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Journal of electronic testing, 2023-02, Vol.39 (1), p.89-102
2023
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IEEE transactions on computer-aided design of integrated circuits and systems, 2021-08, Vol.40 (8), p.1500-1510
2021
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2018 IEEE 27th Asian Test Symposium (ATS), 2018, p.1-6
2018
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Nuclear Engineering and Technology, 2019, 51(3), , pp.867-876
2019
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2019 IEEE 28th Asian Test Symposium (ATS), 2019, p.147-1475
2019
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Water practice and technology, 2022-01, Vol.17 (1), p.234-245
2022
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PLoS neglected tropical diseases, 2015-10, Vol.9 (10), p.e0004138-e0004138
2015
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Current science (Bangalore), 2019-03, Vol.116 (5), p.703-703
2019
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Journal of sound and vibration, 2015-09, Vol.351, p.206-220
2015
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Journal of botany, 2016, Vol.2016, p.1-5
2016
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Microelectronics and reliability, 2023-12, Vol.151, p.115255, Article 115255
2023
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Asian journal of pharmaceutical and clinical research, 2019-07, p.111-115
2019
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Microelectronics and reliability, 2022-02, Vol.129, p.114460, Article 114460
2022
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Composite structures, 2021-03, Vol.259, p.113246, Article 113246
2021
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ACM journal on emerging technologies in computing systems, 2021-07, Vol.17 (3), p.1-22
2021
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Integration (Amsterdam), 2024-01, Vol.94, p.102088, Article 102088
2024
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Journal of electronic testing, 2023-08, Vol.39 (4), p.447-463
2023
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ACM journal on emerging technologies in computing systems, 2022-10, Vol.18 (4), p.1-23, Article 70
2022
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Structural health monitoring, 2014-05, Vol.13 (3), p.321-342
2014
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Composite structures, 2020-11, Vol.252, p.112683, Article 112683
- Arteiro, Albertino
- Sharma, Naresh
- Melo, Jose Daniel D.
- Ha, Sung Kyu
- Miravete, Antonio
- Miyano, Yasushi
- Massard, Thierry
- Shah, Pranav D.
- Roy, Surajit
- Rainsberger, Robert
- Rother, Klemens
- Cimini Jr, Carlos
- Seng, Jocelyn M.
- Arakaki, Francisco K.
- Tay, Tong-Earn
- Lee, Woo Il
- Sihn, Sangwook
- Springer, George S.
- Roy, Ajit
- Riccio, Aniello
- Di Caprio, Francesco
- Shrivastava, Sachin
- Nettles, Alan T.
- Catalanotti, Giuseppe
- Camanho, Pedro P.
- Seneviratne, Waruna
- Marques, António T.
- Yang, Henry T.
- Hahn, H. Thomas
2020
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Botany letters, 2019-04, Vol.166 (2), p.234-245
2019
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2019 32nd International Conference on VLSI Design and 2019 18th International Conference on Embedded Systems (VLSID), 2019, p.537-538
2019
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Journal of electronic testing, 2019-10, Vol.35 (5), p.741-759
2019
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2017 IEEE International Test Conference (ITC), 2017, p.1-10
2017
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Journal of electronic testing, 2016-10, Vol.32 (5), p.511-529
2016
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