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Physical Model for the Steep Subthreshold Slope in Ferroelectric FETs

IEEE electron device letters, 2018-06, Vol.39 (6), p.877-880

2018

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Analytical Markov Model to Calculate TDDB at Any Voltage and Temperature Stress Condition

IEEE transactions on electron devices, 2023-12, Vol.70 (12), p.6512-6519

2023

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RC Benefits of Advanced Metallization Options

IEEE transactions on electron devices, 2019-05, Vol.66 (5), p.2339-2345

2019

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Variability-Aware Predictive Modeling of Line-to-Line Dielectric Reliability

IEEE transactions on electron devices, 2020-04, Vol.67 (4), p.1737-1744

2020

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Neutrophils expressing major histocompatibility complex class II molecules circulate in blood and milk during mastitis and show high microbicidal activity

Journal of dairy science, 2023-06, Vol.106 (6), p.4245-4256

2023

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Implications of BTI-Induced Time-Dependent Statistics on Yield Estimation of Digital Circuits

IEEE transactions on electron devices, 2014-03, Vol.61 (3), p.666-673

2014

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On the Modeling of Polycrystalline Ferroelectric Thin Films: Landau-Based Models Versus Monte Carlo-Based Models Versus Experiment

IEEE transactions on electron devices, 2022-06, Vol.69 (6), p.3105-3112

2022

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Impact of Wire Geometry on Interconnect RC and Circuit Delay

IEEE transactions on electron devices, 2016-06, Vol.63 (6), p.2488-2496

2016

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Modeling of Via Resistance for Advanced Technology Nodes

IEEE transactions on electron devices, 2017-05, Vol.64 (5), p.2306-2313

2017

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Repeat Gamma Knife surgery for recurrent trigeminal neuralgia: long-term outcomes and systematic review

Journal of neurosurgery, 2014-12, Vol.121 Suppl, p.210

2014

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Prospective controlled trial of gamma knife surgery for essential trigeminal neuralgia

Journal of neurosurgery, 2006-06, Vol.104 (6), p.913-924

2006

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The three lives of Pierre Boulanger

Retrovirology, 2020-04, Vol.17 (1), p.9-9, Article 9

2020

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Impact of MOSFET gate oxide breakdown on digital circuit operation and reliability

IEEE transactions on electron devices, 2002-03, Vol.49 (3), p.500-506

2002

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Predicting the quality of wheat flour dough at mixing using an expert system

Food research international, 2014-10, Vol.64, p.772-782

2014

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Thermal stability analysis and modelling of advanced perpendicular magnetic tunnel junctions

AIP advances, 2018-05, Vol.8 (5), p.055909-055909-6

2018

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Correlated Time-0 and Hot-Carrier Stress Induced FinFET Parameter Variabilities: Modeling Approach

Micromachines (Basel), 2020-06, Vol.11 (7), p.657

2020

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SiGe Channel Technology: Superior Reliability Toward Ultra-Thin EOT Devices-Part II: Time-Dependent Variability in Nanoscaled Devices and Other Reliability Issues

IEEE transactions on electron devices, 2013-01, Vol.60 (1), p.405-412

2013

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Impact of Individual Charged Gate-Oxide Defects on the Entire I D - V G Characteristic of Nanoscaled FETs

IEEE electron device letters, 2012-06, Vol.33 (6), p.779-781

2012

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Fast Ramped Voltage Characterization of Single Trap Bias and Temperature Impact on Time-Dependent \(V_{\rm TH}\) Variability

IEEE transactions on electron devices, 2014-09, Vol.61 (9), p.3139-3144

2014

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A New TDDB Reliability Prediction Methodology Accounting for Multiple SBD and Wear Out

IEEE transactions on electron devices, 2009-07, Vol.56 (7), p.1424-1432

2009

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Recognition of Lewis x Derivatives Present on Mucins by Flagellar Components of Pseudomonas aeruginosa

Infection and Immunity, 2001-09, Vol.69 (9), p.5243-5248

2001

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Investigation of the Impact of Hot-Carrier-Induced Interface State Generation on Carrier Mobility in nMOSFET

IEEE transactions on electron devices, 2021-07, Vol.68 (7), p.3246-3253

2021

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Toward a streamlined projection of small device bias temperature instability lifetime distributions

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 2013-01, Vol.31 (1)

2013

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Thermal and plasma treatments for improved (sub-)1nm equivalent oxide thickness planar and FinFET-based replacement metal gate high-k last devices and enabling a simplified scalable CMOS integration scheme

Japanese Journal of Applied Physics, 2014, Vol.53 (4S), p.04EA04-1-04EA04-7

2014

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Limited hydrolysis of soy proteins with endo‐ and exoproteases

Journal of the American Oil Chemists' Society, 2004-10, Vol.81 (10), p.953-n/a

2004

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Physical Model for the Steep Subthreshold Slope in Ferroelectric FETs

Analytical Markov Model to Calculate TDDB at Any Voltage and Temperature Stress Condition

RC Benefits of Advanced Metallization Options

Variability-Aware Predictive Modeling of Line-to-Line Dielectric Reliability

Neutrophils expressing major histocompatibility complex class II molecules circulate in blood and milk during mastitis and show high microbicidal activity

Implications of BTI-Induced Time-Dependent Statistics on Yield Estimation of Digital Circuits

On the Modeling of Polycrystalline Ferroelectric Thin Films: Landau-Based Models Versus Monte Carlo-Based Models Versus Experiment

Impact of Wire Geometry on Interconnect RC and Circuit Delay

Modeling of Via Resistance for Advanced Technology Nodes

Repeat Gamma Knife surgery for recurrent trigeminal neuralgia: long-term outcomes and systematic review

Prospective controlled trial of gamma knife surgery for essential trigeminal neuralgia

The three lives of Pierre Boulanger

Impact of MOSFET gate oxide breakdown on digital circuit operation and reliability

Predicting the quality of wheat flour dough at mixing using an expert system

Thermal stability analysis and modelling of advanced perpendicular magnetic tunnel junctions

Correlated Time-0 and Hot-Carrier Stress Induced FinFET Parameter Variabilities: Modeling Approach

SiGe Channel Technology: Superior Reliability Toward Ultra-Thin EOT Devices-Part II: Time-Dependent Variability in Nanoscaled Devices and Other Reliability Issues

Impact of Individual Charged Gate-Oxide Defects on the Entire I D - V G Characteristic of Nanoscaled FETs

Fast Ramped Voltage Characterization of Single Trap Bias and Temperature Impact on Time-Dependent \(V_{\rm TH}\) Variability

A New TDDB Reliability Prediction Methodology Accounting for Multiple SBD and Wear Out

Recognition of Lewis x Derivatives Present on Mucins by Flagellar Components of Pseudomonas aeruginosa

Investigation of the Impact of Hot-Carrier-Induced Interface State Generation on Carrier Mobility in nMOSFET

Toward a streamlined projection of small device bias temperature instability lifetime distributions

Thermal and plasma treatments for improved (sub-)1nm equivalent oxide thickness planar and FinFET-based replacement metal gate high-k last devices and enabling a simplified scalable CMOS integration scheme

Limited hydrolysis of soy proteins with endo‐ and exoproteases

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