamentous growth in Ophiostoma novo-ulmi has RNA-binding motifs and is similar to a yeast gene involved in mRNA splicing

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